Number | Name | Date | Kind |
---|---|---|---|
5323400 | Agarwal et al. | Jun 1994 | A |
5592493 | Crouch et al. | Jan 1997 | A |
5696771 | Beausang et al. | Dec 1997 | A |
5703789 | Beausang et al. | Dec 1997 | A |
5828579 | Beausang | Oct 1998 | A |
5943490 | Sample | Aug 1999 | A |
6106568 | Beausang et al. | Aug 2000 | A |
Entry |
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Narayanan et al, “Reconfigurable Scan Chains: A Novel Approach to Reduce Test Application Time,” IEEE, Nov. 1993, pp. 710-715.* |
Illman et al, “A Fragmented Resigter Architecture and Test Advisor for Bist,” IEEE, 1994, pp. 124-129.* |
Narayanan et al, “Reconfiguration Techniques for a Single Scan Chain,” IEEE, Jun. 1995, pp. 750-765. |