Toroidal filament for plasma generation

Information

  • Patent Grant
  • 6204508
  • Patent Number
    6,204,508
  • Date Filed
    Friday, August 7, 1998
    26 years ago
  • Date Issued
    Tuesday, March 20, 2001
    23 years ago
Abstract
A filament (18) for an ion implanter ion source or plasma shower is provided comprising first and second legs (20a, 20b) and a thermally emissive central portion (40) having ends connected, respectively, to the first and second legs. Preferably, the legs (20a, 20b) are constructed from tantalum (Ta), and the thermally emissive portion (40) is constructed of tungsten (W). The thermally emissive portion is coiled substantially along the entire length thereof and formed in the shape of a generally closed loop, such as a toroid. The toroid is comprised of two toroid halves (40a, 40b) coiled in opposite directions. The toroid halves are constructed of a plurality of filament strands (42, 44, 46) twisted together along substantially the entire length thereof. The coils of the toroid are capable of establishing closed loop magnetic field lines (B) therein when electrical current flows through the thermally emissive portion. The closed loop magnetic field lines (B) confine electrons (E) emitted from the surface of the thermally emissive portion within the confines of the coils.
Description




FIELD OF THE INVENTION




The present invention relates generally to plasma generation sources for ion implantation equipment, and more specifically to a toroidal filament for use in such sources.




BACKGROUND OF THE INVENTION




Ion implantation has become a standard accepted technology of industry to dope workpieces such as silicon wafers or glass substrates with impurities in the large scale manufacture of items such as integrated circuits and flat panel displays. Conventional ion implantation systems include an ion source that ionizes a desired dopant element which is then accelerated to form an ion beam of prescribed energy. The ion beam is directed at the surface of the workpiece to implant the workpiece with the dopant element. The energetic ions of the ion beam penetrate the surface of the workpiece so that they are embedded into the crystalline lattice of the workpiece material to form a region of desired conductivity. The implantation process is typically performed in a high vacuum process chamber which prevents dispersion of the ion beam by collisions with residual gas molecules and which minimizes the risk of contamination of the workpiece by airborne particulates.




Ionized plasma is generated in a typical ion implanter in at least two separate locations. First, at the front end of an ion implanter, an ion source generates a plasma, from which an ion beam may be extracted, by ionizing an inert gas. An example of such an ion source is shown in U.S. Pat. No. 5,497,006 to Sferlazzo, et al., assigned to the assignee of the present invention and incorporated by reference as if fully set forth herein.




A simplified diagram of an ion source is shown in

FIG. 1. A

gas such as boron or phosphorous is input into an arc chamber AC via an inlet I and exposed to an energized filament F. The filament emits high-energy electrons E which are repelled by repeller R to confine the electrons to an ionization region between the filament and the repeller. The deflected electrons E collide with ionizable gas molecules in the ionization region, where the probability of collision with ionizable gas molecules is maximized. In this manner, a plasma is created comprised at least partially of positively charged ions. A generally positively charged ion beam is drawn from this plasma, typically through a source aperture SA in the arc chamber.




In addition to the repeller, a typical ion source also includes source magnets, as shown in

FIG. 1

(power supplies not shown). The source magnets SM create a magnetic field across the arc chamber AC. The magnetic field alters the spiral path P of the electrons E emitted by the filament F and traveling through the arc chamber, in a well known manner, thereby increasing the probability of collisions with the ionizable gas molecules provided through inlet I and confined between the filament F and the repeller R. The source magnet SM current is adjusted to maximize ion beam current and beam quality. Accordingly, the source magnets SM and the repeller R confine the high-energy electrons emitted by the filament to the ionization region.




Also, a plasma is generated downstream in the implanter in a plasma shower. The plasma shower serves to counter the effects of wafer charging that the positively charged ion beam would otherwise have on a wafer being implanted. Such a system is shown in U.S. Pat. No. 4,804,837 to Farley, assigned to the assignee of the present invention and incorporated by reference as if fully set forth herein.




A simplified diagram of a typical plasma shower is shown in FIG.


2


. The plasma shower comprises an arc chamber AC into which an inert gas such as argon is input via inlet I and exposed to an energized filament F. The filament emits high-energy electrons E that ionize the inert gas molecules to create a plasma within the arc chamber. The plasma diffuses through aperture A into the path of ion beam B passing through vacuum chamber VC. The plasma aids in neutralizing the net charge of the beam which in turn reduces the positive charge accumulation on the wafer as the ion beam strikes the wafer surface




The use of a repeller and a source magnet in an ion source, however, results in added complexity, cost, size, and power consumption of these devices. Further, source magnets create electrical noise that can perturb the plasma within the ion source. In addition, filaments in known plasma showers do not produce plasmas of sufficiently high density due to the lack of a containment mechanism for the high-energy electrons E emitted by the filament F. Moreover, attempts at increasing the plasma density typically require that the filament F consume significant amounts of energy.




Accordingly, it is an object of the present invention to provide a filament for use in a plasma generation source in an ion implanter such as an ion source or a plasma shower, which provides a low-noise, high density plasma while overcoming the deficiencies of known ion or plasma generation sources. It is a further object of the invention to provide a simple, energy efficient, economical and compact mechanism for primary electron confinement in an ion source or plasma shower to create a high density, low-noise plasma.




SUMMARY OF THE INVENTION




A filament for an ion implanter ion source or plasma shower is provided comprising first and second legs and a thermally emissive central portion having ends connected, respectively, to the first and second legs. Preferably, the legs are constructed from tantalum (Ta), and the thermally emissive portion is constructed of tungsten (W).




The thermally emissive portion is coiled substantially along the entire length thereof and formed in the shape of a generally closed loop, such as a toroid. The toroid is comprised of two toroid halves coiled in opposite directions. The toroid halves are constructed of a plurality of filament strands twisted together along substantially the entire length thereof. The coils of the toroid are capable of establishing closed loop magnetic field lines therein when electrical current flows through the thermally emissive portion. The closed loop magnetic field lines confine electrons emitted from the surface of the thermally emissive portion within the confines of the coils.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a cross sectional view of a conventional ion source for an ion implanter;





FIG. 2

is a cross sectional view of a conventional plasma shower for an ion implanter;





FIG. 3

is a cross sectional view of an ion source for an ion implanter using the filament of the present invention;





FIG. 4

is a cross sectional view of a plasma shower for an ion implanter using the filament of the present invention;





FIG. 5

is a perspective, partially cross sectional view of the filament shown in the ion source of FIG.


3


and the plasma shower of

FIG. 4

;





FIG. 6

is perspective view of the filament of

FIG. 5

, taken along the lines


6





6


; and





FIG. 7

is a partial cross section of the filament of

FIG. 5

, taken along the lines


7





7


.











DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS OF THE INVENTION




Referring now to

FIG. 3

of the drawings, a first embodiment of the invention is shown, wherein the invention is incorporated into an ion source


10


. The ion source comprises an arc chamber


12


formed by walls


14


. An ionizable gas such as boron or phosphorous is input into the arc chamber


12


via inlet


16


and exposed to a filament


18


constructed according to the principles of the present invention. The filament is energized by a power supply (not shown) which applies a voltage across filament legs


20


to create a current flow therein. The filament thereby thermionically emits high-energy electrons E which ionize the gas, creating a plasma which exits the arc chamber via exit aperture


22


. The general shape of the filament is a coil formed into the shape of a closed loop which, as explained further below, confines high energy electrons E within the coil, effectively eliminating the need for a repeller or source magnet as shown in the prior art ion source of FIG.


1


.




Referring now to

FIG. 4

of the drawings, a second embodiment of the invention is shown, wherein the invention is incorporated into a plasma shower


30


. The plasma shower comprises an arc chamber


32


formed by walls


33


into which an inert gas such as argon is input via inlet


34


and exposed to the energized filament


18


. The filament emits high-energy electrons E that are trapped within the confines of the coils of the closed loop filament. The high-energy electrons E collide with ionizable gas molecules to create a plasma comprised at least partially of low energy electrons e. The low energy electrons move from the arc chamber


32


through exit aperture


38


to an adjacent vacuum chamber


36


where they become trapped within the ion beam B passing therethrough. Again, the general shape of the filament is a closed loop which, as explained further below, confines high energy electrons E therein, enabling the generation of a high-density plasma within the arc chamber


32


, while consuming less power than the prior art plasma shower of FIG.


2


.




The inventive filament


18


used in the devices of

FIGS. 3 and 4

is shown in more detail in

FIGS. 5 through 7

Referring now to

FIG. 5

, the filament


18


comprises a pair of legs


20




a


and


20




b


attached to a thermally emissive coiled central portion


40


. Preferably the legs are constructed of tantalum (Ta) and the thermally emissive portion is comprised of tungsten (W). The thermally emissive coiled portion


40


may be connected to the legs


20


by welding, press fitting, or crimping. Alternatively, the legs and the coiled portion may be constructed unitarily as a single element. As such, the legs and the coiled portion would be integrally “connected”.




By applying a positive voltage differential across the legs


20




a


and


20




b


, an electrical current I flows in through leg


20




a


, through thermally emissive coiled portion


40


, and out through leg


20




b


, in the direction shown in FIG.


5


. As a result, thermionic emission occurs at the surface of the thermally emissive coiled portion


40


, resulting in the emission of high-energy electrons E. Such high-energy electrons E are suitable for ionizing gas molecules colliding therewith.




As shown in

FIG. 6

, in a preferred embodiment, the thermally emissive coiled portion


40


of filament


18


takes the shape of a toroid. The toroid


40


is comprised of two toroid halves


40




a


and


40




b


, each of which extends between legs


20




a


and


20




b


. Each of the toroid halves is constructed of a stranded grouping of three tungsten filaments,


42


,


44


and


46


, as shown in the cross sectional view of FIG.


7


. Although three filaments are shown in

FIG. 7

, more or less may be utilized in constructing the toroid halves


40




a


and


40




b.






The triple filaments (


42


,


44


and


46


) are twisted along their entire lengths. Fixed at both ends at legs


20




a


and


20




b


, the filaments are twisted in a counter clockwise direction when viewed as extending outward from the legs


20


at each end (the view of FIG.


6


). The use of a plurality of twisted filaments instead of a single, thicker filament results in a longer filament lifetime due to a finer grain and fewer defects found in such thinner filaments when compared to thicker filaments.




Also, the coil halves


40




a


and


40


are wound in opposite directions when viewed from their respective ends at each leg


20


. For example, when viewed from leg


20




a


along line


50


, coil half


40




a


is wound in a counter clockwise direction and when viewed along line


52


, coil half


40




b


is wound in a clockwise direction. Similarly, when viewed from leg


20




b


along line


54


, coil half


40




a


is wound in a counter clockwise direction and when viewed along line


56


, coil half


40




b


is wound in a clockwise direction.




In operation, a positive voltage potential is applied across the legs


20




a


and


20




b


to induce current flow in the filament, from leg


20




a


to leg


20




b


via the toroidal thermally emissive portion


40


, as shown by the directional arrows I (see FIG.


6


). The current flow I through the coiled toroidal halves establishes a magnetic field. Because the coil halves are wound in opposite directions, the magnetic field is characterized by magnetic field lines B within the confines of its coils, as shown in FIG.


6


.




Primary electrons E generated by thermal emission of the filament and emitted from the surface thereof spiral in a tight orbit along the magnetic field lines B, around the interior of the toroid coils. Because these magnetic field lines are closed, the high-energy electrons E are confined within the interior of the coils. These primary electrons E are suitable for ionizing gas molecules with which they come into contact in the arc chamber. After numerous collisions with gas molecules in the arc chamber, the high-energy electrons lose sufficient energy to become thermalized low energy electrons, which can escape the confines of the toroidal coils. Any such lower energy electrons can diffuse out from the confines of the toroidal coils and migrate toward the walls of the arc chamber in the ion source or plasma shower of

FIGS. 3 and 4

, respectively.




The result of the filament design of the present invention is a highly efficient filament which is energized to create a low-noise high density plasma in the arc chamber


12


of the ion source of

FIG. 3

or the corresponding arc chamber


32


of the plasma shower of FIG.


4


. The plasma is less “noisy” than that which could be generated in the prior art ion source of

FIG. 1

, because no source magnets are used. Such magnets typically cause a perturbance of the plasma, which perturbance is exaggerated in the case of high-density plasmas due to the required corresponding increased current in the magnets. Accordingly, using the filament


18


of the present invention, the current may be increased (as compared to the filament used in the device of

FIG. 1

) to create a high density, low-noise plasma.




Although the disclosed embodiments of the invention utilize a twisted grouping of twisted filaments formed into the shape of a coiled, regular toroid, it is to be understood that the invention is not so limited. For example, any shape of coiled single strand filament formed into a generally closed loop may serve the purposes of the present invention.




Accordingly, a preferred embodiment of an improved filament for an ion source or a plasma shower in an ion implanter has been described. With the foregoing description in mind, however, it is understood that this description is made only by way of example, that the invention is not limited to the particular embodiments described herein, and that various rearrangements, modifications, and substitutions may be implemented with respect to the foregoing description without departing from the scope of the invention as defined by the following claims and their equivalents.



Claims
  • 1. An ion source (10) for an ion implanter, comprising:(i) an arc chamber (12) formed by walls (14); (ii) an inlet (16) for introducing an ionizable gas into said arc chamber; (iii) an exit aperture (22) from which an ionized plasma may be extracted; and (iv) a filament (18) having first and second legs (20a, 20b) and a thermally emissive central portion (40) having ends connected, respectively, to said first and second legs, said thermally emissive portion formed into two halves (40a, 40b) coiled in opposite directions substantially along the entire length thereof and formed in the shape of a generally closed loop, wherein coils of said thermally emissive portion (40) establish closed loop magnetic field lines (B) therein when electrical current flows through said thermally emissive portion, and wherein said closed loop magnetic field lines (B) confine electrons (E) emitted from the surface of said thermally emissive portion (40) within the confines of said coils.
  • 2. The ion source (10) of claim 1, wherein said legs (20a, 20b) are constructed from tantalum (Ta) and said thermally emissive portion (40) is constructed of tungsten.
  • 3. The ion source (10) of claim 1, wherein said thermally emissive portion (40) is constructed of a plurality of filament strands (42, 44, 46) twisted together along substantially the entire length thereof.
  • 4. The ion source (10) of claim 1, wherein said thermally emissive portion (40) is toroidal in shape.
  • 5. A plasma shower (30) for an ion implanter, comprising:(i) an arc chamber (32) formed by walls (33); (ii) an inlet (34) for introducing an ionizable gas into said arc chamber; (iii) an exit aperture (38) from which an ionized plasma may be extracted; and (iv) a filament (18) having first and second legs (20a, 20b) and a thermally emissive central portion (40) having ends connected, respectively, to said first and second legs, said thermally emissive portion formed into two halves (40a, 40b) coiled in opposite directions substantially along the entire length thereof and formed in the shape of a generally closed loop, wherein coils of said thermally emissive portion (40) establish closed loop magnetic field lines (B) therein when electrical current flows through said thermally emissive portion, and wherein said closed loop magnetic field lines (B) confine electrons (E) emitted from the surface of said thermally emissive portion (40) within the confines of said coils.
  • 6. The plasma shower (30) of claim 5, wherein said legs (20a, 20b) are constructed from tantalum (Ta) and said thermally emissive portion (40) is constructed of tungsten (W).
  • 7. The plasma shower (30) of claim 5, wherein said thermally emissive portion (40) is constructed of a plurality of filament strands (42, 44, 46) twisted together along substantially the entire length thereof.
  • 8. The plasma shower (30) of claim 5, wherein said thermally emissive portion (40) is toroidal in shape.
US Referenced Citations (9)
Number Name Date Kind
4804837 Farley Feb 1989
4882520 Tsunekawa et al. Nov 1989
4918354 Johnson, Jr. Apr 1990
4935662 Kachenmeister, Jr. Jun 1990
5497006 Sferlazzo et al. Mar 1996
5554852 Bright et al. Sep 1996
5680003 Hartwick et al. Oct 1997
5808308 Holkeboer Sep 1998
5856674 Kellerman Jan 1999