Tester hardware

Industry

CPC
G01R31/319

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/319Tester hardware

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Output voltage glitch reduction in test systems
- Patent number 12,216,164
- Issue date Feb 4, 2025
- Analog Devices, Inc.
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of testing devices using CXL for increased para...
- Patent number 12,216,163
- Issue date Feb 4, 2025
- Advantest Corporation
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,216,159
- Issue date Feb 4, 2025
- MediaTek Singapore Pte Ltd.
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for parallel testing of electronic device
- Patent number 12,203,982
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Grant
Random function selection and insertion during compilation for post...
- Patent number 12,203,986
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Electronic instrument for analyzing a DUT
- Patent number 12,196,809
- Issue date Jan 14, 2025
- Rohde & Schwarz GmbH & Co. KG
- Mathias Hellwig
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Device under test simulation equipment
- Patent number 12,174,244
- Issue date Dec 24, 2024
- Teradyne (Asia) Pte. Ltd.
- Min Nie
- G01 - MEASURING TESTING
Information Patent Grant
Bias generator testing using grouped bias currents
- Patent number 12,174,253
- Issue date Dec 24, 2024
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING
Information Patent Grant
Delay measurement system and measurement method
- Patent number 12,169,222
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shang Hsien Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,165,728
- Issue date Dec 10, 2024
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring circuit, integrated circuit including the same, and oper...
- Patent number 12,158,501
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Yongwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Bit error ratio estimation using machine learning
- Patent number 12,146,914
- Issue date Nov 19, 2024
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement system for identifying aggressor signals
- Patent number 12,140,631
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of finding optimized analog measurement hardware settings as...
- Patent number 12,140,630
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Darren Tipton
- G01 - MEASURING TESTING
Information Patent Grant
Device under test synchronization with automated test equipment che...
- Patent number 12,140,632
- Issue date Nov 12, 2024
- Synopsys, Inc.
- Yongkang Hu
- G01 - MEASURING TESTING
Information Patent Grant
Telephone connector to audio connector mapping and leveling device
- Patent number 12,140,633
- Issue date Nov 12, 2024
- Tony Dux
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Tester channel multiplexing in test equipment
- Patent number 12,136,958
- Issue date Nov 5, 2024
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test interface circuit
- Patent number 12,130,331
- Issue date Oct 29, 2024
- NANYA TECHNOLOGY CORPORATION
- Che-Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with timing correction circuitry
- Patent number 12,123,911
- Issue date Oct 22, 2024
- NXP USA, INC.
- Shilpa Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Virtual machine testing of electrical machines using physical domai...
- Patent number 12,117,482
- Issue date Oct 15, 2024
- Vestas Wind Systems A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automatic time domain reflectometer measure...
- Patent number 12,117,491
- Issue date Oct 15, 2024
- Advantest Corporation
- Siegfried Podolski
- G01 - MEASURING TESTING
Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer-level multi-device tester and system including the same preli...
- Patent number 12,105,146
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for transferring data from one clock domain to another
- Patent number 12,092,688
- Issue date Sep 17, 2024
- Advantest Corporation
- Andreas Beermann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Cyclic loop image representation for waveform data
- Patent number 12,092,692
- Issue date Sep 17, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST
- Publication number 20250027986
- Publication date Jan 23, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Thorsten LUECK
- G01 - MEASURING TESTING
Information Patent Application
TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT
- Publication number 20250023646
- Publication date Jan 16, 2025
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...
- Publication number 20250012858
- Publication date Jan 9, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...
- Publication number 20250004040
- Publication date Jan 2, 2025
- VESTAS WIND SYSTEMS A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Application
GENERATING A TEST PROGRAM
- Publication number 20240426906
- Publication date Dec 26, 2024
- Teradyne, Inc.
- Charles J. Carline
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND
- Publication number 20240418777
- Publication date Dec 19, 2024
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...
- Publication number 20240418778
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...
- Publication number 20240418775
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...
- Publication number 20240410938
- Publication date Dec 12, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...
- Publication number 20240402251
- Publication date Dec 5, 2024
- Intel Corporation
- Aryeh FARBER
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION IN PARALLEL HARDWARE
- Publication number 20240402250
- Publication date Dec 5, 2024
- NVIDIA Corporation
- Saurabh Hukerikar
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240402243
- Publication date Dec 5, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393387
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
RANDOM FUNCTION SELECTION AND INSERTION DURING COMPILATION FOR POST...
- Publication number 20240393395
- Publication date Nov 28, 2024
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20240393388
- Publication date Nov 28, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE
- Publication number 20240377451
- Publication date Nov 14, 2024
- DENSO CORPORATION
- RYUKI TOMOHIRO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369615
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS
- Publication number 20240369632
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Kenneth M. Curewitz
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...
- Publication number 20240361386
- Publication date Oct 31, 2024
- CELERINT, LLC.
- Howard H. ROBERTS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
Segmented Boundary Scan Chain Testing
- Publication number 20240353490
- Publication date Oct 24, 2024
- Ee Mei Ooi
- G01 - MEASURING TESTING
Information Patent Application
Integrated Impedance Measurement Device and Impedance Measurement M...
- Publication number 20240345146
- Publication date Oct 17, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Haohua Zhou
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY
- Publication number 20240345163
- Publication date Oct 17, 2024
- NXP USA, Inc.
- Shilpa Gupta
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT
- Publication number 20240337694
- Publication date Oct 10, 2024
- MONTAGE TECHNOLOGY CO., LTD.
- Dongming LOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING A CONTROL DEVICE USING A TEST ASSEMBLY
- Publication number 20240337695
- Publication date Oct 10, 2024
- dSPACE GmbH
- Remigiusz SEILER
- G01 - MEASURING TESTING
Information Patent Application
STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM
- Publication number 20240329137
- Publication date Oct 3, 2024
- International Business Machines Corporation
- Brent William YARDLEY
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM
- Publication number 20240319271
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Hideki Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING STORAGE OF TEST DATA BASED ON PRIOR TEST PROGRAM EXECUTION
- Publication number 20240319275
- Publication date Sep 26, 2024
- Teradyne, Inc.
- Katherine R. Jong
- G06 - COMPUTING CALCULATING COUNTING

Tester hardware

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Output voltage glitch reduction in test systems

On-die aging measurements for dynamic timing modeling

Systems and methods of testing devices using CXL for increased para...

Circuit and method to measure simulation to silicon timing correlation

System and method for parallel testing of electronic device

Random function selection and insertion during compilation for post...

Electronic instrument for analyzing a DUT

Method and system for controlling actions of testbench components w...

Apparatus for performing multiple tests on a device under test

Device under test simulation equipment

Bias generator testing using grouped bias currents

Delay measurement system and measurement method

Apparatus for testing electronic devices

Automated test equipment comprising a plurality of communication in...

Monitoring circuit, integrated circuit including the same, and oper...

Modular wireless communication device testing system

Bit error ratio estimation using machine learning

Measurement system for identifying aggressor signals

Method of finding optimized analog measurement hardware settings as...

Device under test synchronization with automated test equipment che...

Telephone connector to audio connector mapping and leveling device

Tester channel multiplexing in test equipment

Test interface circuit

Integrated circuit with timing correction circuitry

Virtual machine testing of electrical machines using physical domai...

Systems and methods for automatic time domain reflectometer measure...

Test devices, test systems, and operating methods of test systems

Wafer-level multi-device tester and system including the same preli...

Circuit for transferring data from one clock domain to another

Cyclic loop image representation for waveform data

Patents Applicationslast 30 patents

MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST

TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...

VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...

GENERATING A TEST PROGRAM

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...

METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD...

MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...

FAULT DETECTION IN PARALLEL HARDWARE

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

RANDOM FUNCTION SELECTION AND INSERTION DURING COMPILATION FOR POST...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS

METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY A...

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

Segmented Boundary Scan Chain Testing

Integrated Impedance Measurement Device and Impedance Measurement M...

INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY

TEST CIRCUIT AND TEST APPARATUS COMPRISING THE TEST CIRCUIT

TESTING A CONTROL DEVICE USING A TEST ASSEMBLY

STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM

CONTROLLING STORAGE OF TEST DATA BASED ON PRIOR TEST PROGRAM EXECUTION