Electronic payments may be performed in a variety of ways. A payment terminal may process payment transactions, and may interact with payment devices such as a payment card having a magnetic strip that is swiped in a magnetic reader of the payment terminal, a payment device having a Europay/Mastercard/Visa (EMV) chip that is dipped into corresponding EMV slot of the payment terminal, and near field communication (NFC) enabled devices such as a smartphone or EMV card that is tapped to the payment terminal and transmits payment information over a secure wireless connection. The payment terminal may receive payment information from the payment device as well information about a transaction, and may communicate this information to a payment system for processing of the transaction.
As of a result of its central role in the transaction processing system, the payment terminal is a prime target for third party attackers attempting to access payment information, process fraudulent transactions, and otherwise engage in fraudulent activities or theft. In many cases, the attackers attempt to physically access components of the payment terminal, such as one or more communication lines carrying data or a processor that communicates and processes payment information. Attackers may attempt to eavesdrop on signals (e.g., a passive attack) or to modify or spoof payment processing communications (e.g., an active attack) by injecting malicious signals into the payment terminal.
In an effort to thwart physical attacks, payment terminals may implement tamper detection devices such tamper meshes and tamper switches. For example, if an attacker attempts to remove the cover of the payment terminal, a tamper switch may open. A tamper mesh may include a conductive trace that effectively covers sensitive components such as the processor or other circuitry of the payment terminal. If an attacker attempts to access the sensitive components (e.g., by drilling a small hole into the payment terminal), the conductive trace may be broken, resulting in an open circuit. The open circuit of the tamper switch or tamper mesh may be sensed by circuitry of the payment terminal, which may shut off the payment terminal or take other corrective action.
The above and other features of the present disclosure, its nature and various advantages will be more apparent upon consideration of the following detailed description, taken in conjunction with the accompanying drawings in which:
In the figures, the left-most digit(s) of a reference number identifies the figure in which the reference number first appears. The use of the same reference numbers in different figures indicates similar or identical items or features. Moreover, multiple instances of the same part are designated by a common prefix separated from the instance number by a dash. The drawings are not to scale.
An electronic payment terminal such as a payment reader may interface with various types of payment devices. For example, smart phones and smart watches have NFC payment applications that allow a customer to “tap” in close proximity to the payment terminal in order to pay. Payment information is transmitted and received wirelessly over a radio frequency (RF) connection between the payment device and the payment reader. EMV cards include an EMV chip that is “dipped” into a slot in the payment reader. The EMV card typically remains in the reader, and communicates with the payment reader through a physical electrical connection. Once the transaction is complete, the EMV card may be removed. Also, many payment cards retain traditional “swipe” technology in which information about a payment card is transferred to the payment reader by swiping a magnetic card stripe through a magnetic reader of the payment reader.
In all of these scenarios, there are multiple opportunities for an attacker to attempt to obtain the payment information in order to steal payment data or otherwise engage in fraudulent transactions. For example, an attacker may attempt to intercept NFC communications, read data being communicated over the physical connections with the EMV card, or intercept that data from the magnetic stripe of a traditional swiping transaction. Moreover, signals carrying this and other critical information are transmitted within the payment reader and processed by processors and other circuitry of the payment reader.
Accordingly, numerous types of tamper detection devices such as tamper switches and tamper meshes are integrated into an exemplary payment reader. These tamper detection devices can sense attempts to gain improper physical access to the payment reader (e.g., by opening the payment reader or drilling into the payment reader to access signals or components), attempts to physically provide electrical signals to the payment reader (e.g., attempts to inject malicious signals into externally accessible pins of the payment reader, such as EMV pins), and attempts to wirelessly introduce malicious signals to the payment reader. Some tamper detection devices may open a circuit in response to tamper attempt.
The payment reader includes tamper detection circuitry for interacting with and controlling the various types of tamper detection devices. One such tamper detection method and system operates on conductive traces such that any substantial voltage variation on the trace, for example through interference with the trace or an actual open circuit, is indicative of a tamper event. In some embodiments, the conductive trace can include a wire mesh, which can be disposed along a circuit board layer within the electronic device. The term “mesh” as used here refers to one or more conductive traces that may be, but are not necessarily, electrically coupled to each other. In some embodiments, the conductive trace can be interwoven with one or more other conductive traces. In particular, the different interwoven conductive traces can run very closely together, along spatially parallel paths, across one or more circuit board layers, to render it more difficult for an attacker to circumvent the traces of the electronic device. The mesh substantially covers the regions of the substrate for which protection is desired. It is preferred that the traces do not possess any long range order, i.e. it is preferred that the traces do not have a repeating pattern. The absence of such order increases security by minimizing the possibility of predicting the location of the traces. The mesh may be present between or within layers of components of the secure data entry device. For example, the substrate that contains the electronic circuitry, e.g. the PCB, may be formed from a plurality of layers and the mesh, particularly in the form of conductive traces, may be formed on or within one or more of these layers. This provides further protection by registering any tampering event that disrupts a conductive trace.
In some embodiments, the conductive trace can include a metal dome switch, which can be affixed to an electronic surface of a component of the electronic device (e.g., circuit board) during the manufacturing process. In such embodiments, the conductive trace (connected to the internal power supply) can be used to detect a short-circuit condition on the metal dome switch, such as may result from physical tampering. In some embodiments, the conductive trace can be combined with another conductive trace to facilitate detection of physical tampering with an input interface of the electronic device. In such embodiments, one trace can be disposed within a flexible circuit region of the input interface while the other trace is disposed spatially in parallel with the electrical connector between the input interface and the electronic device. Tampering is determined to be detected upon detection of a short-circuit condition on either trace.
Going back to dome switches, the dome switch can be affixed to an interior surface of the housing. The metal dome switch, which can be any conventional switch contact used to produce a positive tactile feedback, may be used to detect tampering through detection of an “un-depressed” physical state of the switch caused by an opening of the housing. The metal dome switch can include one or more conductive, overlapping rings that form a dome. In operation, the metal dome switch functions as a closed switch when it is depressed (e.g., pushed downward between two surfaces), and an open switch when un-depressed.
A conventional technique for tamper detection using a conventional metal dome switch is to affix the switch within an electronic device in a permanently depressed state. During the manufacturing process, for example, the metal dome switch can be depressed between a top ring that is affixed to an interior surface of a housing of the electronic device, and a bottom ring that is affixed to an electrical component or surface of the electronic device (e.g., circuit board). The metal dome switch would be intended to remain with its flexible (compressible) contact in the depressed state, in a closed switch condition, through the lifetime of the electronic device. Any unauthorized attempt to open the housing of the electronic device would remove the pressure that maintains the compression on the flexible contact of the switch. Such pressure removal would cause the metal dome switch to become an open switch condition, which can be detected as tampering (by, e.g., tamper detector).
A known form of attack on this conventional technique is to drill into the housing and inject conductive ink into the space between the top and bottom rings of the metal dome switch. With the conductive ink, the metal dome switch remains electrically in a closed switch condition regardless of the compression state of its flexible contact.
To counter the above-mentioned shortcomings of the conventional tamper detection technique, a third ring can be added to the traditional metal dome switch. So, the metal dome switch has a top ring, a middle ring, and a bottom ring, where the top ring and the bottom ring are the flexible contacts and the middle ring can be substantially like the inner and outer security rings and may substantially or entirely surround (e.g. concentrically) the inner and outer security rings. The top ring is connected to the tamper detector, the middle ring is connected to the trace, and the bottom ring is tied to ground. The middle ring is also referred to as guard ring throughout the description.
In operation, the tamper detection system having guard rings can detect tampering within the electronic device by detecting a tampering event on the metal dome switch. In one embodiment, the system detects tampering when there exists a short-circuit condition on the metal dome switch. Under normal operation, the guard ring, which is connected to the trace, and the bottom ring, which is grounded, are not in electrical contact with each other. If the guard ring becomes electrically connected to the bottom ring (e.g., as a result of conductive ink injected into the metal dome switch), a short-circuit condition will result. The guard ring may also form a physical barrier to prevent the malicious application of a conductive liquid or conductive member into the electronic device.
The system will detect such a short-circuit condition, where the collapse indicates tampering and in one of the schemes, following a tampering event, all key information is automatically erased to prevent it from getting in unauthorized hands. The guard ring, the top ring and the bottom ring ideally are generally attached to the dome or a housing of the device in an M-shaped configuration. The traditional way of creating such a structure is to have the rings fabricated on the same plane and have contacts of the dome switch connected to the contacts of the rings in an M-shaped configuration or convex configuration and as such extending away from the circuitry. However, due to the ever-shrinking form factor considerations and constraints, especially in the field of smaller form factor devices like portable payment readers, the M-shaped configuration is more realistically and non-ideally a flat-configuration causing the guard ring and the other two rings to be substantially in one plane.
As contemplated by the present subject matter, various actions, such as accidentally dropping the electronic device, or changes in environment, have been known to cause guard ring to potentially become electrically connected to the top or bottom ring due to the form factor constraints mentioned above. For example, if the device is in a high-temperature or high humidity environment, the guard ring, being substantially in the same plane as the other two rings, accidentally connects with one of the other rings (even it if for few nanoseconds) causing the tamper detection system to detect it has an open circuit and subsequently causing keys to be erased. False tampering positives like these cause sensitive and critical data to be deleted for no reason, which in turn can frustrate the user of the device.
To prevent at least the problems mentioned above, the present subject matter discloses an arrangement, fabrication and construction of guard ring, the top ring and the bottom ring to be in different planes or the same plane but for the guard ring to be of a width different from the bottom or top ring, or in some cases, the guard ring is sub-flushed with respect to the other rings. Thus, the implementation involves creating a guard ring to have a different physical configuration than the inner or outer ring. In one implementation, the guard ring is placed in a substrate layer different from the layer in which the top ring and bottom ring are placed. In another implementation, the fabrication process involves selectively applying a layer of solder mask on the guard ring, of width or thickness substantially between about 8 and about 10 microns. The guard ring can be fabricated as an embedded component, for example in a cavity, such that the length between the top or bottom ring and the guard ring is approximately 80 microns. The guard ring may be concentric and can be closer to the inner ring than the outer ring and vice versa. While the rings are shown to be circular, it will be understood that any shape and form is possible. Furthermore, certain fabrication techniques are discussed in the present subject matter, such as laser techniques or masking, however, these are not limiting and any technique that facilitates longitudinal gap between the inner and outer ring and the guard ring can be used. Also, while the guard ring is shown to be in second layer, or one layer lower than the inner and outer ring, the guard ring can be embedded in any layer and the size, such as width or height, can be smaller or bigger depending on the application.
In some applications, the guard ring can be fabricated with a thickness different from the inner and outer ring and in different layers. Furthermore, even though the guard ring is shown to be between the inner and outer ring, it will be understood that in some implementations, the guard ring can be outside the inner and outer rings. In some implementations, the guard ring can have a staggered structure having plurality of widths and heights for to detect varying levels of accidental tampering.
In some implementations, the guard ring and its fabrication follows a subtractive process. However, additive processes where substrate material can be added to create a guard ring of desired height and width.
The circuit board 100 of
The board portion 155 of the tamper detection circuit 150 is connected to the conductive tamper traces 420 of the security housing via connector pieces 160. Each connector piece can be at least partially elastic to ensure that the connection between the board portion 155 of the tamper detection circuit 150 and the conductive tamper traces 420 of the security housing do not disconnect during ordinary operations. Each connector piece 160 can be held in place by a board connector piece holder 255 as illustrated, for example, in
While the exploded view of
Furthermore, while the top housing 105 and bottom housing 110 appear similarly shaped in
While the exploded view of
The top housing 105 of
The non-conductive portions of the top housing 105 and bottom housing 110 can be made from plastic, such as thermoplastics manufactured using Laser Direct Structuring (LDS), or from other non-conductive materials. The non-conductive portions of the top housing 105 and bottom housing 110 can be fused to each other and/or to the non-conductive board of the circuit board 100 to prevent opening the security housing, or can alternately be affixed with glue, cement, or other adhesives. The tamper traces 420 can be laid out over inside surface of the security housing during an LDS manufacturing process, if it is used.
The top housing 105 and bottom housing 110 of
The one or more reader components of the circuit board 100 can include a magnetic read head or other type of magnetic stripe reader that is capable of reading information from a magnetic stripe of a transaction card. The one or more reader components can also include an integrated circuit (IC) chip reader for reading an IC chip embedded in a transaction card. Such an IC chip can follow the Europay-Mastercard-Visa (EMV) payment IC chip standard. The IC chip reader can be contact-based, in that it can include one or more conductive prongs that contact a conductive metal contact pad of the IC chip. The IC chip can instead be contactless and use a contactless antenna. The contactless antenna can also double as a receiver for near-field-communication (NFC) signals, radio-frequency identification (RFID) signals, BLUETOOTH™ wireless signals, or some combination thereof, which can be sent from a transaction card or from a portable computing device.
Another alternate embodiment of the security housing (not pictured) can include two smaller side housings 115 fused together, each enclosing a portion of the circuit board, including a “left-side” side housing and a “right-side” side housing, each with conductive tamper traces 420 running along its interior. Tamper traces 420 of the “left-side” side housing can connect to tamper traces 420 of the “right-side” side housing or can remain separate.
The close-up view of
The conductive node set 205A of
The conductive node set 205A of
In an alternate embodiment, the one or both guard ring sections 220 can conduct a fourth voltage D, and can be connected to a separate power supply, or connected directly to ground, in which case the voltage D can be zero. In another alternate embodiment, the guard ring can be whole rather than divided into sections.
The circuit board 100 of
The circuit board 100 of
A second connector piece 160B is illustrated as held by the second board connector holder 255B, a third connector piece 160C is illustrated as held by the third board connector holder 255C, and a fourth connector piece 160D is illustrated as being placed into the fourth board connector holder 255D. While the first board connector holder 255A is illustrated as empty, with no corresponding first connector piece 160A, it should be understood that the first board connector holder 255A is also configured to hold a connector piece 160.
The close-up of the board conductive node set 250A of
Because the holder nodes 215 can be connected to the board portion 155 of the tamper detection circuit 150, the monitor nodes (not shown) of the board portion 155 of the tamper detection circuit 150 can detect disruption of the tamper detection circuit 150 from removal of the board connector holder 255. Furthermore, any damage to a board connector holder 255, such as damage from a malicious party drilling through a side of the security housing and through the board connector holder 255, can either sever the current running through the board connector holder 255 or can cause a short by connecting the board connector holder 255 to another element, such as the connector holder 160 enclosed within the board connector holder 255. Accordingly, use of the board connector holder 255 provides additional security.
The board connector holder 255 can be made of a metal or another conductive material, such as a carbon-based conductor. In addition to allowing the board connector holder 255 to conduct, the hardness of the material allows the board connector holder 255 to be thinner than a plastic connector holder. The hardness of the material also allows the board connector holder 255 to be constructed to include sidewalls that are perpendicular to the non-conductive board 200. Thus, use of board connector holders 255 allows the entire system—the circuit board 100 enclosed by the security housing—to be small in addition to being secure.
To counter such issues, the guard ring assembly is sub-flushed with respect to the connection nodes 210 as disclosed herein, and as such disposed or embedded in a cavity or trench with respect to the connection nodes 210. For this, the guard ring 220 is etched into the layer below the inner and outer ring and fabricated such that the guard ring has a height substantially smaller than the connection nodes 210. The guard ring 220 can also be in a layer much lower than the layer in which the conductive layers 304 are present, so for example, layer 3 or layer 4. The width of the trench can be more than the width of the conductive nodes (also referred to as inner and outer rings) since the guard ring is now in a different layer and within a guard ring recess 306. For this, the circuit board 100 includes a substrate 302 that further includes multiple conductive or copper layers 304 separated by dielectric layers 308. To form embedded components such as the guard ring 220, the holders or nodes 210 are fabricated in a conductive layer 304 different from guard ring's conductive layer 304.
An insulative coating similar to dielectric layer 308 is then laid on top of the recessed area other than over the guard ring 220. Thus, the implementation involves creating a guard ring to have a different physical configuration than the inner or outer ring, represented here by the connection nodes 210 or holder nodes 255. In one implementation, the guard ring is placed in a substrate layer different from the layer in which the top ring and bottom ring are placed. In another implementation, the fabrication process involves selectively applying a layer of solder mask on the guard ring, of width or thickness substantially between about 8 and about 10 microns. The guard ring 220 can be fabricated as an embedded component, for example in a cavity, such that the length between the top or bottom ring and the guard ring is approximately 80 microns. The guard ring may be concentric and can be closer to the inner ring than the outer ring and vice versa. While the rings are shown to be circular, it will be understood that any shape and form is possible. Furthermore, certain fabrication techniques are discussed in the present subject matter, such as laser techniques or masking, however, these are not limiting and any technique that facilitates longitudinal gap between the inner and outer ring and the guard ring can be used. Also, while the guard ring is shown to be in second layer, or one layer lower than the inner and outer ring, the guard ring can be embedded in any layer and the size, such as width or height, can be smaller or bigger depending on the application.
In some applications, the guard ring 220 can be fabricated with a thickness different from the inner and outer ring and in different layers. Furthermore, even though the guard ring is shown to be between the inner and outer ring, it will be understood that in some implementations, the guard ring can be outside the inner and outer rings.
Because the guard ring 220 in the recess 306 is within a trench, it is further away from the housing 105 and connector pieces 160, thus preventing accidental activation by coming into contact with the circuit board 100 and causing a short circuit or other unwanted connection. This protects both the tamper detection circuit 150 and the circuit board 100 from electrical interference.
Operationally, a first sensor element (such as a connection node) is disposed on a circuit board of the tamper detection circuit; a second sensor element (such as a connector piece 160) is disposed within an interior surface of a housing of the tamper detection circuit; and a guard ring 220 disposed on the circuit board of the tamper detection circuit configured to form an electrical connection with the first sensor element in response to injection of conductive fluid thereby indicating tampering with the tamper detection circuit, wherein the guard ring is configured to be on a plane substantially different from the first sensor element to prevent unintentional activation of the tamper detection circuit.
Structurally, to achieve this, in one implementation, a mechanical switch configured to indicate a non-tampered condition while closed and to indicate a tampered condition while open, the mechanical switch includes a fixed conductor located in a first plane of a circuit board; a mobile conductor configured to contact the fixed conductor while the mechanical switch is closed and further configured not to contact the fixed conductor while the mechanical switch is open; and a guard conductor configured to form an electrical connection with the fixed conductor or with the mobile conductor via a conductive fluid in response to injection of the conductive fluid into the mechanical switch, wherein the guard conductor is located in a second plane of the circuit board substantially different from the first plane to prevent a direct contact between the guard conductor and the fixed conductor or mobile conductor.
The connection areas 415 can optionally be raised relative to the rest of the interior surface 405 so that the connection areas 415 are closer to the circuit board 100 than the rest of the interior surface 405 of the top housing 105.
The interior surface 405 of the top housing 105 of
Some of the tamper traces 420 of
The tamper traces 420 of
In one embodiment, the tamper traces 420 can be arranged to serve not only as part of the housing portion of the tamper detection circuit 150, but also simultaneously as an antenna 140 as described in relation to
According to one implementation, the method includes: a) providing a core with a plurality of conductive or copper layers, where each layer is separated by a layer of dielectric material or prepreg/FR4 material at step 502; b) exposing the copper contacts in a first copper layer to form conductive nodes (an inner ring and an outer ring) and guard ring by removing, for example by laser ablation, the dielectric material atop the first copper layer, ensuring that the inner, outer and the guard ring are separated by a predetermined gap at step 504; c) applying solder mask layer, such as a photo sensitive epoxy based ink, to at least part of the guard ring so as to prevent unintentional activation of the guard ring at step 506, and connecting a dome (such as one with connector pieces 160 and top housing 105) with the conductive nodes. Since the guard ring is now a different configuration from the conductive nodes, the unintentional activation is prevented.
The term “component recess” as used herein refers to a recess which serves to accommodate electronic components and for this purpose approximately has the same shape as the components. The components recesses preferably have a depth that is greater than the height of the electronic component to be able to embed the component in the dielectric layer. Electrically conducting structure elements may be formed in the component recesses to electrically connect the terminals on the electronic components to be inserted in such recesses to other conductor structures in the circuit plane. The cross-section and plan view of the component recesses is preferably rectangular but may of course be of any shape as required.
The term “via hole” as used herein refers to an aperture in the dielectric material which touches at least two circuit planes so that electrical connection may be made between these planes via such via hole. In most cases via holes only connect two such planes. If such a via hole is located at the outer side of the assembly, it will be a blind hole. If it is located between two layers which are situated beneath the outermost circuit plane it will be a buried hole. Via holes are preferably cylindrical but may also be V-shaped.
Apart from trenches and component recesses also via holes may be produced as three-dimensional structure elements in the dielectric layer by laser ablation or by any other means.
The present subject matter also contemplates guard rings to be in a different core as the conductive nodes. For example, in multi-core PCBs, the method of fabrication includes drilling a cavity or trench into a second core in which the guard ring is crafted. One of the ways to achieve this is through laser ablation and other such techniques. The flow diagram of
The exploded side view of
The exploded side view of
The circuit board components 900 of
The circuit board components 900 of
The circuit board components 900 of
The circuit board components 900 of
The circuit board components 900 of
The circuit board components 900 of
Peripheral circuitry 980 may include any type circuitry permitting connection and use of computer support devices to add additional functionality to the circuit board 100. For example, peripheral circuitry 980 may support connection of a modem or a router. The components shown in
The foregoing detailed description of the technology has been presented for purposes of illustration and description. It is not intended to be exhaustive or to limit the technology to the precise form disclosed. Many modifications and variations are possible in light of the above teaching. The described embodiments were chosen in order to best explain the principles of the technology, its practical application, and to enable others skilled in the art to utilize the technology in various embodiments and with various modifications as are suited to the particular use contemplated.
As a further example, variations of apparatus or process parameters (e.g., dimensions, configurations, components, process step order, etc.) may be made to further optimize the provided structures, devices and methods, as shown and described herein. In any event, the structures and devices, as well as the associated methods, described herein have many applications. Therefore, the disclosed subject matter should not be limited to any single embodiment described herein.
Number | Name | Date | Kind |
---|---|---|---|
3276032 | Ordower | Sep 1966 | A |
4691350 | Kleijne et al. | Sep 1987 | A |
4811288 | Kleijne et al. | Mar 1989 | A |
5233505 | Chang et al. | Aug 1993 | A |
5574600 | Agro | Nov 1996 | A |
5666265 | Lutz et al. | Sep 1997 | A |
5880523 | Candelore | Mar 1999 | A |
6084905 | Ishifuji et al. | Jul 2000 | A |
6144800 | Kobayashi | Nov 2000 | A |
6193152 | Fernando et al. | Feb 2001 | B1 |
6230972 | Dames et al. | May 2001 | B1 |
6234389 | Valliani et al. | May 2001 | B1 |
6247645 | Harris et al. | Jun 2001 | B1 |
6492978 | Selig et al. | Dec 2002 | B1 |
6557754 | Gray et al. | May 2003 | B2 |
6715078 | Chasko et al. | Mar 2004 | B1 |
7049970 | Allen et al. | May 2006 | B2 |
7343496 | Hsiang et al. | Mar 2008 | B1 |
7373667 | Millard | May 2008 | B1 |
7428984 | Crews et al. | Sep 2008 | B1 |
7474550 | Fujisawa et al. | Jan 2009 | B2 |
7806341 | Farooq et al. | Oct 2010 | B2 |
8310370 | Williams, Jr. et al. | Nov 2012 | B1 |
8701997 | Dorsey et al. | Apr 2014 | B2 |
9203546 | Wade et al. | Dec 2015 | B1 |
9298956 | Wade et al. | Mar 2016 | B2 |
9449192 | Wade et al. | Sep 2016 | B1 |
9578763 | Wade | Feb 2017 | B1 |
9730315 | Razaghi | Aug 2017 | B1 |
9852422 | Wade et al. | Dec 2017 | B1 |
9913778 | Dvorak et al. | Mar 2018 | B2 |
10140604 | Douthat et al. | Nov 2018 | B1 |
10192076 | Razaghi | Jan 2019 | B1 |
10251260 | Razaghi | Apr 2019 | B1 |
10504096 | Hafemann et al. | Dec 2019 | B1 |
20010056542 | Cesana et al. | Dec 2001 | A1 |
20020060869 | Sawaguchi et al. | May 2002 | A1 |
20050039052 | O'Donnell et al. | Feb 2005 | A1 |
20050191878 | Castle | Sep 2005 | A1 |
20050218229 | Morley, Jr. et al. | Oct 2005 | A1 |
20050219728 | Durbin et al. | Oct 2005 | A1 |
20050275538 | Kulpa | Dec 2005 | A1 |
20060038011 | Baker et al. | Feb 2006 | A1 |
20060102458 | Kim et al. | May 2006 | A1 |
20060220850 | Bowser et al. | Oct 2006 | A1 |
20060238301 | Wu et al. | Oct 2006 | A1 |
20070131768 | Wakabayashi | Jun 2007 | A1 |
20070271189 | Morten et al. | Nov 2007 | A1 |
20070290845 | Benjelloun | Dec 2007 | A1 |
20070293142 | Dehmas et al. | Dec 2007 | A1 |
20080110987 | Cato et al. | May 2008 | A1 |
20080164320 | Garrido-Gadea et al. | Jul 2008 | A1 |
20080278217 | Hankhofer | Nov 2008 | A1 |
20080284610 | Hunter | Nov 2008 | A1 |
20080309396 | Lee | Dec 2008 | A1 |
20090070658 | Patapoutian et al. | Mar 2009 | A1 |
20090291635 | Savry | Nov 2009 | A1 |
20100034434 | von Mueller et al. | Feb 2010 | A1 |
20100150465 | Lee et al. | Jun 2010 | A1 |
20100244818 | Atwood et al. | Sep 2010 | A1 |
20100327856 | Lowy | Dec 2010 | A1 |
20110031985 | Johnson | Feb 2011 | A1 |
20110048756 | Shi et al. | Mar 2011 | A1 |
20110090658 | Adams et al. | Apr 2011 | A1 |
20110135092 | Lehner | Jun 2011 | A1 |
20110253788 | Campbell et al. | Oct 2011 | A1 |
20120002313 | Miyabe et al. | Jan 2012 | A1 |
20120047374 | Klum et al. | Feb 2012 | A1 |
20120091201 | Babu et al. | Apr 2012 | A1 |
20120151607 | Chambourov | Jun 2012 | A1 |
20120163434 | Kim et al. | Jun 2012 | A1 |
20120286760 | Carapelli et al. | Nov 2012 | A1 |
20130055416 | Ma et al. | Feb 2013 | A1 |
20130104252 | Yanamadala et al. | Apr 2013 | A1 |
20130111227 | Sauerwein, Jr. | May 2013 | A1 |
20140002239 | Rayner | Jan 2014 | A1 |
20140049887 | Salle | Feb 2014 | A1 |
20140070006 | Weldele et al. | Mar 2014 | A1 |
20140081874 | Lewis et al. | Mar 2014 | A1 |
20140124576 | Zhou et al. | May 2014 | A1 |
20140204529 | White et al. | Jul 2014 | A1 |
20140211336 | Liao et al. | Jul 2014 | A1 |
20150097572 | Wade | Apr 2015 | A1 |
20150224892 | Callicoat et al. | Aug 2015 | A1 |
20170104325 | Eriksen | Apr 2017 | A1 |
20170324195 | Eriksen | Nov 2017 | A1 |
Number | Date | Country |
---|---|---|
195 12 266 | Mar 1996 | DE |
103 37 567 | Jan 2005 | DE |
103 40 289 | Mar 2005 | DE |
10-2008-0105500 | Dec 2008 | KR |
2004086202 | Oct 2004 | WO |
2015050746 | Apr 2015 | WO |
Entry |
---|
Balaban, D., “Google's Schmidt Predicts Contactless Terminal Rollout,” NFC Times, published Jun. 23, 2011, Retrieved from the Internet URL: http://www.nfctimes.com/news/google-s-schmidt-predicts-contactless-terminal-rollout, on Aug. 25, 2015, pp. 1-4. |
Non-Final Office Action dated Feb. 24, 2015 for U.S. Appl. No. 14/296,310, of Wade, J., et al. filed Jun. 4, 2014. |
Notice of Allowance dated Jul. 29, 2015 for U.S. Appl. No. 14/296,310, of Wade, J., et al. filed Jun. 4, 2014. |
Non-Final Office Action dated Nov. 13, 2015, for U.S. Appl. No. 14/046,791, of Wade, J., et al., filed Oct. 4, 2013. |
Non Final Office Action dated Dec. 31, 2015, for U.S. Appl. No. 14/285,438, of Wade, J., filed May 22, 2014. |
Notice of Allowance dated Jan. 20, 2016, for U.S. Appl. No. 14/046,791, of Wade, J., et al., filed Oct. 4, 2013. |
Non-Final Office Action dated Jan. 25, 2016 for U.S. Appl. No. 14/927,284, of Wade, J., et al. filed Oct. 29, 2015. |
Notice of Allowance dated May 31, 2016 for U.S. Appl. No. 14/927,284, of Wade, J., et al. filed Oct. 29, 2015. |
Final Office Action dated Jun. 6, 2016, for U.S. Appl. No. 141285,438, of Wade, J., filed May 22, 2014. |
Advisory Action dated Aug. 18, 2016, for U.S. Appl. No. 14/285,438, of Wade, J., filed May 22, 2014. |
Notice of Allowance dated Oct. 25, 2016, for U.S. Appl. No. 14/285,438, of Wade, J., filed May 22, 2014. |
Non Final office Action dated Dec. 6, 2016, for U.S. Appl. No. 15/224,450, of Wade, J., et al. filed Jul. 29, 2016. |
First Examination Report for Australian Patent Application No. 2014329851, dated Dec. 15, 2016. |
Non Final Office Action dated Jan. 20, 2017, for U.S. Appl. No. 14/184,636, of Wade, J., et al., filed Feb. 19, 2014. |
Notice of Acceptance for Australian Patent Application No. 2014329851, dated Mar. 6, 2017. |
Final office Action dated May 8, 2017, for U.S. Appl. No. 15/224,450, of Wade, J., et al. filed Jul. 29, 2016. |
Final Office Action dated Aug. 2, 2017, for U.S. Appl. No. 14/184,636, of Wade, J., et al., filed Feb. 19, 2014. |
Notice of Allowance dated Aug. 24, 2017, for U.S. Appl. No. 15/224,450, of Wade, J., et al. filed Jul. 29, 2016. |
Advisory Action dated Oct. 26, 2017, for U.S. Appl. No. 14/184,636, of Wade, J., et al., filed Feb. 19, 2014. |
Non Final office Action dated Feb. 23, 2018, for U.S. Appl. No. 15/250,460, of Razaghi, M., filed Aug. 29, 2016. |
Non Final Office Action dated May 11, 2018, for U.S. Appl. No. 15/250,468, of Razaghi, M., filed Aug. 29, 2016. |
International Search Report and Written Opinion for International Application No. PCT/US2014/057044, dated Dec. 19, 2014. |
Extended European Search Report for European Patent Application No. 14850478.0, dated May 16, 2017. |
Non-Final Office Action dated Dec. 29, 2016, for U.S. Appl. No. 15/250,446, of Razaghi, M., filed Aug. 29, 2016. |
Notice of Allowance dated Apr. 13, 2017, for U.S. Appl. No. 15/250,446, of Razaghi, M., filed Aug. 29, 2016. |
Office Action for European Patent Application No. 14 850 478.0, dated Aug. 30, 2018. |
Notice of Allowance dated Sep. 13, 2018, for U.S. Appl. No. 15/250,468, of Razaghi, M., filed Aug. 29, 2016. |
Non Final Office Action dated Oct. 5, 2018, for U.S. Appl. No. 14/184,636, of Wade, J., et al., filed Feb. 19, 2014. |
Notice of Allowance dated Dec. 3, 2018, for U.S. Appl. No. 15/250,460, of Razaghi, M., filed Aug. 29, 2016. |
Corrected Notice of Allowance dated Dec. 28, 2018, for U.S. Appl. No. 15/250,468, of Razaghi, M., filed Aug. 29, 2016. |
Final Office Action dated May 23, 2019, for U.S. Appl. No. 14/184,636, of Wade, J., et al., filed Feb. 19, 2014. |
Notice of Allowance dated Jul. 19, 2019, for U.S. Appl. No. 15/581,871 of Hafemann, S., et al. filed Apr. 28, 2017. |
Advisory Action dated Jul. 23, 2019, for U.S. Appl. No. 14/184,636, of Wade, J., et al., filed Feb. 19, 2014. |