Capres A/S

Organization

Lyngby, DK

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Probe for testing an electrical property of a test sample
- Patent number 11,215,638
- Issue date Jan 4, 2022
- CAPRES A/S
- Lior Shiv
- G01 - MEASURING TESTING
Information Patent Grant
Position correction method and a system for position correction in...
- Patent number 11,131,700
- Issue date Sep 28, 2021
- CAPRES A/S
- Frederik Westergaard Osterberg
- G01 - MEASURING TESTING
Information Patent Grant
Deep-etched multipoint probe
- Patent number 9,983,231
- Issue date May 29, 2018
- Capres A/S
- Lior Shiv
- G01 - MEASURING TESTING
Information Patent Grant
Single-position hall effect measurements
- Patent number 9,644,939
- Issue date May 9, 2017
- Capres A/S
- Fei Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining an electrical property of a test sample
- Patent number 8,907,690
- Issue date Dec 9, 2014
- Capres A/S
- Dirch H. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Cover, connector, and handle assembly attachable to a rack for a ra...
- Patent number D717189
- Issue date Nov 11, 2014
- Capres A/S
- Hans Henrik Jochumsen
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Rack, cover, connector, and handle assembly for a rack-supported mu...
- Patent number D717190
- Issue date Nov 11, 2014
- Capres A/S
- Hans Henrik Jochumsen
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Rack for supporting a multi-point electrical probe holder
- Patent number D717188
- Issue date Nov 11, 2014
- Capres A/S
- Hans Henrik Jochumsen
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Automated multi-point probe manipulation
- Patent number 8,836,358
- Issue date Sep 16, 2014
- Capres A/S
- Henrik Baekbo
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing alignment of a probe
- Patent number 8,378,697
- Issue date Feb 19, 2013
- Capres A/S
- Peter Folmer Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing electrical properties of a test sample
- Patent number 8,310,258
- Issue date Nov 13, 2012
- Capres A/S
- Dirch Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Device including a contact detector
- Patent number 8,058,886
- Issue date Nov 15, 2011
- Capres A/S
- Dirch H. Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Eliminating inline positional errors for four-point resistance meas...
- Patent number 7,944,222
- Issue date May 17, 2011
- Capres A/S
- Torben M. Hansen
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing alignment of a probe
- Patent number 7,936,176
- Issue date May 3, 2011
- Capres A/S
- Peter Folmer Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Eliminating inline positional errors for four-point resistance meas...
- Patent number 7,852,093
- Issue date Dec 14, 2010
- Capres A/S
- Torben M. Hansen
- G01 - MEASURING TESTING
Information Patent Grant
Connector for a microchip probe
- Patent number D602885
- Issue date Oct 27, 2009
- Capres A/S
- Peter F. Nielsen
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Electrical feedback detection system for multi-point probes
- Patent number 7,307,436
- Issue date Dec 11, 2007
- Capres A/S
- Christian Leth Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Nano-drive for high resolution positioning and for positioning of a...
- Patent number 7,304,486
- Issue date Dec 4, 2007
- Capres A/S
- Christian Leth Petersen
- G01 - MEASURING TESTING
Information Patent Grant
Electrical feedback detection system for multi-point probes
- Patent number 7,135,876
- Issue date Nov 14, 2006
- Capres A/S
- Christian Leth Petersen
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
A PROBE FOR TESTING AN ELECTRICAL PROPERTY OF A TEST SAMPLE
- Publication number 20200241043
- Publication date Jul 30, 2020
- CAPRES A/S
- Lior Shiv
- G01 - MEASURING TESTING
Information Patent Application
A POSITION CORRECTION METHOD AND A SYSTEM FOR POSITION CORRECTION I...
- Publication number 20190310295
- Publication date Oct 10, 2019
- CAPRES A/S
- Frederik Westergaard Osterberg
- G01 - MEASURING TESTING
Information Patent Application
DEEP-ETCHED MULTIPOINT PROBE
- Publication number 20150177278
- Publication date Jun 25, 2015
- Capres A/S
- Lior Shiv
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-POSITION HALL EFFECT MEASUREMENTS
- Publication number 20140015552
- Publication date Jan 16, 2014
- Capres A/S
- Fei Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SHEET RESISTANCE AND LEAKAGE CURRENT DENSITY MEASUREMENT...
- Publication number 20120143545
- Publication date Jun 7, 2012
- Capres A/S
- Christian L. Petersen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SHEET RESISTANCE AND LEAKAGE CURRENT DENSITY MEASUREMENT...
- Publication number 20110320144
- Publication date Dec 29, 2011
- Capres A/S
- Christian L. Petersen
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING ELECTRICAL PROPERTIES OF A TEST SAMPLE
- Publication number 20090219047
- Publication date Sep 3, 2009
- CAPRES A/S
- Dirch Petersen
- G01 - MEASURING TESTING
Information Patent Application
Method for Providing Alignment of a Probe
- Publication number 20090009200
- Publication date Jan 8, 2009
- Capres A/S
- Peter Folmer Nielsen
- G01 - MEASURING TESTING
Information Patent Application
Eliminating Inline Positional Errors for Four-Point Resistance Meas...
- Publication number 20080294365
- Publication date Nov 27, 2008
- CAPRES A/S
- Torben M. Hansen
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
79126273 - MICROHALL
- Serial number 79126273
- Registration number 4468336
- Filing date Dec 5, 2012
- Capres A/S
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79043090 - MICRORSP
- Serial number 79043090
- Registration number 3666856
- Filing date Jul 19, 2007
- Capres A/S
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78304510 - CIPTECH
- Serial number 78304510
- Registration number 2908551
- Filing date Sep 23, 2003
- Capres A/S
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Probe for testing an electrical property of a test sample

Position correction method and a system for position correction in...

Deep-etched multipoint probe

Single-position hall effect measurements

Method of determining an electrical property of a test sample

Cover, connector, and handle assembly attachable to a rack for a ra...

Rack, cover, connector, and handle assembly for a rack-supported mu...

Rack for supporting a multi-point electrical probe holder

Automated multi-point probe manipulation

Method for providing alignment of a probe

Probe for testing electrical properties of a test sample

Device including a contact detector

Eliminating inline positional errors for four-point resistance meas...

Method for providing alignment of a probe

Eliminating inline positional errors for four-point resistance meas...

Connector for a microchip probe

Electrical feedback detection system for multi-point probes

Nano-drive for high resolution positioning and for positioning of a...

Electrical feedback detection system for multi-point probes

Patents Applicationslast 30 patents

A PROBE FOR TESTING AN ELECTRICAL PROPERTY OF A TEST SAMPLE

A POSITION CORRECTION METHOD AND A SYSTEM FOR POSITION CORRECTION I...

DEEP-ETCHED MULTIPOINT PROBE

SINGLE-POSITION HALL EFFECT MEASUREMENTS

METHOD FOR SHEET RESISTANCE AND LEAKAGE CURRENT DENSITY MEASUREMENT...

METHOD FOR SHEET RESISTANCE AND LEAKAGE CURRENT DENSITY MEASUREMENT...

PROBE FOR TESTING ELECTRICAL PROPERTIES OF A TEST SAMPLE

Method for Providing Alignment of a Probe

Eliminating Inline Positional Errors for Four-Point Resistance Meas...

Trademarklast 30 trademarks

79126273 - MICROHALL

79043090 - MICRORSP

78304510 - CIPTECH