CASCADE MICROTECH, INC.

Organization

BEAVERTON, OR, US

INSTRUMENTS FOR MEAS & TESTING OF ELECTRICITY & ELEC SIGNALS
Business Address
9100 SW GEMINI DRIVE BEAVERTON OR 97008 5036011000
Mailing Address
9100 SW GEMINI DRIVE BEAVERTON OR 97008
State Location
OR
State of Incorporation

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Wafer-handling end effectors with wafer-contacting surfaces and sea...
- Patent number 9,991,152
- Issue date Jun 5, 2018
- Cascade Microtech, Inc.
- Robbie Ingram-Goble
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Probe head assemblies, components thereof, test systems including t...
- Patent number 9,989,558
- Issue date Jun 5, 2018
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 9,983,232
- Issue date May 29, 2018
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 9,874,585
- Issue date Jan 23, 2018
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probes with fiducial marks, probe systems including the same, and a...
- Patent number 9,804,196
- Issue date Oct 31, 2017
- Cascade Microtech, Inc.
- Bryan Conrad Bolt
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe systems with controlled testing environments
- Patent number 9,784,763
- Issue date Oct 10, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
High voltage chuck for a probe station
- Patent number 9,741,599
- Issue date Aug 22, 2017
- Cascade Microtech, Inc.
- Michael E. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage chuck for a probe station
- Patent number 9,506,973
- Issue date Nov 29, 2016
- Cascade Microtech, Inc.
- Michael E. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for testing electronic devices that include low...
- Patent number 9,470,753
- Issue date Oct 18, 2016
- Cascade Microtech, Inc.
- Daniel M. Bock
- G01 - MEASURING TESTING
Information Patent Grant
Focusing optical systems and methods for testing semiconductors
- Patent number 9,435,858
- Issue date Sep 6, 2016
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Method of replacing an existing contact of a wafer probing assembly
- Patent number 9,429,638
- Issue date Aug 30, 2016
- Cascade Microtech, Inc.
- Kenneth R. Smith
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 9,395,411
- Issue date Jul 19, 2016
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for handling substrates at below dew point temp...
- Patent number 9,377,423
- Issue date Jun 28, 2016
- Cascade Microtech, Inc.
- Botho Hirschfeld
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for providing wafer access in a wafer processin...
- Patent number 9,373,533
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Frank Fehrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency interconnect structures, electronic assemblies that...
- Patent number 9,372,214
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Eric W. Strid
- G01 - MEASURING TESTING
Information Patent Grant
Optically enhanced digital imaging system
- Patent number 9,245,317
- Issue date Jan 26, 2016
- Cascade Microtech, Inc.
- Charles Cameron Abnet
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Probe head assemblies, components thereof, test systems including t...
- Patent number 9,244,099
- Issue date Jan 26, 2016
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING
Information Patent Grant
Modular prober and method for operating same
- Patent number 9,194,885
- Issue date Nov 24, 2015
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for contacting a row of contact areas with probe...
- Patent number 9,110,131
- Issue date Aug 18, 2015
- Cascade Microtech, Inc.
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 9,099,449
- Issue date Aug 4, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resilient electrical interposers, systems that include the interpos...
- Patent number 8,970,240
- Issue date Mar 3, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of a power device
- Patent number 8,922,229
- Issue date Dec 30, 2014
- Cascade Microtech, Inc.
- Botho Hirschfeld
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 8,841,932
- Issue date Sep 23, 2014
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for simultaneous optical testing of a plurality...
- Patent number 8,823,406
- Issue date Sep 2, 2014
- Cascade Micotech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 8,680,879
- Issue date Mar 25, 2014
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 8,497,693
- Issue date Jul 30, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing method using improved contact
- Patent number 8,451,017
- Issue date May 28, 2013
- Cascade Microtech, Inc.
- K. Reed Gleason
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Replaceable coupon for a probing apparatus
- Patent number 8,410,806
- Issue date Apr 2, 2013
- Cascade Microtech, Inc.
- Kenneth R. Smith
- B32 - LAYERED PRODUCTS
Information Patent Grant
Probe holder
- Patent number 8,402,848
- Issue date Mar 26, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for on-wafer-measurement under EMI-shielding
- Patent number 8,344,744
- Issue date Jan 1, 2013
- Cascade Microtech, Inc.
- Axel Schmidt
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
PROBE STATIONS, PROBE SYSTEMS INCLUDING THE PROBE STATIONS, AND MET...
- Publication number 20180341399
- Publication date Nov 29, 2018
- Cascade Microtech, Inc.
- Jens Fiedler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
- Publication number 20180284155
- Publication date Oct 4, 2018
- Cascade Microtech, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Application
CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIAT...
- Publication number 20180149674
- Publication date May 31, 2018
- Cascade Microtech, Inc.
- Daniel Mark Bock
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS
- Publication number 20180088149
- Publication date Mar 29, 2018
- Cascade Microtech, Inc.
- Gavin Neil Fisher
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS
- Publication number 20180031608
- Publication date Feb 1, 2018
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRC...
- Publication number 20170363681
- Publication date Dec 21, 2017
- Cascade Microtech, Inc.
- JAY SALMON
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ELECTRICALLY TESTING ELECTROMIGRATION IN AN...
- Publication number 20170356957
- Publication date Dec 14, 2017
- Cascade Microtech, Inc.
- Timothy Allen McMullen
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20170338142
- Publication date Nov 23, 2017
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, ME...
- Publication number 20170330677
- Publication date Nov 16, 2017
- Cascade Microtech, Inc.
- Jay Salmon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS
- Publication number 20170292974
- Publication date Oct 12, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING O...
- Publication number 20170285083
- Publication date Oct 5, 2017
- Cascade Microtech, Inc.
- Timothy Allen McMullen
- G01 - MEASURING TESTING
Information Patent Application
TEST STANDARDS AND METHODS FOR IMPEDANCE CALIBRATION OF A PROBE SYS...
- Publication number 20170269183
- Publication date Sep 21, 2017
- Cascade Microtech, Inc.
- Daniel M. Bock
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL
- Publication number 20170248973
- Publication date Aug 31, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD ASSEMBLIES WITH CONSTRAINED INTERNAL MOTION AND PROBE SY...
- Publication number 20170212166
- Publication date Jul 27, 2017
- Cascade Microtech, Inc.
- Brandon Liew
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH FIDUCIAL MARKS, PROBE SYSTEMS INCLUDING THE SAME, AND A...
- Publication number 20170205443
- Publication date Jul 20, 2017
- Cascade Microtech, Inc.
- Bryan Conrad Bolt
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT B...
- Publication number 20170146594
- Publication date May 25, 2017
- Cascade Microtech, Inc.
- Peter Douglas Andrews
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REPLACING AN EXISTING CONTACT OF A WAFER PROBING ASSEMBLY
- Publication number 20160334465
- Publication date Nov 17, 2016
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20160195579
- Publication date Jul 7, 2016
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...
- Publication number 20160103153
- Publication date Apr 14, 2016
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING
Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20150301082
- Publication date Oct 22, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- G01 - MEASURING TESTING
Information Patent Application
WAFER-HANDLING END EFFECTORS
- Publication number 20150255322
- Publication date Sep 10, 2015
- Cascade Microtech, Inc.
- Robbie Ingram-Goble
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES
- Publication number 20150241472
- Publication date Aug 27, 2015
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...
- Publication number 20150114925
- Publication date Apr 30, 2015
- Cascade Microtech, Inc.
- Kenneth R. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20150008948
- Publication date Jan 8, 2015
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
- Publication number 20140239991
- Publication date Aug 28, 2014
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST
- Publication number 20140184003
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMP...
- Publication number 20140185649
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Botho Hirschfeld
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSIN...
- Publication number 20140186145
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Frank Fehrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODULAR PROBER AND METHOD FOR OPERATING SAME
- Publication number 20140145743
- Publication date May 29, 2014
- CASCADE MICOTECH, INC.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW...
- Publication number 20140125363
- Publication date May 8, 2014
- Cascade Microtech, Inc.
- Daniel M. Bock
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
87088019 - CONTACT INTELLIGENCE
- Serial number 87088019
- Registration number 5586721
- Filing date Jun 29, 2016
- FORMFACTOR BEAVERTON, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
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- Serial number 86692437
- Registration number 5102901
- Filing date Jul 14, 2015
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
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- Serial number 86389451
- Registration number 4849165
- Filing date Sep 9, 2014
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86389520 - MEASUREONE
- Serial number 86389520
- Registration number 5362231
- Filing date Sep 9, 2014
- CASCADE MICROTECH, INC.
- 35 - Advertising
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- Serial number 86389510
- Registration number 4890246
- Filing date Sep 9, 2014
- CASCADE MICROTECH, INC.
- 35 - Advertising
Information Trademark
85068975
- Serial number 85068975
- Registration number 3963583
- Filing date Jun 22, 2010
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77386910 - NANOSCRUB
- Serial number 77386910
- Registration number 3800032
- Filing date Feb 1, 2008
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78328401 - MONGOOSE
- Serial number 78328401
- Registration number 2986362
- Filing date Nov 14, 2003
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78209622 - FEMTOPROBE
- Serial number 78209622
- Registration number 3242828
- Filing date Jan 31, 2003
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78183356 - INFINITY PROBE
- Serial number 78183356
- Registration number 2773685
- Filing date Nov 8, 2002
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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76249798 - ALESSI
- Serial number 76249798
- Registration number 2594186
- Filing date Apr 30, 2001
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76226872 - SUMMIT
- Serial number 76226872
- Filing date Mar 12, 2001
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76210697 - EYE-PASS
- Serial number 76210697
- Registration number 2580239
- Filing date Feb 13, 2001
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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76152671 - ATTOGUARD
- Serial number 76152671
- Registration number 2517023
- Filing date Oct 23, 2000
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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76132608 - CASCADE MICROTECH
- Serial number 76132608
- Registration number 2509489
- Filing date Sep 20, 2000
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76113829 - INNOVATING TEST TECHNOLOGIES
- Serial number 76113829
- Registration number 2589631
- Filing date Aug 22, 2000
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75774570 - AIR COPLANAR PROBE
- Serial number 75774570
- Registration number 2484363
- Filing date Aug 12, 1999
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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75701095 - PYRAMID PROBE
- Serial number 75701095
- Registration number 2387417
- Filing date May 7, 1999
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75684857 - MICROSCRUB
- Serial number 75684857
- Registration number 2534540
- Filing date Apr 19, 1999
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75480497 - THE ULTIMATE MEASUREMENT MACHINE
- Serial number 75480497
- Filing date May 6, 1998
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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74656281 - FEMTOGUARD
- Serial number 74656281
- Registration number 2002419
- Filing date Mar 31, 1995
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74566586 - AIR COPLANAR PROBE
- Serial number 74566586
- Registration number 1937584
- Filing date Aug 29, 1994
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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74410576 - MICROCHAMBER
- Serial number 74410576
- Registration number 1891995
- Filing date Jul 9, 1993
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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74408793 - FINE-PITCH MICROPROBE
- Serial number 74408793
- Filing date Jul 6, 1993
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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74408794 - EZ-PROBE
- Serial number 74408794
- Registration number 1889191
- Filing date Jul 6, 1993
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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74286229 - MICROPROBE UPDATE
- Serial number 74286229
- Registration number 1755281
- Filing date Jun 19, 1992
- CASCADE MICROTECH, INC.
- 16 - Paper, cardboard and goods made from these materials, not included in other classes
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74137672 - SURROGATE CHIP
- Serial number 74137672
- Registration number 1678341
- Filing date Feb 8, 1991
- CASCADE MICROTECH, INC.
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73783505 - MICROCAT
- Serial number 73783505
- Registration number 1600443
- Filing date Feb 27, 1989
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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73749670 - MICROPROBE UPDATE
- Serial number 73749670
- Registration number 1593651
- Filing date Sep 1, 1988
- CASCADE MICROTECH, INC.
- 16 - Paper, cardboard and goods made from these materials, not included in other classes
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73666858 - CASCADE MICROTECH
- Serial number 73666858
- Registration number 1517049
- Filing date Jun 16, 1987
- CASCADE MICROTECH, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

CASCADE MICROTECH, INC.

Organization

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Wafer-handling end effectors with wafer-contacting surfaces and sea...

Probe head assemblies, components thereof, test systems including t...

Prober for testing devices in a repeat structure on a substrate

Resilient electrical interposers, systems that include the interpos...

Probes with fiducial marks, probe systems including the same, and a...

Shielded probe systems with controlled testing environments

High voltage chuck for a probe station

High voltage chuck for a probe station

Systems and methods for testing electronic devices that include low...

Focusing optical systems and methods for testing semiconductors

Method of replacing an existing contact of a wafer probing assembly

Method for testing a test substrate under defined thermal condition...

Systems and methods for handling substrates at below dew point temp...

Systems and methods for providing wafer access in a wafer processin...

High frequency interconnect structures, electronic assemblies that...

Optically enhanced digital imaging system

Probe head assemblies, components thereof, test systems including t...

Modular prober and method for operating same

Method and device for contacting a row of contact areas with probe...

Resilient electrical interposers, systems that include the interpos...

Resilient electrical interposers, systems that include the interpos...

Method for measurement of a power device

Prober for testing devices in a repeat structure on a substrate

Systems and methods for simultaneous optical testing of a plurality...

Chuck for supporting and retaining a test substrate and a calibrati...

Method for testing a test substrate under defined thermal condition...

Membrane probing method using improved contact

Replaceable coupon for a probing apparatus

Probe holder

Probe station for on-wafer-measurement under EMI-shielding

Patents Applicationslast 30 patents

PROBE STATIONS, PROBE SYSTEMS INCLUDING THE PROBE STATIONS, AND MET...

PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION

CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIAT...

PROBE SYSTEMS AND METHODS

SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS

PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRC...

SYSTEMS AND METHODS FOR ELECTRICALLY TESTING ELECTROMIGRATION IN AN...

HIGH VOLTAGE CHUCK FOR A PROBE STATION

SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, ME...

SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS

PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING O...

TEST STANDARDS AND METHODS FOR IMPEDANCE CALIBRATION OF A PROBE SYS...

PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL

PROBE HEAD ASSEMBLIES WITH CONSTRAINED INTERNAL MOTION AND PROBE SY...

PROBES WITH FIDUCIAL MARKS, PROBE SYSTEMS INCLUDING THE SAME, AND A...

PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT B...

METHOD OF REPLACING AN EXISTING CONTACT OF A WAFER PROBING ASSEMBLY

HIGH VOLTAGE CHUCK FOR A PROBE STATION

PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

WAFER-HANDLING END EFFECTORS

SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES

RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOS...

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...

SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TEST

SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMP...

SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSIN...

MODULAR PROBER AND METHOD FOR OPERATING SAME

SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW...

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