Claims
- 1. A method of forming a multilayer circuit board comprising:
providing a first core that includes a substrate and heavy copper circuit traces; filling the spaces between circuit traces with a resin; and at least partially curing the resin so as to form two exposed and substantially planar surfaces on opposite sides of the core.
- 2. The method of claim 1 wherein both of the two substantially planar surfaces is separated from a surface of the heavy copper circuit traces by less than 2 mils.
- 3. The method of 2 wherein the resin used to fill the spaces also covers the traces, and the at least partial curing of the resin occurs while the resin filling the spaces and covering the traces forms an exposed surface of the core.
- 4. The method of 3 wherein the dielectric breakdown voltage of the resin covering the traces is at least 1500 V/mil, and the cured resin has a thermal conductivity of at least 0.5 W/m-° K.
- 5. The method of 3 wherein the circuit traces comprise at least 0.005″ thick copper.
- 6. The method of 3 wherein the thickness of the first core varies less than 0.001″ across the entire core.
- 7. The method of 1 wherein the is photo-curable, and at least partially curing the resin comprises exposing the resin to ultraviolet light and subsequently baking the first core.
- 8. The method of 3 further comprising:
providing a second core that includes a substrate and heavy copper circuit traces and
has cured resin filling spaces between and covering the traces; laminating the first core to the second core such that the distance between the cores is less than 0.004″.
- 9. The method of 8 wherein the distance between the cores is less than 0.002″.
- 10. The method of 8 wherein laminating the first core to the second core comprises sandwiching one or more at least partially cured dielectric layers between the first and second cores.
- 11. The method of claim 10 wherein the ratio of copper thickness to the dielectric spacing between the traces of the first and second core is at least 1.
- 12. The method of claim 11 wherein the ratio of copper thickness to the dielectric spacing between the traces of the first and second core is at least 1.4.
- 13. The method of 12 wherein the number of sandwiched dielectric layers is 1 or 2.
- 14. A core comprising circuit traces and spaces with the spaces being filled with an at least partially cured, substantially void free resin wherein the circuit traces comprise at least 0.003″ thick copper, and wherein the traces and filled spaces form an exposed planar surface.
- 15. The core of 14 wherein the exposed planar surface has a surface variance of less than X mils where X is one of 3, 2, 1, and 0.5.
- 16. A multilayer circuit board comprising at least one substantially void free encapsulated heavy copper core.
- 17. The circuit board of claim 16 further comprising at least two heavy copper planes separated by a dielectric layer having a thermal conductivity of at least 2 W/m-° K, and a dielectric breakdown voltage of at least 1500 V/mil, wherein the ratio of copper thickness to the dielectric spacing between the heavy copper planes is at least 1.4.
- 18. The board of claim 17 wherein the thickness of the copper planes is at least 0.005″.
Parent Case Info
[0001] This application claims the benefit of U.S. provisional application No. 60/289505 incorporated herein by reference in its entirety.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60289505 |
May 2001 |
US |