Number | Name | Date | Kind |
---|---|---|---|
4428060 | Blum | Jan 1984 | |
4503537 | McAnney | Mar 1985 | |
4519078 | Komonytsky | May 1985 | |
4575674 | Bass et al. | Mar 1986 |
Entry |
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E. J. McCluskey; "A Survey of Design for Testability Scan Techniques"; VLSI Design; Dec. 1984; pp. 36-61. |