This invention relates to a design for a wafer boat for accommodating a vertically spaced stack of semiconductor wafers during processing in a vertical furnace.
In vertical furnaces used for semiconductor wafer processing, a wafer boat may be used for accommodating a stack of vertically spaced apart wafers. Typically, as shown in
A problem with known wafer boats is that damage may occur on the wafer at the point of contact between the wafer and the boat. Due to different thermal expansion of the wafer and the boat, for instance, the wafer may move relative to the recess, resulting in scratches.
In the art, support members are proposed that have a convex support surface to minimize contact stresses in the wafer at the support point. However, boats having these support members are difficult to manufacture and require elaborate machining. In some proposals the wafer support members are separately machined for ease of machining and then mounted in the wafer boat which is also a complex procedure and construction.
It is an object of the present invention to provide a wafer boat that minimizes contact stress in supported wafers and is easier to manufacture than known wafer boats.
To this end, a first aspect of the present invention is directed to a wafer boat comprising two side rods and at least one back rod. In a use orientation of the wafer boat, the rods may be substantially vertically oriented, and extend between a top member and a bottom member. The rods may comprise vertically spaced apart recesses formed at corresponding heights, wherein recesses at a same height may face generally inwards and towards each other to define a wafer accommodation for receiving and supporting a wafer in a substantially horizontal orientation. Each recess may include a lower, upwardly facing surface comprising a first flat surface (portion) and a second flat surface (portion). The first flat surface (portion) may be disposed in an outward region of a respective recess, and extend horizontally or be inclined downward in an outward direction. The second flat surface (portion) may be disposed in an inner region of the recess, and be inclined downward in an inward direction. An intersection of or join between the first and second surfaces may form an edge or ridge for supporting a wafer.
The first and second flat surfaces or surface portions may thus include an angle. The included angle may typically be an obtuse angle, i.e. an angle in the range of 90-180 degrees. In one embodiment, for instance, the respective angles of inclination of the first and second surfaces/surface portions of a lower surface of a recess may be in a range of 1 to 10 degrees with respect to a horizontal plane; accordingly, the angle included by the respective first and second surfaces may be in the range of (180−(2*10)=)160 to (180−(2*1)=)178 degrees. In a preferred embodiment, the respective angles of inclination of the first and second surfaces/surface portions of a lower surface of a recess may be in a range of 2 to 6 degrees with respect to a horizontal plane; accordingly, the angle included by the respective first and second surfaces may be in the range of (180−(2*6)=)168 to (180−(2*2)=)176 degrees. In a more preferred embodiment, the respective angles of inclination of the first and second surfaces may be about 3 degrees, such that the angle included by the respective first and second surfaces is about (180−(2*3)=)174 degrees, e.g. 174±1 degrees.
An edge defined by the first and second surfaces/surface portions of a lower surface of a respective recess may preferably extend in a generally horizontal plane, and/or be rounded off to a radius of curvature of at least 1 mm, and more preferably to a radius of curvature of at least 3 mm.
These and other features and advantages of the invention will be more fully understood from the following detailed description of certain embodiments of the invention, taken together with the accompanying drawings, which are meant to illustrate and not to limit the invention.
The invention will be further explained with reference to the figures. In the figures, similar parts will be referred to with like reference numerals.
In the embodiment of
When a wafer 160 is supported on a lower, upward facing surface 210, 220 of a recess 150 including an edge 230, a central portion of the wafer 160 sags under its own weight and the wafer 160 shows a radius of curvature, with the wafer edge bending upwards. As a result, the wafer 160 is supported on the edge 230 of the lower, upward facing surface 210, 220 of the recess 150, and the outer region of the wafer 160, extending beyond edge 230, is not contacting surface 210. Also the free hanging part of the wafer 160 at the open end of the wafer boat sags significantly. Preferably, the boat 100 is dimensioned such the support edge 230 supports the wafer 160 at a position not more than 2 mm away from the outer, circumferential edge of the wafer 160. Preferably the inner edge 240 of the recess 150 is also rounded off.
In the embodiment of
In
The side rods 110A may now be positioned to the front of side-to-side centerline a, while the recesses 150 in the side rods 110A still approximately face the center M of a wafer accommodation. Connection line l may extend parallel to side-to-side center line a. Direction lines x and y may be non-parallel (preferably including an obtuse angle), and intersect back-to-front centerline b in the center of the wafer accommodation M. However, the optimum crossing point/point of intersection of direction lines x and y with back-to-front centerline b may be spaced from center point M, and be located between a point at a distance d in the forward direction from center point M and a point at a distance 2d in backward direction from center point M to achieve that the point of contact C in the recesses of the side rods 110A will be approximately in the center of the recess, in the center of edges 230, 330. Here, d may equal 7% of a diameter of the wafer accommodation, e.g. the diameter of the inscribed circle of the recesses 150 defining the wafer accommodation. For a wafer accommodation configured to hold a 300 mm wafer, d may thus amount to 21 mm.
It is an advantage of the present invention that main upwardly facing surfaces of the recesses are flat surfaces that are relatively simple to machine. As discussed before the edge 230,330 and the edge 240, 340 are preferably rounded off but that is relatively easy to achieve.
The boat of the present invention can be made of quartz or silicon carbide or silicon or any other temperature resistant ceramic material that does not contaminate the wafers. If the boat is provided with a silicon carbide coating, deposited by Chemical Vapor Deposition, preferably a polishing treatment is applied after deposition of the coating to remove eventual protrusion grown during the coating process.
This application claims priority under 35 U.S.C. §119(e) to U.S. Provisional Application Ser. No. 61/638,613, filed Apr. 26, 2012, which is hereby incorporated by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
3169295 | Paspy | Feb 1965 | A |
RE26345 | Cummings | Feb 1968 | E |
5169684 | Takagi | Dec 1992 | A |
5534074 | Koons | Jul 1996 | A |
5584401 | Yoshida | Dec 1996 | A |
5858103 | Nakajima et al. | Jan 1999 | A |
5865321 | Tomanovich | Feb 1999 | A |
5882418 | Fujii et al. | Mar 1999 | A |
5921773 | Lee | Jul 1999 | A |
5931666 | Hengst | Aug 1999 | A |
6033215 | Ohsawa | Mar 2000 | A |
6099302 | Hong et al. | Aug 2000 | A |
6110285 | Kitazawa et al. | Aug 2000 | A |
6206197 | Decamps et al. | Mar 2001 | B1 |
6361313 | Beyaert et al. | Mar 2002 | B1 |
6617225 | Boyle et al. | Sep 2003 | B2 |
6979659 | Zehavi et al. | Dec 2005 | B2 |
7077913 | Shimada | Jul 2006 | B2 |
7241141 | Wedel | Jul 2007 | B2 |
7431158 | Yamada et al. | Oct 2008 | B2 |
7661544 | Herzog | Feb 2010 | B2 |
7748542 | Yudovsky et al. | Jul 2010 | B2 |
8067820 | Kihara | Nov 2011 | B2 |
8307997 | Jonas et al. | Nov 2012 | B2 |
20020130061 | Hengst | Sep 2002 | A1 |
20030157453 | Irie et al. | Aug 2003 | A1 |
20050023231 | Huang et al. | Feb 2005 | A1 |
20060226094 | Cho et al. | Oct 2006 | A1 |
20070006803 | Cadwell et al. | Jan 2007 | A1 |
20070082314 | Wedel | Apr 2007 | A1 |
Number | Date | Country |
---|---|---|
2000232151 | Aug 2000 | JP |
WO 2004112113 | Dec 2004 | WO |
Number | Date | Country | |
---|---|---|---|
20130284683 A1 | Oct 2013 | US |
Number | Date | Country | |
---|---|---|---|
61638613 | Apr 2012 | US |