Charoen et al., Adaptive Enhancement of Timing Accuracy and Waveform Quality in High-Performance IC Testers, 1992, IEEE vol. 39, No. 2, p. 139-151.* |
Dahlberg, B., Increasing Test Accuracy by Varying Driver Slew Rate, 1991, IEEE, p. 44-48.* |
Alcorn, B., Writing Correct and Usable Specifications for Board Test: A Case study, 1989, IEEE, p. 773-786.* |
SEMI draft document #2928, Specification for overall digital timing accuracy, section 7.1 (SEMI G79-0200 Specification for Overall Digital Timing Accuracy, Semiconductor Equipment & Materials International, Mountain View, California, §7.1 (5 pages). |