The present disclosure is generally related to an inductor having a thickness that varies.
Advances in technology have resulted in smaller and more powerful computing devices. For example, there currently exist a variety of portable personal computing devices, including wireless computing devices, such as portable wireless telephones, personal digital assistants (PDAs), and paging devices that are small, lightweight, and easily carried by users. More specifically, portable wireless telephones, such as cellular telephones and internet protocol (IP) telephones, can communicate voice and data packets over wireless networks. Further, many such wireless telephones include other types of devices that are incorporated therein. For example, a wireless telephone can also include a digital still camera, a digital video camera, a digital recorder, and an audio file player. Also, such wireless telephones can process executable instructions, including software applications, such as a web browser application, that can be used to access the Internet. As such, these wireless telephones can include significant computing capabilities.
Inductors are used in power regulation, frequency control and signal conditioning applications in many electronic devices (e.g., personal computers, tablet computers, wireless mobile handsets, and wireless telephones). An inductor with a higher electrical resistance may consume more power than an inductor with a lower electrical resistance. A spiral inductor may contribute a particular electrical resistance (e.g., a resistance associated with an eddy current loss) to an electrical system powered by an alternating current. The eddy current loss may be related to a quantity or a volume of conductive material present in an innermost turn of the spiral inductor. A trace width associated with the spiral inductor may be decreased to reduce the eddy current loss. However, process technology used to fabricate the spiral inductor may be unable to produce an inductor with a trace width smaller than a particular width.
This disclosure presents embodiments of an inductor having a thickness that varies. The inductor may be a stepped layer stack spiral inductor or a gradient layer stack spiral inductor. For example, the inductor may be coupled to a substrate and a portion of an outermost turn of the inductor may be thicker than a portion of an innermost turn of the inductor. In the example, the thickness of the inductor may monotonically increase (e.g., consistently increasing without substantially decreasing) from the innermost turn of the inductor to the outermost turn of the inductor. The inductor may be configured to provide a similar inductance value as compared to a conventional spiral inductor of similar size (e.g., a spiral inductor having a uniform thickness). The reduced thickness of the innermost turn may cause the inductor to have a lower radio frequency (RF) resistance than the conventional spiral inductor due to reduced eddy current loss. An electronic device may use the inductor to provide inductance using less power, as compared to an electronic device that includes the conventional spiral inductor.
In a particular embodiment, an apparatus includes a substrate and a spiral inductor coupled to the substrate. The spiral inductor includes a first conductive spiral and a second conductive spiral overlaying the first conductive spiral. A first portion of an innermost turn of the spiral inductor has a first thickness in a direction perpendicular to the substrate. The first portion of the innermost turn includes a first portion of the first conductive spiral and does not include the second conductive spiral. A second portion of the innermost turn includes a first portion of the second conductive spiral. A portion of an outermost turn of the spiral inductor has a second thickness, in the direction perpendicular to the substrate, that is greater than the first thickness. A portion of the outermost turn includes a second portion of the first conductive spiral and a second portion of the second conductive spiral.
In another particular embodiment, a method includes forming a first conductive spiral of a spiral inductor coupled to a substrate. The method further includes forming a second conductive spiral of the spiral inductor that overlays the first conductive spiral. A first portion of an innermost turn of the spiral inductor has a first thickness in a direction perpendicular to the substrate. The first portion of the innermost turn includes a first portion of the first conductive spiral and does not include the second conductive spiral. A second portion of the innermost turn includes a first portion of the second conductive spiral. A portion of an outermost turn of the spiral inductor has a second thickness in the direction perpendicular to the substrate. The second thickness is greater than the first thickness. The portion of the outermost turn includes a second portion of the first conductive spiral and a second portion of the second conductive spiral.
In another particular embodiment, an apparatus includes a substrate and a spiral inductor coupled to the substrate. A first portion of an innermost turn of the spiral inductor has a first thickness in a direction perpendicular to the substrate. A second portion of the innermost turn of the spiral inductor has a second thickness in the direction perpendicular to the substrate. The second thickness is greater than the first thickness. A thickness of the spiral inductor in the direction perpendicular to the substrate increases according to a gradient from the first thickness to the second thickness.
In another particular embodiment, a method includes forming a conductive spiral of a spiral inductor coupled to a substrate. The method further includes forming a conductive layer of the spiral inductor above the conductive spiral. A first portion of an innermost turn of the spiral inductor has a first thickness in a direction perpendicular to the substrate. A second portion of the innermost turn has a second thickness in the direction perpendicular to the substrate. The second thickness is greater than the first thickness. A thickness of the spiral inductor in the direction perpendicular to the substrate increases according to a gradient from the first thickness to the second thickness.
One particular advantage provided by at least one of the disclosed embodiments is that a spiral inductor having a varying thickness provides a similar inductance as compared to a uniform thickness spiral inductor of similar dimensions. However, a reduced thickness of an innermost turn of the spiral inductor causes the inductor to have a lower electrical resistance due to a reduced eddy current loss. Thus, an electronic device may use the inductor having the varying thickness to provide inductance using less power, as compared to an electronic device that includes the uniform thickness spiral inductor.
Other aspects, advantages, and features of the present disclosure will become apparent after review of the entire application, including the following sections: Brief Description of the Drawings, Detailed Description, and the Claims.
Referring to
The conductive layer 108 may form a spiral (e.g., a conductive spiral) or may form a partial spiral or a discontinuous spiral (e.g., the conductive layer 108 may form a spiral shape, but the conductive layer 108 may not be present within a particular distance from the first lead 116 and from the second lead 118). A spiral may include a plurality of turns, where each beginning point of each turn has a different radius from a center point of the spiral.
The spiral inductor 104 includes a first portion 120 having a first thickness in a direction perpendicular to the substrate 102, a second portion 122 having a second thickness in the direction perpendicular to the substrate 102, a third portion 126 having a third thickness in the direction perpendicular to the substrate 102, and a fourth portion 124 having a fourth thickness in the direction perpendicular to the substrate 102. The fourth thickness may be greater than the third thickness (not shown), the third thickness may be greater than the second thickness, and the second thickness may be greater than the first thickness. The first portion 120, the second portion 122, and the third portion 126 may be part of an innermost turn of the spiral inductor 104 and the fourth portion 124 may be part of an outermost turn of the spiral inductor 104. In a particular embodiment, the first portion 120 includes a first portion of the second conductive spiral 110. The second portion 122 may include a first portion of the conductive layer 108 and a second portion of the second conductive spiral 110. The third portion 126 may include a first portion of the first conductive spiral 106, a second portion of the conductive layer 108, and a third portion of the second conductive spiral 110. The fourth portion 124 may include a second portion of the first conductive spiral 106, a third portion of the conductive layer 108, and a fourth portion of the second conductive spiral 110.
Although
The substrate 102 may be a dielectric substrate formed of a glass material, an alkaline earth boro-aluminosilicate glass, Silicon (Si), Gallium Arsenide (GaAs), Indium Phosphate (InP), Silicon Carbide (SiC), a glass-based laminate, sapphire (Al2O3), quartz, a ceramic, Silicon on Insulator (SOI), Silicon on Sapphire (SOS), high resistivity Silicon (HRS), Aluminum Nitride (AlN), a plastic, or a combination thereof. The conductive spirals 106 and 110 and the conductive layer 108 may be formed by depositing aluminum, copper, silver, gold, tungsten, molybdenum, an alloy of aluminum, silver, gold, tungsten, or molybdenum, or a combination thereof, above the substrate 102. The spiral inductor 104 may be fabricated using the same fabrication steps as an inductor having an outermost turn having a thickness that is not greater than a thickness of an innermost turn (e.g., additional deposition steps or etching steps may be unnecessary). Each passivation layer (e.g., the first passivation layer 112 and the second passivation layer 114) may be formed of a photo-definable polymer.
In a particular embodiment, the first conductive spiral 106 overlays the conductive layer 108 and the conductive layer 108 overlays the second conductive spiral 110. The first passivation layer 112 may be formed between the first conductive spiral 106 and the conductive layer 108. The second passivation layer 114 may be formed between the conductive layer 108 and the second conductive spiral 110. One or more vias may be formed in the first passivation layer 112, the second passivation layer 114, or both. The one or more vias may electrically connect the first conductive spiral 106, the conductive layer 108, and the second conductive spiral 110, or a combination thereof. The one or more vias may further electrically connect the first conductive spiral 106, the conductive layer 108, the second conductive spiral 110, or a combination thereof, to the first lead 116, to the second lead 118, or to both.
A thickness of the spiral inductor 104 in the direction perpendicular to the substrate 102 may increase monotonically from an innermost portion of the spiral inductor 104 to an outermost portion of the spiral inductor 104. In a particular embodiment, the spiral inductor 104 may be a stepped layer stack inductor where a thickness of the spiral inductor 104 in the direction perpendicular to the substrate 102 increases in a step configuration. For example, a thickness of the first conductive spiral 106, the conductive layer 108, and the second conductive spiral 110 in the direction perpendicular to the substrate 102 may be substantially constant along the length of each conductive spiral. In this example, a second length of the conductive layer 108 may be greater than a first length of the first conductive spiral 106 and a third length of the second conductive spiral 110 may be greater than a second length of the conductive layer 108. The first portion 120 may include a first portion of the second conductive spiral 110. The first conductive spiral 106 and the conductive layer 108 may not extend to the first portion 120. The second portion 122 may include a second portion of the second conductive spiral 110 and a first portion of the conductive layer 108. The first conductive spiral 106 may not extend to the second portion 122. The fourth portion 124 may include a third portion of the second conductive spiral 110, a second portion of the conductive layer 108, and a portion of the first conductive spiral 106. As another example, the first conductive spiral 106 may be formed by depositing a first conductive layer with a first length and by depositing a second conductive layer with a second length directly above (e.g., with no intervening passivation layer) the first conductive layer. The first conductive layer and the second conductive layer may have different lengths.
When a current is applied to the first lead 116 or the second lead 118, a magnetic field is generated by the spiral inductor 104. An eddy current loss associated with the outermost turn of the spiral inductor 104 may be reduced, as compared to a uniform thickness spiral inductor, because the outermost turn of the spiral inductor 104 has a greater thickness than the innermost turn of the spiral inductor (i.e., because a conductive volume of the innermost turn of the spiral inductor 104 is smaller than a conductive volume of an innermost turn of the uniform thickness spiral inductor). Thus, a radio frequency (RF) resistance associated with the spiral inductor 104 may be reduced because eddy current loss contributes to RF resistance.
Although
An electronic device that includes a varying thickness spiral inductor (e.g., the spiral inductor 104) may provide a similar inductance as compared to a uniform thickness spiral inductor of similar dimensions. However, a reduced thickness of an innermost turn of the varying thickness spiral inductor causes the varying thickness inductor to have a lower electrical resistance to an alternating current due to reduced eddy current loss. Thus, an electronic device may use the varying thickness inductor to provide inductance using less RF power, as compared to an electronic device that includes the uniform thickness spiral inductor.
Referring to
A thickness of the spiral inductor 204 in the direction perpendicular to the substrate 202 may increase monotonically from an innermost portion of the spiral inductor 204 to an outermost portion of the spiral inductor 204. In a particular embodiment, the spiral inductor 204 may be a gradient layer stack inductor where a thickness in the direction perpendicular to the substrate 202 increases from one point along an innermost turn to another point along the innermost turn. The thickness of a first portion of an innermost turn of the spiral inductor 204 may be greater than a thickness of a second portion of the innermost turn. For example, a particular portion of the conductive layer 208 corresponding to a portion 222 of the innermost turn of the spiral inductor 204 may have a gradient thickness (e.g., a thickness that varies proportionately to an incline along a portion 222 of the innermost turn of the spiral inductor 204) in the direction perpendicular to the substrate 202. A portion of the conductive layer 208 corresponding to the portion 222 may have a thickness in the direction perpendicular to the substrate 202 that increases from a first point 214 to a second point 212. A portion of the conductive layer 208 corresponding to the second point 212 may have a thickness in the direction perpendicular to the substrate 202 that is greater than a thickness of the first point 214. The first conductive spiral 106, the conductive layer 208, the second conductive spiral 110, or a combination thereof, may have a substantially constant thickness or may have a gradient thickness.
An electronic device that includes a varying thickness spiral inductor (e.g., the spiral inductor 204) may provide a similar inductance as compared to a uniform thickness spiral inductor of similar dimensions. However, a reduced thickness of an innermost turn of the varying thickness spiral inductor causes the varying thickness spiral inductor to have a lower electrical resistance due to reduced eddy current loss. Thus, an electronic device may use the varying thickness spiral inductor to provide inductance using less power, as compared to an electronic device that includes the uniform thickness spiral inductor.
Referring to
The method of
An electronic device formed according to the method 400 may include a varying thickness spiral inductor that provides a similar inductance as compared to a uniform thickness spiral inductor of similar dimensions. However, a reduced thickness of an innermost turn of the varying thickness spiral inductor causes the varying thickness inductor to have a lower electrical resistance due to reduced eddy current loss. Thus, an electronic device may use the varying thickness inductor to provide inductance using less power, as compared to an electronic device that includes the uniform thickness spiral inductor.
The method of
An electronic device formed according to the method 500 may include a varying thickness spiral inductor that provides a similar inductance as compared to a uniform thickness spiral inductor of similar dimensions. However, a reduced thickness of an innermost turn of the varying thickness spiral inductor causes the varying thickness inductor to have a lower electrical resistance due to reduced eddy current loss. Thus, an electronic device may use the varying thickness inductor to provide inductance using less power, as compared to an electronic device that includes the uniform thickness spiral inductor.
Referring to
The mobile device 600 may include a processor 612, such as a digital signal processor (DSP). The processor 612 may be coupled to a memory 632 (e.g., a non-transitory computer-readable medium).
In a particular embodiment, the spiral inductor 604 is coupled to (e.g., deposited above) the substrate 602. The spiral inductor 604 may include a first conductive spiral and a second conductive spiral overlaying the first conductive spiral. A first portion of an innermost turn of the spiral inductor 604 may have a first thickness in a direction perpendicular to the substrate 602. The first portion of the innermost turn may include a first portion of the first conductive spiral (and not include the second conductive spiral). A second portion of the innermost turn may include a first portion of the second conductive spiral. A portion of an outermost turn of the spiral inductor 604 may have a second thickness in the direction perpendicular to the substrate that is greater than the first thickness. A portion of the outermost turn may include a second portion of the first conductive spiral and a second portion of the second conductive spiral. For example, the substrate 602 may correspond to the substrate 102 of
In another particular embodiment, the spiral inductor 604 is coupled to (e.g., deposited above) the substrate 602. A first portion of an innermost turn of the spiral inductor 604 may have a first thickness in a direction perpendicular to the substrate 602. A second portion of the innermost turn of the spiral inductor 604 may have a second thickness, in the direction perpendicular to the substrate, that is greater than the first thickness. A thickness of the spiral inductor 604 in the direction perpendicular to the substrate 602 may increase according to a gradient from the first thickness to the second thickness. For example, the substrate 602 may correspond to the substrate 202 of
In a particular embodiment, the processor 612, the display controller 626, the memory 632, the CODEC 634, and the wireless controller 640 are included in a system-in-package or system-on-chip device 622. An input device 630 and a power supply 644 may be coupled to the system-on-chip device 622. Moreover, in a particular embodiment, and as illustrated in
In a particular embodiment, an apparatus (such as the mobile device 600) includes means for storing energy in a magnetic field (e.g., the spiral inductor 104 of
In another particular embodiment, an apparatus (such as the mobile device 600) includes means for storing energy in a magnetic field (e.g., the spiral inductor 204 of
The foregoing disclosed devices and functionalities may be designed and configured into computer files (e.g. RTL, GDSII, GERBER, etc.) stored on computer-readable media. Some or all such files may be provided to fabrication handlers to fabricate devices based on such files. Resulting products include wafers that are then cut into dies and packaged into chips. The chips are then employed in devices described above.
Physical device information 702 is received at the manufacturing process 700, such as at a research computer 706. The physical device information 702 may include design information representing at least one physical property of an electronic device, such as a spiral inductor (e.g., corresponding to the spiral inductor 104 of
In a particular embodiment, the library file 712 includes at least one data file including the transformed design information. For example, the library file 712 may include a library of electronic devices (e.g., semiconductor devices), including a spiral inductor (e.g., corresponding to the spiral inductor 104 of
The library file 712 may be used in conjunction with the EDA tool 720 at a design computer 714 including a processor 716, such as one or more processing cores, coupled to a memory 718. The EDA tool 720 may be stored as processor executable instructions at the memory 718 to enable a user of the design computer 714 to design a circuit including a spiral inductor (e.g., corresponding to the spiral inductor 104 of
The design computer 714 may be configured to transform the design information, including the circuit design information 722, to comply with a file format. To illustrate, the file formation may include a database binary file format representing planar geometric shapes, text labels, and other information about a circuit layout in a hierarchical format, such as a Graphic Data System (GDSII) file format. The design computer 714 may be configured to generate a data file including the transformed design information, such as a GDSII file 726 that includes information describing a spiral inductor (e.g., corresponding to the spiral inductor 104 of
The GDSII file 726 may be received at a fabrication process 728 to manufacture a spiral inductor (e.g., corresponding to the spiral inductor 104 of
In a particular embodiment, the fabrication process 728 may be initiated by or controlled by a processor 734. The processor 734 may access a memory 735 that includes executable instructions such as computer-readable instructions or processor-readable instructions. The executable instructions may include one or more instructions that are executable by a computer, such as the processor 734.
The fabrication process 728 may be implemented by a fabrication system that is fully automated or partially automated. For example, the fabrication process 728 may be automated and may perform processing steps according to a schedule. The fabrication system may include fabrication equipment (e.g., processing tools) to perform one or more operations to form an electronic device. For example, the fabrication equipment may be configured to form one or more conductive spirals, to form one or more conductive layers, to form one or more passivation layers, to form one or more conductive vias, to perform one or more etches, to form one or more metal structures, or to form other integrated circuit elements using integrated circuit manufacturing processes (e.g., wet etching, dry etching, deposition, planarization, lithography, or a combination thereof).
The fabrication system may have a distributed architecture (e.g., a hierarchy). For example, the fabrication system may include one or more processors, such as the processor 734, one or more memories, such as the memory 735, and/or controllers that are distributed according to the distributed architecture. The distributed architecture may include a high-level processor that controls or initiates operations of one or more low-level systems. For example, a high-level portion of the fabrication process 728 may include one or more processors, such as the processor 734, and the low-level systems may each include or may be controlled by one or more corresponding controllers. A particular controller of a particular low-level system may receive one or more instructions (e.g., commands) from a high-level system, may issue sub-commands to subordinate modules or process tools, and may communicate status data back to the high-level system. Each of the one or more low-level systems may be associated with one or more corresponding pieces of fabrication equipment (e.g., processing tools). In a particular embodiment, the fabrication system may include multiple processors that are distributed in the fabrication system. For example, a controller of a low-level system component of the fabrication system may include a processor, such as the processor 734.
Alternatively, the processor 734 may be a part of a high-level system, subsystem, or component of the fabrication system. In another embodiment, the processor 734 includes distributed processing at various levels and components of a fabrication system.
Thus, the memory 735 may include processor-executable instructions that, when executed by the processor 734, cause the processor 734 to initiate or control formation of a first conductive spiral of a spiral inductor coupled to a substrate. For example, a first conductive layer including the first conductive spiral may be formed by one or more deposition tools, such as a flowable chemical vapor deposition (FCVD) tool or a spin-on deposition tool. The first conductive spiral may be etched from the first conductive layer by one or more etching machines or etchers, such as a wet etcher, a dry etcher, or a plasma etcher. Execution of the processor-executable instructions may further cause the processor 734 to initiate or control formation of a second conductive spiral of the spiral inductor. For example, a second conductive layer including the second conductive spiral may be formed by one or more deposition tools, such as a flowable chemical vapor deposition (FCVD) tool or a spin-on deposition tool. The second conductive spiral may be etched from the second conductive layer by one or more etching machines or etchers, such as a wet etcher, a dry etcher, or a plasma etcher. The second conductive spiral may overlay the first conductive spiral. A first portion of an innermost turn of the spiral inductor may have a first thickness in a direction perpendicular to the substrate. The first portion of the innermost turn may include a first portion of the first conductive spiral and may not include the second conductive spiral. A second portion of the innermost turn may include a first portion of the second conductive spiral. A portion of an outermost turn of the spiral inductor may have a second thickness in the direction perpendicular to the substrate. The second thickness may be greater than the first thickness. The portion of the outermost turn may include a second portion of the first conductive spiral and a second portion of the second conductive spiral.
Further, the memory 735 may include processor-executable instructions that, when executed by the processor 734, cause the processor 734 to initiate or control formation of a conductive spiral of a spiral inductor coupled to a substrate. For example, a first conductive layer including the conductive spiral may be formed by one or more deposition tools, such as a flowable chemical vapor deposition (FCVD) tool or a spin-on deposition tool. The conductive spiral may be etched from the first conductive layer by one or more etching machines or etchers, such as a wet etcher, a dry etcher, or a plasma etcher. Execution of the processor-executable instructions may further cause the processor 734 to initiate or control formation of a conductive layer of the spiral inductor above the conductive spiral. For example, a second conductive layer including the conductive layer may be formed by one or more deposition tools, such as a flowable chemical vapor deposition (FCVD) tool or a spin-on deposition tool. The conductive layer may be etched from the second conductive layer by one or more etching machines or etchers, such as a wet etcher, a dry etcher, or a plasma etcher. A first portion of an innermost turn of the spiral inductor may have a first thickness in a direction perpendicular to the substrate. A second portion of the innermost turn may have a second thickness in the direction perpendicular to the substrate. The second thickness may be greater than the first thickness. A thickness of the spiral inductor may increase according to a gradient from the first thickness to the second thickness.
As an illustrative example, the processor 734 may control a step for forming a first conductive spiral of a spiral inductor coupled to a substrate. For example, the processor 734 may be embedded in or coupled to one or more controllers that control one or more pieces of fabrication equipment to perform the step for forming the first conductive spiral of the spiral inductor coupled to the substrate. The processor 734 may control the step for forming the first conductive spiral by controlling formation of the first conductive spiral, by controlling one or more other processes configured to form the first conductive spiral, or any combination thereof. The processor 734 may also control a step for forming a second conductive spiral of the spiral inductor. The processor 734 may control the step for forming the second conductive spiral by controlling formation of the second conductive spiral, by controlling one or more other processes configured to form the second conductive spiral, or any combination thereof. The second spiral may overlay the first conductive spiral. A first portion of an innermost turn of the spiral inductor may have a first thickness in a direction perpendicular to the substrate. The first portion of the innermost turn may include a first portion of the first conductive spiral and may not include the second conductive spiral. A second portion of the innermost turn may include a first portion of the second conductive spiral. A portion of an outermost turn of the spiral inductor may have a second thickness in the direction perpendicular to the substrate. The second thickness may be greater than the first thickness. The portion of the outermost turn may include a second portion of the first conductive spiral and a second portion of the second conductive spiral. Integrated circuit manufacturing processes may be used to fabricate the first conductive spiral and the second conductive spiral (e.g., wet etching, dry etching, deposition, planarization, lithography, or a combination thereof).
As another illustrative example, the processor 734 may control a step for forming a conductive spiral of a spiral inductor coupled to a substrate. For example, the processor 734 may be embedded in or coupled to one or more controllers that control one or more pieces of fabrication equipment to perform the step for forming the conductive spiral of the spiral inductor coupled to the substrate. The processor 734 may control the step for forming the conductive spiral by controlling formation of the conductive spiral, by controlling one or more other processes configured to form the conductive spiral, or any combination thereof. The processor 734 may also control a step for forming a conductive layer of the spiral inductor above the conductive spiral. The processor 734 may control the step for forming the conductive layer by controlling formation of the conductive layer, by controlling one or more other processes configured to form the conductive layer, or any combination thereof. A first portion of an innermost turn of the spiral inductor may have a first thickness in a direction perpendicular to the substrate. A second portion of the innermost turn may have a second thickness in the direction perpendicular to the substrate. The second thickness may be greater than the first thickness. A thickness of the spiral inductor may increase according to a gradient from the first thickness to the second thickness. Integrated circuit manufacturing processes may be used to fabricate the conductive spiral and the conductive layer (e.g., wet etching, dry etching, deposition, planarization, lithography, or a combination thereof).
The die 736 may be provided to a packaging process 738 where the die 736 is incorporated into a representative package 740. For example, the package 740 may include the single die 736 or multiple dies, such as a system-in-package (SiP) arrangement. The package 740 may be configured to conform to one or more standards or specifications, such as Joint Electron Device Engineering Council (JEDEC) standards.
Information regarding the package 740 may be distributed to various product designers, such as via a component library stored at a computer 746. The computer 746 may include a processor 748, such as one or more processing cores, coupled to a memory 750. A printed circuit board (PCB) tool may be stored as processor executable instructions at the memory 750 to process PCB design information 742 received from a user of the computer 746 via a user interface 744. The PCB design information 742 may include physical positioning information of a packaged electronic device on a circuit board, the packaged electronic device corresponding to the package 740 including a spiral inductor (e.g., corresponding to the spiral inductor 104 of
The computer 746 may be configured to transform the PCB design information 742 to generate a data file, such as a GERBER file 752 with data that includes physical positioning information of a packaged electronic device on a circuit board, as well as layout of electrical connections such as traces and vias, where the packaged electronic device corresponds to the package 740 including a spiral inductor (e.g., corresponding to the spiral inductor 104 of
The GERBER file 752 may be received at a board assembly process 754 and used to create PCBs, such as a representative PCB 756, manufactured in accordance with the design information stored within the GERBER file 752. For example, the GERBER file 752 may be uploaded to one or more machines to perform various steps of a PCB production process. The PCB 756 may be populated with electronic components including the package 740 to form a representative printed circuit assembly (PCA) 758.
The PCA 758 may be received at a product manufacturer 760 and integrated into one or more electronic devices, such as a first representative electronic device 762 and a second representative electronic device 764. As an illustrative, non-limiting example, the first representative electronic device 762, the second representative electronic device 764, or both, may be selected from a set top box, a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, and a computer, into which a spiral inductor (e.g., corresponding to the spiral inductor 104 of
A device that includes a spiral inductor (e.g., corresponding to the spiral inductor 104 of
In conjunction with the described embodiments, a non-transitory computer-readable medium stores instructions that, when executed by a processor, cause the processor to initiate formation of a first conductive spiral of a spiral inductor coupled to a substrate. The non-transitory computer readable medium may further store instructions that, when executed by the processor, cause the processor to initiate formation of a second conductive spiral of the spiral inductor. The second conductive spiral may overlay the first conductive spiral. A first portion of an innermost turn of the spiral inductor may have a first thickness in a direction perpendicular to the substrate. The first portion of the innermost turn may include a first portion of the first conductive spiral and may not include the second conductive spiral. A second portion of the innermost turn may include a first portion of the second conductive spiral. A portion of an outermost turn of the spiral inductor may have a second thickness in the direction perpendicular to the substrate. The second thickness may be greater than the first thickness. The portion of the outermost turn may include a second portion of the first conductive spiral and a second portion of the second conductive spiral. The non-transitory computer-readable medium may correspond to the memory 632 of
In conjunction with the described embodiments, a non-transitory computer-readable medium stores instructions that, when executed by a processor, cause the processor to initiate formation of a conductive spiral of a spiral inductor coupled to a substrate. The non-transitory computer readable medium may further store instructions that, when executed by the processor, cause the processor to form a conductive layer of the spiral inductor above the conductive spiral. A first portion of an innermost turn of the spiral inductor may have a first thickness in a direction perpendicular to the substrate. A second portion of the innermost turn may have a second thickness in the direction perpendicular to the substrate. The second thickness may be greater than the first thickness. A thickness of the spiral inductor may increase according to a gradient from the first thickness to the second thickness. The non-transitory computer-readable medium may correspond to the memory 710, the memory 718, or the memory 750 of
Those of skill would further appreciate that the various illustrative logical blocks, configurations, modules, circuits, and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software executed by a processor, or combinations of both. Various illustrative components, blocks, configurations, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as hardware or processor executable instructions depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present disclosure.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in memory, such as random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disk, a removable disk, a compact disc read-only memory (CD-ROM). The memory may include any form of non-transient storage medium known in the art. An exemplary storage medium (e.g., memory) is coupled to the processor such that the processor can read information from, and write information to, the storage medium. In the alternative, the storage medium may be integral to the processor. The processor and the storage medium may reside in an application-specific integrated circuit (ASIC). The ASIC may reside in a computing device or a user terminal. In the alternative, the processor and the storage medium may reside as discrete components in a computing device or user terminal.
The previous description of the disclosed embodiments is provided to enable a person skilled in the art to make or use the disclosed embodiments. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the principles defined herein may be applied to other embodiments without departing from the scope of the disclosure. Thus, the present disclosure is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope possible consistent with the principles and novel features as defined by the following claims.
The present application claims priority from and is a divisional application of U.S. Non-Provisional patent application Ser. No. 14/155,244, now U.S. Pat. No. 9,449,753, entitled “VARYING THICKNESS INDUCTOR,” filed Jan. 14, 2014, which claims priority from U.S. Provisional Patent Application No. 61/872,342, entitled “VARYING THICKNESS INDUCTOR,” filed Aug. 30, 2013, the contents of which are incorporated by reference in their entireties.
Number | Name | Date | Kind |
---|---|---|---|
3798059 | Astle et al. | Mar 1974 | A |
4815128 | Malek | Mar 1989 | A |
4816784 | Rabjohn | Mar 1989 | A |
4841253 | Crabill | Jun 1989 | A |
5015972 | Cygan et al. | May 1991 | A |
5038104 | Wikswo, Jr. et al. | Aug 1991 | A |
5095357 | Andoh et al. | Mar 1992 | A |
5111169 | Ikeda | May 1992 | A |
5161082 | Alfonso | Nov 1992 | A |
5719073 | Shaw et al. | Feb 1998 | A |
5831331 | Lee | Nov 1998 | A |
5959846 | Noguchi et al. | Sep 1999 | A |
5986617 | McLellan | Nov 1999 | A |
6025261 | Farrar et al. | Feb 2000 | A |
6169470 | Ibata et al. | Jan 2001 | B1 |
6429763 | Patel et al. | Aug 2002 | B1 |
6437965 | Adkins et al. | Aug 2002 | B1 |
6466768 | Agahi-Kesheh et al. | Oct 2002 | B1 |
6501363 | Hwu et al. | Dec 2002 | B1 |
6580350 | Kobayashi | Jun 2003 | B1 |
6603382 | Komai et al. | Aug 2003 | B1 |
6649998 | Song | Nov 2003 | B2 |
6714112 | Beng et al. | Mar 2004 | B2 |
6801114 | Yang et al. | Oct 2004 | B2 |
6816784 | Khan et al. | Nov 2004 | B1 |
6870457 | Chen et al. | Mar 2005 | B2 |
6985035 | Khorramabadi | Jan 2006 | B1 |
6990729 | Pleskach et al. | Jan 2006 | B2 |
7064411 | Hashizume et al. | Jun 2006 | B2 |
7304558 | Pleskach et al. | Dec 2007 | B1 |
7312685 | Lee | Dec 2007 | B1 |
7370403 | Hsu et al. | May 2008 | B1 |
7486168 | Kim | Feb 2009 | B2 |
7526256 | Bhatti et al. | Apr 2009 | B2 |
7570129 | Kintis et al. | Aug 2009 | B2 |
7592891 | Hsu et al. | Sep 2009 | B2 |
7616934 | MacPhail | Nov 2009 | B2 |
7619297 | Wang | Nov 2009 | B2 |
7808358 | Nakamura et al. | Oct 2010 | B2 |
7894205 | Lee et al. | Feb 2011 | B2 |
8013708 | Tsai | Sep 2011 | B2 |
8045946 | Roo et al. | Oct 2011 | B2 |
8229367 | Chan et al. | Jul 2012 | B2 |
8233870 | Walley et al. | Jul 2012 | B2 |
8339233 | Tsai et al. | Dec 2012 | B2 |
8354325 | Dao et al. | Jan 2013 | B1 |
8368481 | Jin et al. | Feb 2013 | B2 |
8493126 | Sankaranarayanan et al. | Jul 2013 | B2 |
8591262 | Schaffer et al. | Nov 2013 | B2 |
9001031 | Lo et al. | Apr 2015 | B2 |
20020057176 | Norstrom et al. | May 2002 | A1 |
20020113682 | Gevorgian et al. | Aug 2002 | A1 |
20020132383 | Hiroki et al. | Sep 2002 | A1 |
20030151485 | Lewis | Aug 2003 | A1 |
20040012474 | Hwu et al. | Jan 2004 | A1 |
20040090298 | Masu et al. | May 2004 | A1 |
20040104449 | Yoon et al. | Jun 2004 | A1 |
20040150502 | Jacobson et al. | Aug 2004 | A1 |
20040207504 | Yang et al. | Oct 2004 | A1 |
20050003199 | Takaya | Jan 2005 | A1 |
20050104158 | Bhattacharjee et al. | May 2005 | A1 |
20060017539 | Lee et al. | Jan 2006 | A1 |
20060284719 | Lee | Dec 2006 | A1 |
20070008058 | Hashimoto | Jan 2007 | A1 |
20070030116 | Feher | Feb 2007 | A1 |
20070152298 | Kim | Jul 2007 | A1 |
20070176845 | Yamazaki et al. | Aug 2007 | A1 |
20070188997 | Hockanson et al. | Aug 2007 | A1 |
20070247269 | Papananos | Oct 2007 | A1 |
20070249078 | Tung et al. | Oct 2007 | A1 |
20080037590 | Aiga et al. | Feb 2008 | A1 |
20080076354 | Rofougaran | Mar 2008 | A1 |
20080157913 | Kim | Jul 2008 | A1 |
20080169895 | Lee | Jul 2008 | A1 |
20080174386 | Ono et al. | Jul 2008 | A1 |
20080174396 | Choi et al. | Jul 2008 | A1 |
20080174397 | De Rooij et al. | Jul 2008 | A1 |
20080246114 | Abrokwah et al. | Oct 2008 | A1 |
20080272875 | Huang et al. | Nov 2008 | A1 |
20080303622 | Park et al. | Dec 2008 | A1 |
20090001510 | Matz et al. | Jan 2009 | A1 |
20090072404 | Kikuchi et al. | Mar 2009 | A1 |
20090085708 | Matsumoto et al. | Apr 2009 | A1 |
20090134955 | Sheng et al. | May 2009 | A1 |
20090146770 | Lee et al. | Jun 2009 | A1 |
20090243389 | Edo et al. | Oct 2009 | A1 |
20090243749 | Rofougaran | Oct 2009 | A1 |
20090322447 | Daley et al. | Dec 2009 | A1 |
20090322458 | Lee et al. | Dec 2009 | A1 |
20100060402 | Chen | Mar 2010 | A1 |
20100096753 | Hwang et al. | Apr 2010 | A1 |
20100109123 | Strzalkowski et al. | May 2010 | A1 |
20100148866 | Lee et al. | Jun 2010 | A1 |
20100164667 | Ho-Hsiang | Jul 2010 | A1 |
20100182118 | Roskos et al. | Jul 2010 | A1 |
20100225435 | Li et al. | Sep 2010 | A1 |
20100231305 | Mizokami et al. | Sep 2010 | A1 |
20100260082 | Lum et al. | Oct 2010 | A1 |
20100270947 | Chang et al. | Oct 2010 | A1 |
20110018670 | Bae et al. | Jan 2011 | A1 |
20110050357 | Kim et al. | Mar 2011 | A1 |
20110102124 | Matsushita | May 2011 | A1 |
20110133875 | Chiu et al. | Jun 2011 | A1 |
20110133879 | Chiu et al. | Jun 2011 | A1 |
20110168997 | Lee et al. | Jul 2011 | A1 |
20110210804 | Uemichi et al. | Sep 2011 | A1 |
20110217657 | Flemming et al. | Sep 2011 | A1 |
20110221560 | Chen et al. | Sep 2011 | A1 |
20110229667 | Jin et al. | Sep 2011 | A1 |
20110229687 | Gu et al. | Sep 2011 | A1 |
20110234469 | Shoji | Sep 2011 | A1 |
20110245948 | Bai et al. | Oct 2011 | A1 |
20110291786 | Li et al. | Dec 2011 | A1 |
20110299431 | Mikhemar et al. | Dec 2011 | A1 |
20110299435 | Mikhemar et al. | Dec 2011 | A1 |
20110304013 | Chen et al. | Dec 2011 | A1 |
20120058676 | Schaffer et al. | Mar 2012 | A1 |
20120075216 | Black et al. | Mar 2012 | A1 |
20120146741 | Yen et al. | Jun 2012 | A1 |
20120188047 | Groves et al. | Jul 2012 | A1 |
20120194403 | Cordier et al. | Aug 2012 | A1 |
20120235779 | Baram et al. | Sep 2012 | A1 |
20120235969 | Burns et al. | Sep 2012 | A1 |
20120238331 | Dou et al. | Sep 2012 | A1 |
20120244802 | Feng et al. | Sep 2012 | A1 |
20120249186 | Chen | Oct 2012 | A1 |
20120249281 | Campbell et al. | Oct 2012 | A1 |
20120293485 | Chang et al. | Nov 2012 | A1 |
20120299166 | Minamio et al. | Nov 2012 | A1 |
20130016633 | Lum et al. | Jan 2013 | A1 |
20130039229 | Park et al. | Feb 2013 | A1 |
20130050226 | Shenoy et al. | Feb 2013 | A1 |
20130057343 | Kondo | Mar 2013 | A1 |
20130057557 | Shenoy et al. | Mar 2013 | A1 |
20130106554 | Girard et al. | May 2013 | A1 |
20130157717 | Yu et al. | Jun 2013 | A1 |
20130207276 | Tseng et al. | Aug 2013 | A1 |
20130207739 | Bakalski | Aug 2013 | A1 |
20130207745 | Yun et al. | Aug 2013 | A1 |
20130257367 | Someya | Oct 2013 | A1 |
20130278374 | Thorslund | Oct 2013 | A1 |
20140138792 | Lo et al. | May 2014 | A1 |
20140145810 | Park et al. | May 2014 | A1 |
20140197902 | Zuo et al. | Jul 2014 | A1 |
20140225702 | Yazaki | Aug 2014 | A1 |
20140227982 | Granger-Jones et al. | Aug 2014 | A1 |
20140240072 | Lan et al. | Aug 2014 | A1 |
20140266494 | Lan et al. | Sep 2014 | A1 |
20140293841 | Rousu | Oct 2014 | A1 |
20140307599 | Rousu | Oct 2014 | A1 |
20140327510 | Kim et al. | Nov 2014 | A1 |
20150061813 | Kim et al. | Mar 2015 | A1 |
20150092314 | Kim et al. | Apr 2015 | A1 |
20150130579 | Kim et al. | May 2015 | A1 |
20150194944 | Joshi et al. | Jul 2015 | A1 |
20150304059 | Zuo et al. | Oct 2015 | A1 |
20170134007 | Lan et al. | May 2017 | A1 |
Number | Date | Country |
---|---|---|
1601893 | Mar 2005 | CN |
1628360 | Jun 2005 | CN |
1893071 | Jan 2007 | CN |
101213142 | Jul 2008 | CN |
101241916 | Aug 2008 | CN |
201156721 | Nov 2008 | CN |
101673864 | Mar 2010 | CN |
101960573 | Jan 2011 | CN |
102231313 | Nov 2011 | CN |
102522181 | Jun 2012 | CN |
102725844 | Oct 2012 | CN |
102739229 | Oct 2012 | CN |
203942319 | Nov 2014 | CN |
0468757 | Jan 1992 | EP |
0995264 | Apr 2000 | EP |
1085538 | Mar 2001 | EP |
1443529 | Aug 2004 | EP |
1729413 | Dec 2006 | EP |
H0832076 | Feb 1996 | JP |
H08148354 | Jun 1996 | JP |
H1050522 | Feb 1998 | JP |
H10144552 | May 1998 | JP |
H11204730 | Jul 1999 | JP |
2000114046 | Apr 2000 | JP |
2000286125 | Oct 2000 | JP |
2002152901 | May 2002 | JP |
2003031814 | Jan 2003 | JP |
2003318417 | Nov 2003 | JP |
2004235584 | Aug 2004 | JP |
2005032976 | Feb 2005 | JP |
2005223261 | Aug 2005 | JP |
2006019506 | Jan 2006 | JP |
2006054116 | Feb 2006 | JP |
2006228747 | Aug 2006 | JP |
2007150022 | Jun 2007 | JP |
2008177566 | Jul 2008 | JP |
2009038297 | Feb 2009 | JP |
2009507426 | Feb 2009 | JP |
2009508322 | Feb 2009 | JP |
2009071045 | Apr 2009 | JP |
2009246159 | Oct 2009 | JP |
2010016337 | Jan 2010 | JP |
2010098199 | Apr 2010 | JP |
2010141246 | Jun 2010 | JP |
2011029222 | Feb 2011 | JP |
2012058274 | Mar 2012 | JP |
2012074060 | Apr 2012 | JP |
2012164770 | Aug 2012 | JP |
20060007618 | Jan 2006 | KR |
20080031153 | Apr 2008 | KR |
20080069823 | Jul 2008 | KR |
101127478 | Mar 2012 | KR |
20130072284 | Jul 2013 | KR |
20130098099 | Sep 2013 | KR |
02080279 | Oct 2002 | WO |
2012093133 | Jul 2012 | WO |
2013033124 | Mar 2013 | WO |
Entry |
---|
Bhattacharya S.K., et al., “Fabrication of a Fully Integrated Passive Module for Filter Application Using Mcm-d Compatible Processes”, Journal of Materials Science: Materials in Electronics, 2000, pp. 455-460. |
Liu L., et al., “Compact Harmonic Filter Design and Fabrication Using IPD Technology”, IEEE Transactions on components and packaging technologies, vol. 30 (4), 2007, pp. 556-562. |
International Search Report and Written Opinion—PCT/US2014/048723—ISA/EPO—dated Oct. 21, 2014. |
Bae H., et al., “Extraction of Separated Source and Drain Resistances in Amorphous Indium-Gallium-Zinc Oxide TFTs Through C-V Characterization”, IEEE Electron Device Letters, Jun. 2011, vol. 32, No. 6, pp. 761-763. |
Chien-Hsun Chen et al., “Very Compact Transformer-Coupled Balun-Integrated Bandpass Filter Using Integrated Passive Device Technology on Glass Substrate”, Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International, May 23-28, 2010, pp. 1372-1375. |
Fu et al., “A Ferroelectric-Based Impedance Tuner for Adaptive Matching Applications”, Microwave Symposium Digest, 2008 IEEE MTT-S International, Jun. 15-20, 2008, pp. 955-958. |
Mikhemar, et al., “An On-Chip Wideband and Low-Loss Duplexer for 3G/4G CMOS Radios,” IEEE Symposium on VLSI Circuits 2010, pp. 129-130. |
Mikhemar M. et al., “A tunable integrated duplexer with 50dB isolation in 40nm CMOS”, IEEE International Solid-State Circuits Conference (ISSCC)—Digest of Technical Papers, Feb. 8, 2009, IEEE, Piscataway, NJ, USA, pp. 386-387,387a, XP031742309, ISBN: 978-1-4244-3458-9. |
Mobley, T., et al., “Through glass via (TGV) solutions for wafer and chip level interposers and RF integration methods for high frequency applications,” Mar. 2012, 25 pages. |
Orlandi S., et al., “Optimization of shielded PCB air-core toroids for high efficiency dc-dc converters,” Energy Conversion Congress and Exposition, Sep. 2009, pp. 2073-2080. |
Saputra N., et al., “Single-Grain Si Thin-Film Transistors for Analog and RF Circuit Applications”, Solid State Device Research Conference, ESSDERC 2007, 37th Europea,Sep. 11-13, 2007, pp. 107-110. |
Topper M. et al., “3-D Thin film interposer based on TGV (Through Glass Vias): An alternative to Si-interposer”, Electronic Components and Technology Conference (ECTC), 2010 Proceedings 60th, IEEE, Piscataway, NJ, USA, Jun. 1, 2010 (Jun. 1, 2010), pp. 66-73, XP031694110, ISBN: 978-1-4244-6410-4. |
Yoon Y. et al., “Design and Characterization of Multilayer Spiral Transmission-Line Baluns”, IEEE Transactions on Microwave Theory and Techniques, Sep. 1, 1999, IEEE Service Center, Piscataway, NJ, US, vol. 47, No. 9, pp. 1841-1847, XP011037747, ISSN: 0018-9480. |
Yu X., et al., “Silicon-Embedding Approaches to 3-D Toroidal Inductor Fabrication,” Journal of Microelectromechanical Systems, Jun. 2013, vol. 22 (3), pp. 580-588. |
Shorey, A.B., et al., “Development of Substrates Featuring Through Glass Vias (TGV) for 3DIC Integration,” pp. 1-3 (2012). |
Number | Date | Country | |
---|---|---|---|
20160358709 A1 | Dec 2016 | US |
Number | Date | Country | |
---|---|---|---|
61872342 | Aug 2013 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 14155244 | Jan 2014 | US |
Child | 15242007 | US |