FORTUNE SEMICONDUCTOR CORPORATION

Organization

Taipei Hsien, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Multi-chip module
- Patent number 8,427,840
- Issue date Apr 23, 2013
- Fortune Semiconductor Corporation
- Kuo-Chiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for programming one-time programmable memory of integrated c...
- Patent number 7,440,306
- Issue date Oct 21, 2008
- Fortune Semiconductor Corporation
- Po-Yin Chao
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with self-proofreading function and measuring de...
- Patent number 7,428,474
- Issue date Sep 23, 2008
- Fortune Semiconductor Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for clock calibration
- Patent number 7,200,507
- Issue date Apr 3, 2007
- Fortune Semiconductor Corp.
- Yi-Chang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital power meter apparatus and method for the same
- Patent number 7,166,995
- Issue date Jan 23, 2007
- Fortune Semiconductor Corp.
- Yi-Chou Huang
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
PACKAGING STRUCTURE
- Publication number 20130075880
- Publication date Mar 28, 2013
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGE STRUCTURE
- Publication number 20130075882
- Publication date Mar 28, 2013
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLARITY SWITCH CIRCUIT FOR CHARGER
- Publication number 20120206194
- Publication date Aug 16, 2012
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TEST MODE CONTROLLER AND ELECTRONIC APPARATUS WITH SELF-TESTING THE...
- Publication number 20120182032
- Publication date Jul 19, 2012
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT APPARATUS
- Publication number 20120139569
- Publication date Jun 7, 2012
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHIP MODULE
- Publication number 20120127671
- Publication date May 24, 2012
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT OF POWER MOSFET
- Publication number 20120119305
- Publication date May 17, 2012
- FORTUNE SEMICONDUCTOR CORPORATION
- KUO-CHIANG CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SEAL-RING STRUCTURE AND THE MANUFACTURING METHOD THEREOF
- Publication number 20110233632
- Publication date Sep 29, 2011
- FORTUNE SEMICONDUCTOR CORPORATION
- Kuo-Chiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHIP, SEAL-RING STRUCTURE AND MANUFACTURING PROCESS T...
- Publication number 20110180922
- Publication date Jul 28, 2011
- FORTUNE SEMICONDUCTOR CORPORATION
- Kuo-Chiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fuse repair circuit and its operating method
- Publication number 20070164807
- Publication date Jul 19, 2007
- Fortune Semiconductor Corporation
- Xiao Long Wu
- G11 - INFORMATION STORAGE
Information Patent Application
One-time programmable memory and method of burning data of the same
- Publication number 20070153609
- Publication date Jul 5, 2007
- Fortune Semiconductor Corporation
- Xiao Long Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Temperature compensation apparatus for electronic signal
- Publication number 20070005289
- Publication date Jan 4, 2007
- Fortune Semiconductor Corporation
- Joe Huang
- G01 - MEASURING TESTING
Information Patent Application
High-voltage protection device of coil driving device
- Publication number 20060171087
- Publication date Aug 3, 2006
- Fortune Semiconductor Corporation
- Kevin Chen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

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Trademarklast 30 trademarks

Information Trademark
78955876 - FORTUNE
- Serial number 78955876
- Registration number 3428768
- Filing date Aug 19, 2006
- Fortune Semiconductor Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78950215
- Serial number 78950215
- Registration number 3337412
- Filing date Aug 11, 2006
- Fortune Semiconductor Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76033513
- Serial number 76033513
- Registration number 2441015
- Filing date Apr 25, 2000
- FORTUNE SEMICONDUCTOR CORP.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76033512 - SMARTIA
- Serial number 76033512
- Registration number 2543538
- Filing date Apr 25, 2000
- FORTUNE SEMICONDUCTOR CORP.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

FORTUNE SEMICONDUCTOR CORPORATION

Organization

Patents Grantslast 30 patents

Multi-chip module

Method for programming one-time programmable memory of integrated c...

Integrated circuit with self-proofreading function and measuring de...

Method and device for clock calibration

Digital power meter apparatus and method for the same

Patents Applicationslast 30 patents

PACKAGING STRUCTURE

PACKAGE STRUCTURE

POLARITY SWITCH CIRCUIT FOR CHARGER

TEST MODE CONTROLLER AND ELECTRONIC APPARATUS WITH SELF-TESTING THE...

CIRCUIT APPARATUS

MULTI-CHIP MODULE

LAYOUT OF POWER MOSFET

SEMICONDUCTOR SEAL-RING STRUCTURE AND THE MANUFACTURING METHOD THEREOF

SEMICONDUCTOR CHIP, SEAL-RING STRUCTURE AND MANUFACTURING PROCESS T...

Fuse repair circuit and its operating method

One-time programmable memory and method of burning data of the same

Temperature compensation apparatus for electronic signal

High-voltage protection device of coil driving device

Trademarklast 30 trademarks

78955876 - FORTUNE

78950215

76033513

76033512 - SMARTIA