Membership
Tour
Register
Log in
using multiple reflection
Follow
Industry
CPC
G01J3/26
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/26
using multiple reflection
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Metal mirror based multispectral filter array of optical sensor device
Patent number
12,170,300
Issue date
Dec 17, 2024
Viavi Solutions Inc.
Georg J. Ockenfuss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light detection device
Patent number
12,169,143
Issue date
Dec 17, 2024
Hamamatsu Photonics K.K.
Takashi Kasahara
G01 - MEASURING TESTING
Information
Patent Grant
Micro wideband spectroscopic analysis device
Patent number
12,163,834
Issue date
Dec 10, 2024
Jed Khoury
G01 - MEASURING TESTING
Information
Patent Grant
Linear temperature calibration compensation for spectrometer systems
Patent number
12,163,835
Issue date
Dec 10, 2024
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
Brillouin imaging devices, and systems and methods employing such d...
Patent number
12,158,373
Issue date
Dec 3, 2024
University of Maryland, College Park
Giuliano Scarcelli
G01 - MEASURING TESTING
Information
Patent Grant
Optical package having tunable filter
Patent number
12,147,030
Issue date
Nov 19, 2024
II-VI DELAWARE, INC.
Jiang-Huai Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Optical filter and spectrometer
Patent number
12,135,239
Issue date
Nov 5, 2024
Viavi Solutions Inc.
Paula Smith
G02 - OPTICS
Information
Patent Grant
Electrical inspection method
Patent number
12,123,799
Issue date
Oct 22, 2024
Hamamatsu Photonics K.K.
Takashi Kasahara
G01 - MEASURING TESTING
Information
Patent Grant
Layered sheet polarizers and isolators having non-dichroic layers
Patent number
12,092,848
Issue date
Sep 17, 2024
Board of Regents, The University of Texas System
Ilya M. Vitebskiy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light detecting device, light detecting system, and filter array
Patent number
12,074,184
Issue date
Aug 27, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Atsushi Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated sensor modules for detection of chemical substances
Patent number
12,055,482
Issue date
Aug 6, 2024
ams International AG
Frederic Roger
G01 - MEASURING TESTING
Information
Patent Grant
Color measuring apparatus
Patent number
12,025,493
Issue date
Jul 2, 2024
Seiko Epson Corporation
Tatsuya Shirane
G01 - MEASURING TESTING
Information
Patent Grant
Drug scanning and identification system and use method thereof
Patent number
12,025,496
Issue date
Jul 2, 2024
InnoSpectra Corporation
Hsi-Pin Li
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating spectral sensor modules
Patent number
12,018,987
Issue date
Jun 25, 2024
ams Sensors Singapore Pte. Ltd.
Javier Miguel Sánchez
G01 - MEASURING TESTING
Information
Patent Grant
Angled interference filters generating offset ripple effects
Patent number
12,019,255
Issue date
Jun 25, 2024
OTO PHOTONICS INC.
Chien-Hsiang Hung
G02 - OPTICS
Information
Patent Grant
Spectrometry system with decreased light path
Patent number
11,988,556
Issue date
May 21, 2024
VERIFOOD LTD.
Damian Goldring
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor and display device
Patent number
11,976,970
Issue date
May 7, 2024
Japan Display Inc.
Toshiyuki Higano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectroscopic unit and spectroscopic module
Patent number
11,971,301
Issue date
Apr 30, 2024
Hamamatsu Photonics K.K.
Kei Tabata
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring Raman spectrum and method thereof
Patent number
11,965,779
Issue date
Apr 23, 2024
TimeGate Instruments Oy
Lauri Kurki
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer device and method for producing a spectrometer device
Patent number
11,959,802
Issue date
Apr 16, 2024
Robert Bosch GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Grant
Integrated evanescent wave spectral sensing device
Patent number
11,953,377
Issue date
Apr 9, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer apparatus and a corresponding method for operating a s...
Patent number
11,946,805
Issue date
Apr 2, 2024
Robert Bosch GmbH
Thomas Buck
G01 - MEASURING TESTING
Information
Patent Grant
Refractory anchor device and system
Patent number
11,927,395
Issue date
Mar 12, 2024
Brand Shared Services, LLC
Eduardo Fernando D'Oracio De Almeida
B82 - NANO-TECHNOLOGY
Information
Patent Grant
On-chip signal processing method and pixel-array signal
Patent number
11,921,285
Issue date
Mar 5, 2024
Arizona Board of Regents on behalf of the University of Arizona
John Koshel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multispectral sensor response balancing
Patent number
11,892,666
Issue date
Feb 6, 2024
Viavi Solutions Inc.
William D. Houck
G01 - MEASURING TESTING
Information
Patent Grant
Spectral device
Patent number
11,885,680
Issue date
Jan 30, 2024
Konica Minolta, Inc.
Toru Nakatani
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring transmittance curve of Fabry-Perot using frequ...
Patent number
11,874,169
Issue date
Jan 16, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian Wang
G01 - MEASURING TESTING
Information
Patent Grant
Air quality monitoring system and method
Patent number
11,874,170
Issue date
Jan 16, 2024
PROJECT CANARY, PBC
Anna Ailene Scott
G02 - OPTICS
Information
Patent Grant
Divided-aperture infra-red spectral imaging system
Patent number
11,867,564
Issue date
Jan 9, 2024
Rebellion Photonics, Inc.
Robert Timothy Kester
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Determination of measurement error in an etalon
Patent number
11,860,036
Issue date
Jan 2, 2024
Cymer, LLC
Russell Allen Burdt
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optical Module, Electronic Device, And Driving Method
Publication number
20240418981
Publication date
Dec 19, 2024
SEIKO EPSON CORPORATION
Tomonori MATSUSHITA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATING A SPECTRAL IMAGING DEVICE
Publication number
20240410752
Publication date
Dec 12, 2024
Teknologian Tutkimuskeskus VTT Oy
Philippe MONNOYER
G01 - MEASURING TESTING
Information
Patent Application
SENSORS FOR MEASURING PRESSURE AND TEMPERATURE
Publication number
20240385040
Publication date
Nov 21, 2024
Simmonds Precision Products, Inc.
Kristen Brosnan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR QUANTUM ABSORPTION SPECTROSCOPY
Publication number
20240385043
Publication date
Nov 21, 2024
KYOTO UNIVERSITY
Shigeki TAKEUCHI
G01 - MEASURING TESTING
Information
Patent Application
GAS-SENSING APPARATUS
Publication number
20240385104
Publication date
Nov 21, 2024
UNIVERSITAET WIEN
Stefan PUTZ
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY SYSTEMS WITH DECREASED LIGHT PATH
Publication number
20240377253
Publication date
Nov 14, 2024
Verifood Ltd
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20240377255
Publication date
Nov 14, 2024
HAMAMATSU PHOTONICS K. K.
Masaki HIROSE
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION SYSTEM AND VOLTAGE DETERMINATION METHOD
Publication number
20240369410
Publication date
Nov 7, 2024
Hamamatsu Photonics K.K.
Takashi KASAHARA
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTING DEVICE, LIGHT DETECTING SYSTEM, AND FILTER ARRAY
Publication number
20240332326
Publication date
Oct 3, 2024
Panasonic Intellectual Property Management Co., Ltd.
ATSUSHI ISHIKAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...
Publication number
20240288307
Publication date
Aug 29, 2024
Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
Uriel LEVY
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ASSEMBLY WITH AN OPTICAL ELEMENT TO SUPPRESS A PARASITIC ET...
Publication number
20240280756
Publication date
Aug 22, 2024
Lumentum Technology UK Limited
Colin SMITH
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
Publication number
20240271999
Publication date
Aug 15, 2024
Tsubasa SAITO
G01 - MEASURING TESTING
Information
Patent Application
DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
Publication number
20240230417
Publication date
Jul 11, 2024
REBELLION PHOTONICS, INC.
Robert Timothy Kester
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
Publication number
20240230405
Publication date
Jul 11, 2024
HAMAMATSU PHOTONICS K. K.
Kei Tabata
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER WITH ABSORBING LAYER
Publication number
20240175671
Publication date
May 30, 2024
Murata Manufacturing Co., Ltd.
Ville KAAJAKARI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FILTER FOR A MULTISPECTRAL SENSOR AND METHOD FOR MANUFACTUR...
Publication number
20240176129
Publication date
May 30, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Sandrine VILLENAVE
G02 - OPTICS
Information
Patent Application
LOW-COST SPECTROMETRY SYSTEM FOR END-USER FOOD ANALYSIS
Publication number
20240142302
Publication date
May 2, 2024
Verifood Ltd
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
MULTISPECTRAL IMAGER WITH ENLARGED SPECTRAL DOMAIN
Publication number
20240102861
Publication date
Mar 28, 2024
SILIOS TECHNOLOGIES
Stéphane TISSERAND
G01 - MEASURING TESTING
Information
Patent Application
REFRACTORY ANCHOR DEVICE AND SYSTEM
Publication number
20240102736
Publication date
Mar 28, 2024
BRAND SHARED SERVICES, LLC
Eduardo Fernando D'ORACIO DE ALMEIDA
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
Publication number
20240060820
Publication date
Feb 22, 2024
VERIFOOD, LTD.
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
Publication number
20240035888
Publication date
Feb 1, 2024
Hamamatsu Photonics K.K.
Kei TABATA
G01 - MEASURING TESTING
Information
Patent Application
VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...
Publication number
20240019302
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20240019304
Publication date
Jan 18, 2024
HAMAMATSU PHOTONICS K. K.
Masaki HIROSE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRY-PEROT CAVITY ARRAY AND SPECTRUM DETECTOR
Publication number
20240011831
Publication date
Jan 11, 2024
Nanjing Kanshijie Intelligent Technology Co., LTD
Qian MA
G01 - MEASURING TESTING
Information
Patent Application
AIR QUALITY MONITORING SYSTEM AND METHOD
Publication number
20230408334
Publication date
Dec 21, 2023
Project Canary, PBC
Anna Ailene Scott
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20230358610
Publication date
Nov 9, 2023
HAMAMATSU PHOTONICS K. K.
Takashi KASAHARA
G01 - MEASURING TESTING
Information
Patent Application
AIR QUALITY MONITORING SYSTEM AND METHOD
Publication number
20230324226
Publication date
Oct 12, 2023
Project Canary, PBC
Anna Ailene Scott
G02 - OPTICS
Information
Patent Application
MULTI-CHANNEL INFEROMETER-BASED OPTICAL SENSOR
Publication number
20230304861
Publication date
Sep 28, 2023
ams Sensors Singapore Pte. Ltd.
Peter Roentgen
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL SENSOR SYSTEM WITH SPATIALLY MODIFIED CENTER WAVELENGTHS
Publication number
20230280210
Publication date
Sep 7, 2023
SPECTRICITY
Jonathan Borremans
G01 - MEASURING TESTING
Information
Patent Application
Temperature Measurement Device
Publication number
20230280214
Publication date
Sep 7, 2023
Nippon Telegraph and Telephone Corporation
Yurina Tanaka
G01 - MEASURING TESTING