Tester set-up

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CPC
G01R31/31908

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31908Tester set-up

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Random function selection and insertion during compilation for post...
- Patent number 12,203,986
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Device under test simulation equipment
- Patent number 12,174,244
- Issue date Dec 24, 2024
- Teradyne (Asia) Pte. Ltd.
- Min Nie
- G01 - MEASURING TESTING
Information Patent Grant
Bit error ratio estimation using machine learning
- Patent number 12,146,914
- Issue date Nov 19, 2024
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement system for identifying aggressor signals
- Patent number 12,140,631
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device under test synchronization with automated test equipment che...
- Patent number 12,140,632
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yongkang Hu
- G01 - MEASURING TESTING
Information Patent Grant
Cyclic loop image representation for waveform data
- Patent number 12,092,692
- Issue date Sep 17, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testbenches for electronic systems with automatic insertion of veri...
- Patent number 12,055,588
- Issue date Aug 6, 2024
- ARTERIS, INC.
- Benoit Lafage
- G01 - MEASURING TESTING
Information Patent Grant
Board adapter device, test method, system, apparatus, and device, a...
- Patent number 11,933,842
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Maosong Ma
- G01 - MEASURING TESTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of over-the-air testing of a device under test
- Patent number 11,828,801
- Issue date Nov 28, 2023
- Rohde & Schwarz GmbH & Co. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Grant
Compiler-based code generation for post-silicon validation
- Patent number 11,796,593
- Issue date Oct 24, 2023
- Synopsys, Inc.
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment diagnostics systems and methods
- Patent number 11,714,132
- Issue date Aug 1, 2023
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Reformatting scan patterns in presence of hold type pipelines
- Patent number 11,694,010
- Issue date Jul 4, 2023
- Synopsys, Inc.
- Amit Gopal M. Purohit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of testing single DUT through multiple cores in p...
- Patent number 11,686,768
- Issue date Jun 27, 2023
- Test Research, Inc.
- Ching-Chih Lin
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for adjusting a setup of testing a device under te...
- Patent number 11,630,146
- Issue date Apr 18, 2023
- Rohde & Schwarz GmbH & Co. KG
- Simon Schmid
- G01 - MEASURING TESTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,573,270
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip test method, apparatus, device, and system
- Patent number 11,536,770
- Issue date Dec 27, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing method
- Patent number 11,454,663
- Issue date Sep 27, 2022
- Realtek Semiconductor Corp.
- Chia-Min Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,448,695
- Issue date Sep 20, 2022
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,415,628
- Issue date Aug 16, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system supporting reverse compliance
- Patent number 11,415,623
- Issue date Aug 16, 2022
- Teradyne, Inc.
- Jason A. Messier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for sending data according to a signal timing
- Patent number 11,409,689
- Issue date Aug 9, 2022
- Infineon Technologies AG
- Siak Pin Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment using an on-chip-system test controller
- Patent number 11,385,285
- Issue date Jul 12, 2022
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital circuit robustness verification method and system
- Patent number 11,353,509
- Issue date Jun 7, 2022
- Realtek Semiconductor Corporation
- Wen-Yi Mao
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test system
- Patent number 11,293,982
- Issue date Apr 5, 2022
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment for over the air tests as well as method for testing...
- Patent number 11,187,749
- Issue date Nov 30, 2021
- Rohde & Schwarz GmbH & Co. KG
- Adrian Cardalda-Garcia
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for combined signals
- Patent number 11,187,743
- Issue date Nov 30, 2021
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and method of setting a measurement device
- Patent number 11,137,444
- Issue date Oct 5, 2021
- Rohde & Schwarz GmbH & Co. KG
- Matthias Ruengeler
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
- Publication number 20250044345
- Publication date Feb 6, 2025
- MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
- Guoliang MAO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...
- Publication number 20250012858
- Publication date Jan 9, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND
- Publication number 20240418777
- Publication date Dec 19, 2024
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...
- Publication number 20240418778
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...
- Publication number 20240418775
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...
- Publication number 20240410938
- Publication date Dec 12, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240402243
- Publication date Dec 5, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393387
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
RANDOM FUNCTION SELECTION AND INSERTION DURING COMPILATION FOR POST...
- Publication number 20240393395
- Publication date Nov 28, 2024
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393388
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369615
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING STORAGE OF TEST DATA BASED ON PRIOR TEST PROGRAM EXECUTION
- Publication number 20240319275
- Publication date Sep 26, 2024
- Teradyne, Inc.
- Katherine R. Jong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...
- Publication number 20240175907
- Publication date May 30, 2024
- SAMSUNG DISPLAY CO., LTD.
- YOUNG JE CHO
- G01 - MEASURING TESTING
Information Patent Application
Functional Circuit Block Harvesting in Computer Systems
- Publication number 20240103074
- Publication date Mar 28, 2024
- Apple Inc.
- Peter A. Lisherness
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED T...
- Publication number 20240069099
- Publication date Feb 29, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Christian Paul Sommers
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST SIMULATION EQUIPMENT
- Publication number 20230366922
- Publication date Nov 16, 2023
- Teradyne (Asia) Pte. Ltd.
- Min Nie
- G01 - MEASURING TESTING
Information Patent Application
TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...
- Publication number 20230314498
- Publication date Oct 5, 2023
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST
- Publication number 20230305056
- Publication date Sep 28, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING OF FAR-FIELD WIRELESS CHARGING
- Publication number 20230168299
- Publication date Jun 1, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Daniela RADDINO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION
- Publication number 20230152374
- Publication date May 18, 2023
- Advantest Corporation
- Matthias SAUER
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Measurement of a Parameter of a DUT
- Publication number 20230147947
- Publication date May 11, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsien Tsai
- G01 - MEASURING TESTING
Information Patent Application
BOARD ADAPTER DEVICE, TEST METHOD, SYSTEM, APPARATUS, AND DEVICE, A...
- Publication number 20230134661
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...
- Publication number 20230111938
- Publication date Apr 13, 2023
- Arteris, Inc
- Benoit LAFAGE
- G01 - MEASURING TESTING
Information Patent Application
Software-Defined Synthesizable Testbench
- Publication number 20230052788
- Publication date Feb 16, 2023
- Intel Corporation
- Sheran Rashel Cardoza
- G01 - MEASURING TESTING
Information Patent Application
COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION
- Publication number 20220381824
- Publication date Dec 1, 2022
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
BIT ERROR RATIO ESTIMATION USING MACHINE LEARNING
- Publication number 20220373597
- Publication date Nov 24, 2022
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20220373595
- Publication date Nov 24, 2022
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...
- Publication number 20220236326
- Publication date Jul 28, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REFORMATTING SCAN PATTERNS IN PRESENCE OF HOLD TYPE PIPELINES
- Publication number 20220137126
- Publication date May 5, 2022
- Synopsys, Inc.
- Amit Gopal M. PUROHIT
- G01 - MEASURING TESTING

Tester set-up

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Random function selection and insertion during compilation for post...

Device under test simulation equipment

Bit error ratio estimation using machine learning

Measurement system for identifying aggressor signals

Device under test synchronization with automated test equipment che...

Cyclic loop image representation for waveform data

Testbenches for electronic systems with automatic insertion of veri...

Board adapter device, test method, system, apparatus, and device, a...

Test method and apparatus of communication chip, device and medium

Automated test equipment for testing one or more devices under test...

System and method of over-the-air testing of a device under test

Compiler-based code generation for post-silicon validation

Test equipment diagnostics systems and methods

Reformatting scan patterns in presence of hold type pipelines

System and method of testing single DUT through multiple cores in p...

Test arrangement for adjusting a setup of testing a device under te...

Trajectory-optimized test pattern generation for built-in self-test

Electrical testing apparatus for spintronics devices

Chip test method, apparatus, device, and system

Signal processing method

System for testing an integrated circuit of a device and its method...

Automated test equipment for testing one or more devices under test...

Test system supporting reverse compliance

Method and device for sending data according to a signal timing

Automated test equipment using an on-chip-system test controller

Digital circuit robustness verification method and system

Test method and test system

Test equipment for over the air tests as well as method for testing...

Automated test equipment for combined signals

Measurement device and method of setting a measurement device

Patents Applicationslast 30 patents

UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...

METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

RANDOM FUNCTION SELECTION AND INSERTION DURING COMPILATION FOR POST...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

CONTROLLING STORAGE OF TEST DATA BASED ON PRIOR TEST PROGRAM EXECUTION

DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...

Functional Circuit Block Harvesting in Computer Systems

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED T...

DEVICE UNDER TEST SIMULATION EQUIPMENT

TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...

SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST

DEVICES AND METHODS FOR TESTING OF FAR-FIELD WIRELESS CHARGING

AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION

Systems and Methods for Measurement of a Parameter of a DUT

BOARD ADAPTER DEVICE, TEST METHOD, SYSTEM, APPARATUS, AND DEVICE, A...

TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...

Software-Defined Synthesizable Testbench

COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

BIT ERROR RATIO ESTIMATION USING MACHINE LEARNING

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...

REFORMATTING SCAN PATTERNS IN PRESENCE OF HOLD TYPE PIPELINES