Tester hardware

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CPC
G01R31/319

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/319Tester hardware

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detection of counterfeit parts, compromise...
- Patent number 12,366,604
- Issue date Jul 22, 2025
- Palitronica Inc.
- Carlos Moreno
- G01 - MEASURING TESTING
Information Patent Grant
Fault detection circuit
- Patent number 12,366,607
- Issue date Jul 22, 2025
- Texas Instruments Incorporated
- Weibing Jing
- G01 - MEASURING TESTING
Information Patent Grant
Method for semiconductor device interface circuitry functionality a...
- Patent number 12,360,162
- Issue date Jul 15, 2025
- Celerint, LLC
- Howard H. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Functional circuit block harvesting in computer systems
- Patent number 12,361,191
- Issue date Jul 15, 2025
- Apple Inc.
- Peter A. Lisherness
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pluggable load module to test a voltage regulator
- Patent number 12,345,775
- Issue date Jul 1, 2025
- LOGIICDEV GMBH
- Deepak V Katkoria
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 12,345,756
- Issue date Jul 1, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Determination device, test system, and generation device
- Patent number 12,345,765
- Issue date Jul 1, 2025
- Kioxia Corporation
- Mikio Shiraishi
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
- Patent number 12,345,762
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in testing in modular system-on-chip device
- Patent number 12,332,310
- Issue date Jun 17, 2025
- MARVELL ASIA PTE. LTD.
- Xiongzhi Ning
- G01 - MEASURING TESTING
Information Patent Grant
Transmitter for ultra-high speed and storage device including the same
- Patent number 12,332,307
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Ikjin Jo
- G01 - MEASURING TESTING
Information Patent Grant
Operating and testing semiconductor devices
- Patent number 12,334,170
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Taewook Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing device and testing method thereof
- Patent number 12,332,300
- Issue date Jun 17, 2025
- Winbond Electronics Corp.
- Kuan-Cheng Chang
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,332,305
- Issue date Jun 17, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 12,326,472
- Issue date Jun 10, 2025
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Software and firmware support for device interface board configured...
- Patent number 12,320,851
- Issue date Jun 3, 2025
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High throughput sort
- Patent number 12,320,845
- Issue date Jun 3, 2025
- Infineon Technologies AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Grant
Processor debugging over an interconnect fabric
- Patent number 12,320,843
- Issue date Jun 3, 2025
- International Business Machines Corporation
- Michael James Becht
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automatic time domain reflectometer measure...
- Patent number 12,320,853
- Issue date Jun 3, 2025
- Advantest Corporation
- Siegfried Podolski
- G01 - MEASURING TESTING
Information Patent Grant
Passive carrier-based device delivery for slot-based high-volume se...
- Patent number 12,320,852
- Issue date Jun 3, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Controlling storage of test data based on prior test program execution
- Patent number 12,313,683
- Issue date May 27, 2025
- Teradyne, Inc.
- Katherine R. Jong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test load circuit
- Patent number 12,313,696
- Issue date May 27, 2025
- Quanta Computer Inc.
- Kuo-Chan Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,315,585
- Issue date May 27, 2025
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-testing circuits for devices having multiple input channels wi...
- Patent number 12,306,242
- Issue date May 20, 2025
- STMicroelectronics S.r.l.
- Nicola Errico
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit, an apparatus for testing an integrated circuit,...
- Patent number 12,306,250
- Issue date May 20, 2025
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Grant
Memory repair system and method
- Patent number 12,300,337
- Issue date May 13, 2025
- QUALCOMM Incorporated
- Hong Dai
- G11 - INFORMATION STORAGE
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error rate measurement apparatus and error rate measurement method
- Patent number 12,265,120
- Issue date Apr 1, 2025
- Anritsu Corporation
- Hiroyuki Onuma
- G01 - MEASURING TESTING
Information Patent Grant
Universal test chiplet
- Patent number 12,265,123
- Issue date Apr 1, 2025
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Test time reduction in circuits with redundancy flip-flops
- Patent number 12,265,124
- Issue date Apr 1, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
System and method for separation and classification of signals usin...
- Patent number 12,265,125
- Issue date Apr 1, 2025
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE CAPABLE OF SHARING A MEMORY AND METHOD FOR OPERAT...
- Publication number 20250231237
- Publication date Jul 17, 2025
- REALTEK SEMICONDUCTOR CORPORATION
- JIA LIN MEI
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE
- Publication number 20250231236
- Publication date Jul 17, 2025
- Ampere Computing LLC
- Sandeep BRAHMADATHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CUSTOM WRAPPER CELL FOR HARDWARE TESTING
- Publication number 20250224446
- Publication date Jul 10, 2025
- Google LLC
- Wilson Pradeep
- G01 - MEASURING TESTING
Information Patent Application
Chip Self-Repair for Interconnect Short Faults
- Publication number 20250216456
- Publication date Jul 3, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal R. Patel
- G01 - MEASURING TESTING
Information Patent Application
Functional Circuit Block Harvesting in Integrated Circuits
- Publication number 20250217565
- Publication date Jul 3, 2025
- Apple Inc.
- Peter A. Lisherness
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System-Level Testing of a Processing Device Incorporated in a Silic...
- Publication number 20250208210
- Publication date Jun 26, 2025
- Google LLC
- Bhaskar Narayana Talatam
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING A NETWORK DIAGNOSIS PROCEDURE
- Publication number 20250199067
- Publication date Jun 19, 2025
- NXP B.V.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CALIBRATION METHOD AND AUTOMATIC CALIBRATION EQUIPMENT FO...
- Publication number 20250180687
- Publication date Jun 5, 2025
- United Microelectronics Corp.
- Zheng-Yang LI
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE VOLTAGE DETECTOR AND SYSTEM FOR WARNING OF VOLTAGE HAZARDS
- Publication number 20250180610
- Publication date Jun 5, 2025
- DEHN SE
- Michael Stehle
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE AND ADAPTIVE INFIELD TESTING BASED ON SILICON HEALTH INF...
- Publication number 20250172611
- Publication date May 29, 2025
- Intel Corporation
- Rakesh Kandula
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...
- Publication number 20250172612
- Publication date May 29, 2025
- Advantest Corporation
- José MOREIRA
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...
- Publication number 20250172613
- Publication date May 29, 2025
- Advantest Corporation
- José MOREIRA
- G01 - MEASURING TESTING
Information Patent Application
DATA SIMULATION APPARATUS AND DATA SIMULATION METHOD
- Publication number 20250164555
- Publication date May 22, 2025
- Institute of Semiconductors, Chinese Academy of Sciences
- Runjiang DOU
- G01 - MEASURING TESTING
Information Patent Application
PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR
- Publication number 20250164575
- Publication date May 22, 2025
- LOGIICDEV GMBH
- Deepak V KATKORIA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR REMOVING FIXTURE EFFECT
- Publication number 20250155504
- Publication date May 15, 2025
- National Central University
- Jim-Wei WU
- G01 - MEASURING TESTING
Information Patent Application
FORCED EARLY FAILURE FOR MEMORY DEVICE
- Publication number 20250155493
- Publication date May 15, 2025
- SMART Modular Technologies, Inc.
- Fong-Long Lin
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...
- Publication number 20250149107
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Sehoon Park
- G11 - INFORMATION STORAGE
Information Patent Application
POWER VECTOR ANALYZER
- Publication number 20250130279
- Publication date Apr 24, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...
- Publication number 20250110175
- Publication date Apr 3, 2025
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION CIRCUIT
- Publication number 20250110176
- Publication date Apr 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Weibing Jing
- G01 - MEASURING TESTING
Information Patent Application
TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN
- Publication number 20250102570
- Publication date Mar 27, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDE...
- Publication number 20250102573
- Publication date Mar 27, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING
- Publication number 20250102562
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Jess Gillespie
- G01 - MEASURING TESTING
Information Patent Application
TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS
- Publication number 20250102574
- Publication date Mar 27, 2025
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20250093415
- Publication date Mar 20, 2025
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085337
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM
- Publication number 20250085348
- Publication date Mar 13, 2025
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085338
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST SYSTEM AND METHOD THEREOF
- Publication number 20250085347
- Publication date Mar 13, 2025
- WISTRON NEWEB CORPORATION
- Fang-Ching CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED HARDWARE-IN-THE-LOOP (HIL) SYSTEM FOR TESTING HARDWARE D...
- Publication number 20250085349
- Publication date Mar 13, 2025
- L&T TECHNOLOGY SERVICES LIMITED
- AYYAMPERUMAL NARAYANASAMY
- G01 - MEASURING TESTING

Tester hardware

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for detection of counterfeit parts, compromise...

Fault detection circuit

Method for semiconductor device interface circuitry functionality a...

Functional circuit block harvesting in computer systems

Pluggable load module to test a voltage regulator

Integrated test cell using active thermal interposer (ATI) with par...

Determination device, test system, and generation device

Built-in self-test circuit and temperature measurement circuit incl...

Built-in testing in modular system-on-chip device

Transmitter for ultra-high speed and storage device including the same

Operating and testing semiconductor devices

Testing device and testing method thereof

Circuit and method to measure simulation to silicon timing correlation

System for testing an integrated circuit of a device and its method...

Software and firmware support for device interface board configured...

High throughput sort

Processor debugging over an interconnect fabric

Systems and methods for automatic time domain reflectometer measure...

Passive carrier-based device delivery for slot-based high-volume se...

Controlling storage of test data based on prior test program execution

Test load circuit

Automated test equipment comprising a plurality of communication in...

Self-testing circuits for devices having multiple input channels wi...

Integrated circuit, an apparatus for testing an integrated circuit,...

Memory repair system and method

Component die validation built-in self-test (VBIST) engine

Error rate measurement apparatus and error rate measurement method

Universal test chiplet

Test time reduction in circuits with redundancy flip-flops

System and method for separation and classification of signals usin...

Patents Applicationslast 30 patents

ELECTRONIC DEVICE CAPABLE OF SHARING A MEMORY AND METHOD FOR OPERAT...

COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE

CUSTOM WRAPPER CELL FOR HARDWARE TESTING

Chip Self-Repair for Interconnect Short Faults

Functional Circuit Block Harvesting in Integrated Circuits

System-Level Testing of a Processing Device Incorporated in a Silic...

APPARATUS AND METHOD FOR PERFORMING A NETWORK DIAGNOSIS PROCEDURE

AUTOMATIC CALIBRATION METHOD AND AUTOMATIC CALIBRATION EQUIPMENT FO...

PORTABLE VOLTAGE DETECTOR AND SYSTEM FOR WARNING OF VOLTAGE HAZARDS

PREDICTIVE AND ADAPTIVE INFIELD TESTING BASED ON SILICON HEALTH INF...

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...

TEST ARRANGEMENT FOR OVER-THE-AIR TESTING AN ANGLED DEVICE UNDER TE...

DATA SIMULATION APPARATUS AND DATA SIMULATION METHOD

PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR

APPARATUS AND METHOD FOR REMOVING FIXTURE EFFECT

FORCED EARLY FAILURE FOR MEMORY DEVICE

TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...

POWER VECTOR ANALYZER

METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...

FAULT DETECTION CIRCUIT

TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN

SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDE...

MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING

TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

AUTOMATED TEST SYSTEM AND METHOD THEREOF

INTEGRATED HARDWARE-IN-THE-LOOP (HIL) SYSTEM FOR TESTING HARDWARE D...