This relates generally to conductive traces and more particularly to improved routing of conductive traces in a border area of a device.
Many types of devices are presently available for performing operations in a computing system, such as displays, touch sensor panels, and touch screens. Displays can display graphics and/or text information to a user. Touch sensor panels can sense an object, e.g., the user's hand, touching or hovering over the panel, causing the computing system to perform some operation based on the touch or hover. Touch screens can include both a display and a touch sensor panel and can allow a user to perform various functions by touching or hovering over the touch sensor panel at a location dictated by a user interface (UI) being displayed by the display, causing the computing system to perform some operation based on the touch or hover and in accordance with the graphics and/or text information appearing at the time of the touch or hover.
Portable computing systems are becoming increasingly popular because of their ease and versatility of operation, mobility, and declining price. As such, it is desirable to produce a smaller, thinner system, while maintaining easy and versatile operation.
This relates to border routing of conductive traces in devices, such as displays, touch sensor panels, and touch screens, to improve border area space usage, thereby reducing device size, and to reduce trace resistance, thereby improving device operation. The conductive traces can form a staggered stair-step configuration in which the average widths of the traces can be different from each other and each trace can have segments with different widths. The conductive traces can be coupled to an active area of the device to transmit signals to and from the active area in accordance with an operation of the device. The varying widths can help improve the border area space usage, reduce trace resistance, and reduce the differences in resistance between traces. This border routing can advantageously provide smaller border areas and improved device performance.
In the following description of example embodiments, reference is made to the accompanying drawings in which it is shown by way of illustration specific embodiments that can be practiced. It is to be understood that other embodiments can be used and structural changes can be made without departing from the scope of the various embodiments.
This relates to border routing of conductive traces in devices, such as displays, touch sensor panels, and touch screens, to optimize or otherwise improve border area space usage, thereby reducing device size, and to minimize or otherwise reduce trace resistance, thereby improving device operation. The conductive traces can form a staggered stair-step configuration in which the average widths of the traces can be different from each other and each trace can have segments with different widths. The conductive traces can be coupled to an active area of the device to transmit signals to and from the active area in accordance with a device operation. The varying widths can help optimize or improve the border area space usage, minimize or reduce trace resistance, and minimize or reduce the differences in resistance between traces. This border routing can advantageously provide smaller border areas and improved device performance.
Trace resistance can be a function of trace width. Generally, the wider the conductive trace, the lower the resistance. In this example, each trace can be formed to have segments with various widths to reduce the trace's resistance. Trace resistance can also be a function of trace length. Generally, the longer the conductive trace, the higher the resistance. In this example, conductive traces 102-a, 102-f are the longest traces, conductive traces 102-e, 102-j are the shortest traces, and the other conductive traces have lengths therebetween. Since different trace lengths can result in different resistances and hence different transmission rates (among other undesirable conditions), the widths of the conductive traces 102 can be formed to substantially reduce or eliminate the differences in resistance between the traces. In this example, the segment widths in each trace can be formed to be different from the segment widths in another trace based on how much resistance difference needs to be reduced or eliminated. The trace widths can also be formed to make optimal use of the width of the border area 120 in accordance with the number of traces present at any location along the length of the border area. Accordingly, the trace widths can be formed to reduce the trace's resistance, minimize resistance differences between traces, and optimize border area space for the traces and any other electrical requirements.
As such, looking at the right-side border area 120, at location A where only one conductive trace 102-a is present, the trace width can be formed to essentially fill the border area space and reduce the trace's resistance. At location B, two conductive traces 102-a, 102-b are present, so the widths of the two traces can be formed to optimize border area space between the two traces while reducing each trace's resistance and resistance differences between the traces. At location C, three conductive traces 102-a, 102-b, 102-c are present, so the widths of the three traces can be formed to optimize border area space between the three traces and to reduce each trace's resistance and resistance differences between the traces. At location D where four conductive traces 102-a, 102-b, 102-c, 102-d are present, the trace widths can be formed to optimize border area space between the four traces and to reduce each trace's resistance and resistance differences between the traces. At location E, all five conductive traces 102-a, 102-b, 102-c, 102-d, 102-e are present, so the widths can be formed to optimize border area space between the five traces and to reduce each trace's resistance and resistance differences between the traces. The result can be a staggered stair-step configuration of the conductive traces 102.
In this stair-step configuration example of
Moreover, in this stair-step configuration example of
As a result, in some embodiments, the average widths (i.e., the average of the segment widths) of each trace 102 on one side of the border area 120 can be different. Whereas, each pair of conductive traces 102 coupled to the same location on opposite sides of active area 110 can have the same or similar average width. Additionally, each pair can have the same or similar corresponding individual segment widths.
For the conductive traces that span multiple locations, e.g., traces 102-a, 102-b, 102-c, 102-d, 102-f, 102-g, 102-h, 102-i, the widths of the trace segments at all the other locations can be taken into account when setting a segment width at a particular location to ensure that the trace's resistance is reduced to an optimal or preferable level. For example, conductive trace 102-a spans all five locations A through E. As such, to ensure that the trace's resistance is reduced to an optimal or preferable level, when determining the segment width at location E, the previously determined segment widths at locations A through D can be used to assess what segment width at location E would result in the optimal or preferred resistance.
Determining appropriate trace segment widths to be formed at each location can be an iterative process, particularly when there are multiple electrical requirements to be met, e.g., to minimize a trace's resistance, while minimizing resistance differences between traces, while optimizing border area space. As such, there can be tradeoffs between how low the trace resistance can be, how many of the traces can have matching or near matching resistances, and how little of the border area space can be used. Ideally, a goal can be to find the maximum resistance among the traces within the width constraints of the border area and then determine widths of the other traces to be at or below that resistance within the width constraints of the border area. In some embodiments, an optimization algorithm can be used to balance these (and any other) electrical requirements and calculate optimal or preferable segment widths for each trace at each location. These calculated trace segment widths can then be formed in the border areas of the device.
Optimizing the border area space does not necessarily require that all the border area be filled by the trace widths. Rather, in some embodiments, trace widths can be narrower than the border area optimum so as to avoid parasitic coupling with proximate components in the active area. Or in some embodiments, larger spacing between the active area and the traces can be made to avoid the parasitic coupling.
In this example of
Also, each active area location has a conductive trace coupled thereto. However, it is to be understood that other coupling are also possible. For example, the conductive traces 102 can be interleaved on both sides of the active area 110, such that some conductive traces 102 can couple at locations A, C, and E in the border area 120 on one side of the active area 110 and other conductive traces can couple at locations B and D in the border area on the other side of the active area. That way, more border space can be available for widening the traces. The interleaved conductive traces 102 on both sides can have the stair-step configuration and can form widths to reduce trace resistance and to optimize border area space, as previously described.
In the example of
In some embodiments, the touch sensor panel 400 can be disposed on a display to form a touch screen. The panel 400 can have similar border routing of the stimulation lines 402 to drive the panel. In addition to reducing capacitance and resistance, this border routing can also substantially reduce or eliminate crosstalk caused by the display in sensed touch or hover signals.
In the example of
In the example of
In the example of
It is to be understood that border routing is not limited to the devices of
As described previously, trace resistance can be a function of trace length, where the longer the trace, the higher the resistance. In
The mobile telephone, media player, and personal computer of
Although embodiments have been fully described with reference to the accompanying drawings, it is to be noted that various changes and modifications will become apparent to those skilled in the art. Such changes and modifications are to be understood as being included within the scope of the various embodiments as defined by the appended claims.
This application claims benefit of U.S. Provisional Application No. 61/393,818, filed Oct. 15, 2010, the entire contents of which are incorporated by reference herein
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