Test system and test method using virtual review

Abstract

Disclosed are a test system and a test method using a virtual review, capable of driving a test device and reduce the number of operators by allowing an operator to perform review and determination based on a captured image of a defect on a substrate. The test system using a virtual review comprises: a test device that takes an image of a defect on an array substrate or color filter substrate to acquire a captured image and provides examination information related to the defect. A main server constructs the examination information from the test device as a database and transmits them to a review host. The review host determines whether a defect exosts on the array substrate or color filter substrate based on the examination information from the main server to yield a determination result and resends the determination result to the main server.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a view of illustrating a construction of a test system using a virtual review according to a first embodiment of the present invention.

FIG. 2 is a flow chart of illustrating an operation of a test method using a virtual review according to the first embodiment of the present invention.

FIG. 3 is a view of illustrating another construction of a test system using a virtual review according to a second embodiment of the present invention.

FIG. 4 is a flow chart of illustrating another operation of a test method using a virtual review according to the second embodiment of the present invention.

FIG. 5 is a signal flow diagram of the test system using the virtual review according to the second embodiment of the present invention.

FIG. 6 a is a captured image of illustrating a defect created according to the second embodiment of the present invention, and FIG. 6b is a captured image of illustrating a state after ADR.

Claims

1. A test system comprising: a test device that takes an image of a defect on an array substrate or color filter substrate to acquire a captured image and provides examination information related to the defect;a main server that constructs the examination information from the test device as a database and transmits them; anda review host that receives the examination information and that determines the existence of a defect on the array substrate or color filter substrate based on the examination information from the main server to yield a determination result and resend the determination result to the main server.

2. The test system of claim 1, wherein the examination information related to the defect comprises, an ID of the array substrate or color filter substrate, IDs of a plurality of pannels provided on the array substrate or color filter substrate, number of the defect according to detected order, an image file capturing the defect, and number of the test device having detected the defect.

3. The test system of claim 1, wherein the determination result comprises, a case where the defect is required to be repaired, a case where the state of defect is good, a case where the state of defect is not good, and a case where the state of defect is difficult to determine.

4. The test system of claim 3, wherein if the determination result is the case where the defect is required to be repaired, a request for repair is made by the main server to the test device, and the defect is repaired by the test device.

5. The test system of claim 4, wherein if the defect is repaired by the test device, a captured image of the repaired region is created and the captured image is transmitted from the test device to the main server.

6. The test system of claim 1, further comprising: a quality management host that receives the captured image from the main server and determines whether a defect exists on the array substrate or color filter substrate based on the state of the defect.

7. The test system of claim 1, further comprising: a reexamination host that reexamines the state of the defect based on a real time image of the defect captured in real time in a case where the state of the defect is difficult to determine.

8. The test system comprising: a test device that takes an image of a defect on an array substrate or color filter substrate to acquire a captured image and provides examination information related to the defect;a main server that constructs the examination information from the test device as a database and then transmits them to a first review host;the first review host that determines whether a defect exists on the array substrate or color filter substrate based on the examination information from the main server to yield a determination result and resends the determination result to the main server; anda second review host that receives the captured image from the main server and determines whether a defect exists on the array substrate or color filter substrate based on the state of the defect.

9. The test system of claim 8, wherein the examination information related to the defect comprises, an ID of the array substrate or color filter substrate, IDs of a plurality of pannels provided on the array substrate or color filter substrate, number of the defect according to detected order, an image file capturing the defect, and number of the test device having detected the defect.

10. The test system of claim 8, wherein the determination result comprises, a case where the defect is required to be repaired, a case where the state of defect is good, a case where the state of defect is not good, and a case where the state of defect is difficult to determine.

11. The test system of claim 10, wherein if the determination result is the case where the defect is required to be repaired, a request for repair is made by the main server to the test device, and the defect is repaired by the test device.

12. The test system of claim 11, wherein if the defect is repaired by the test device, a captured image of the repaired region is created and the captured image is transmitted from the test device to the main server.

13. The test system of claim 8, further comprising: a reexamination host that reexamines the state of the defect based on a real time image of the defect captured in real time in a case where the state of the defect is difficult to determine.

14. The test system of claim 8, further comprising: an alarm host that monitors the state of the test device to thereby call an operator.

15. The test system of claim 8, further comprising: a sub-server that performs the same function as the main server in a case where the main server is not operated.

16. A test method comprising: taking an image of a defect on an array substrate or color filter substrate to acquire a captured image and providing examination information related to the defect from a test device;constructing the examination information from the test device as a database by a main server; anddetermining whether there is a defect on the array substrate or color filter substrate based on the examination information from the main server to yield a determination result and resending the determination result to the main server.

17. The test method of claim 16, wherein the examination information related to the defect comprises, an ID of the array substrate or color filter substrate, IDs of a plurality of pannels provided on the array substrate or color filter substrate, number of the defect according to detected order, an image file capturing the defect, and number of the test device having detected the defect.

18. The test method of claim 16, wherein the determination result comprises, a case where the defect is required to be repaired, a case where the state of defect is good, a case where the state of defect is not good, and a case where the state of defect is difficult to determine.

19. The test method of claim 18, wherein if the determination result is the case where the defect is required to be repaired, a request for repair is made by the main server to the test device, and the defect is repaired by the test device.

20. The test method of claim 19, wherein if the defect is repaired by the test device, a captured image of the repaired region is created and the captured image is transmitted from the test device to the main server.

21. The test method of claim 16, further comprising: receiving the captured image from the main server and determining whether a defect exists on the array substrate or color filter substrate based on the state of the defect.

22. The test method of claim 16, further comprising: reexamining the state of the defect based on a real time image of the defect captured in real time in a case where the state of the defect is difficult to determine.