Wavelength measurement method based on combination of two signals in quadrature

Abstract

In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a measurement is in the second dead zone, only the first etalon signal is employed to determine wavelength. When a measurement is in neither zone, both first and second etalon signals are employed to determine the wavelength.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a method for wavelength monitoring according to an embodiment of the invention.

FIG. 2 schematically shows two etalon signals in quadrature.

FIG. 3 shows a polar coordinate representation of two etalon signals.

FIG. 4 shows an exemplary system including a wavelength monitor according to an embodiment of the invention.

Claims

1. A method for measuring a wavelength of optical radiation, the method comprising: a) providing a first signal having a substantially periodic dependence on the wavelength;b) providing a second signal having a substantially periodic dependence on the wavelength, wherein the first and second signals have substantially the same period, and wherein the first and second signals have a phase difference substantially equal to an odd multiple of 90 degrees;c) providing first and second measured values of the first and second signals, respectively;d) determining whether or not the measured values are within a predetermined first zone, wherein sensitivity of the first signal to wavelength change is minimal in the first zone;e) determining whether or not the measured values are within a predetermined second zone, wherein sensitivity of the second signal to wavelength change is minimal in the second zone;f) if the measured values are within the first zone, determining a wavelength in part from the second measured value without making use of the first measured value;g) if the measured values are within the second zone, determining a wavelength in part from the first measured value without making use of the second measured value;h) if the measured values are not within the first zone and not within the second zone, determining a wavelength in part from both the first and second measured values.

2. The method of claim 1, wherein said determining a wavelength in part from the second measured value without making use of the first measured value comprises inverse cubic interpolation of said second measured value.

3. The method of claim 1, wherein said determining a wavelength in part from the first measured value without making use of the second measured value comprises inverse cubic interpolation of said first measured value.

4. The method of claim 1, wherein said first signal is provided by a method comprising: illuminating an etalon with said radiation;receiving a reflected signal from the etalon;receiving a transmitted signal from the etalon;providing a ratio of the reflected signal to the transmitted signal as said first signal.

5. The method of claim 1, wherein said second signal is provided by a method comprising: illuminating an etalon with said radiation;receiving a reflected signal from the etalon;receiving a transmitted signal from the etalon;providing a ratio of the reflected signal to the transmitted signal as said second signal.

6. The method of claim 1, further comprising providing a coarse wavelength measurement, whereby wavelength ambiguity due to said periodicity of said first and second signals can be removed.

7. The method of claim 6, wherein said coarse wavelength measurement is determined from temperature and current of a semiconductor laser providing said optical radiation.

8. The method of claim 1, wherein an angular coordinate θ is defined based on the first and second measured values such that said first zone includes angles at or near θ=0° and angles at or near θ=180°, and such that said second zone includes angles at or near θ=90° and angles at or near θ=270°.

9. The method of claim 8, wherein said determining a wavelength in part from both the first and second measured values comprises: computing a first intermediate value by inverse cubic interpolation of said first measured value;computing a second intermediate value by inverse cubic interpolation of said second measured value;combining the first and second intermediate values in a weighted linear combination, wherein weights of the linear combination vary continuously as a function of said angular coordinate θ.

10. The method of claim 1, wherein said first and second signals are obtained by passing first and second beams of said optical radiation through an etalon at different angles of incidence.

11. The method of claim 10, wherein said angles of incidence are selected to provide said phase difference.

12. The method of claim 10, further comprising providing temperature control of said etalon.

13. The method of claim 12, wherein said etalon is maintained at an etalon operating temperature substantially above room temperature.

14. The method of claim 13, wherein said operating temperature is substantially the same as an assembly temperature of said etalon and associated optical elements.

15. A cavity ring-down spectroscopy instrument including a wavelength monitor operating according to the method of claim 1, and further comprising one or more optical sources, each optical source having its wavelength monitored by said wavelength monitor, whereby multi-species detection capability can be provided.