Binning et al, "The Scanning Tunneling Microscope", Scientific American, pp. 50-56, Aug. 85. |
Binning et al; "Surface Studies by Scanning Tunneling Microscopy", Phys. Rev. Letters, vol. 49(1), pp. 57-61, 7/5/82. |
Binning et al, "7.times.7 Reconstruction on Si(III) Resolved in Real Space"; Phys. Rev. Letters, vol. 50(2), pp. 120-123 (1/10/83). |
Gwynne, "IBM Researchers Utilize Vacuum Tunneling for High Resolution Microscopy Technique", Industrial R&D, pp. 72-73 (May, 73). |
"A Review of `Electrofax` Behavior"; Amick; RCA Review, pp. 453-769. |
"Xerography and Related Processes"; Dessauer & Clark; The Focal Press, pp. 59-61, .COPYRGT.1965. |
Kazan et al, "Image-Storage Panels Based on Field Effect Control of Conductivity", Proc. of IEEE, vol. 56(3), pp. 285-295, Mar. 68. |
Mochel et al, "Electron Beam Writing on A 20 .ANG. Scale/N Metal B-Aluminas", App. Physics Letters, vol. 42(4), pp. 392-394, 2/83. |