NEOCERA, INC

Organization

BELTSVILLE, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for contactless high-resolution determination...
- Patent number 11,733,030
- Issue date Aug 22, 2023
- Neocera, LLC
- Mikhail D. Strikovski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for in-situ determination of a chemical compositi...
- Patent number 9,651,369
- Issue date May 16, 2017
- Neocera, LLC
- Mikhail Strikovski
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for localization of open defects in electronic de...
- Patent number 9,529,035
- Issue date Dec 27, 2016
- Neocera, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Grant
DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz...
- Patent number 9,476,951
- Issue date Oct 25, 2016
- Neocera, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method utilizing high power density electron beam for...
- Patent number 7,557,511
- Issue date Jul 7, 2009
- Neocera, LLC
- Mikhail Strikovski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid squid microscope with magnetic flux-guide for high resolutio...
- Patent number 7,262,597
- Issue date Aug 28, 2007
- Neocera, LLC
- Solomon I. Woods
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact heater and method for non-contact heating of a substrat...
- Patent number 7,190,889
- Issue date Mar 13, 2007
- Neocera, LLC
- Mikhail Strikovski
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cylindrical electron beam generating/triggering device and method f...
- Patent number 7,122,949
- Issue date Oct 17, 2006
- Neocera, Inc.
- Mikhail Strikovski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for non-contact measurement of microwave capacita...
- Patent number 7,102,363
- Issue date Sep 5, 2006
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Fault isolation of circuit defects using comparative magnetic field...
- Patent number 7,019,521
- Issue date Mar 28, 2006
- Neocera, Inc.
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Grant
Apertured probes for localized measurements of a material's complex...
- Patent number 6,959,481
- Issue date Nov 1, 2005
- Neocera, Inc.
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-contact measurement of microwave capacita...
- Patent number 6,943,562
- Issue date Sep 13, 2005
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
System and method for quantitative measurements of a material's com...
- Patent number 6,856,140
- Issue date Feb 15, 2005
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Apertured probes for localized measurements of a material's...
- Patent number 6,680,617
- Issue date Jan 20, 2004
- Neocera, Inc.
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Grant
Planetary multi-substrate holder system for material deposition
- Patent number 6,632,282
- Issue date Oct 14, 2003
- Neocera, Inc.
- Kolagani S. Harshavardhan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for localized measurements of complex permittivity of a m...
- Patent number 6,597,185
- Issue date Jul 22, 2003
- Neocera, Inc.
- Vladimir Vladimirovich Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Scanned focus deposition system
- Patent number 6,497,193
- Issue date Dec 24, 2002
- Neocera, Inc.
- Hans M. Christen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Combinatorial synthesis system
- Patent number 6,491,759
- Issue date Dec 10, 2002
- Neocera, Inc.
- Hans M. Christen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Translational target assembly for thin film deposition system
- Patent number 6,090,207
- Issue date Jul 18, 2000
- Neocera, Inc.
- Lee A. Knauss
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Superconducting garnet thin film system
- Patent number 6,074,990
- Issue date Jun 13, 2000
- Neocera, Inc.
- Alberto Pique
- C30 - CRYSTAL GROWTH
Information Patent Grant
Non-linear optical thin film layer system
- Patent number 5,993,544
- Issue date Nov 30, 1999
- Neocera, Inc.
- Lee A. Knauss
- G02 - OPTICS
Information Patent Grant
Scanning laser beam delivery system
- Patent number 5,654,975
- Issue date Aug 5, 1997
- Neocera, Inc.
- Steven Green
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Superconducting thin film system using a garnet substrate
- Patent number 5,635,453
- Issue date Jun 3, 1997
- Neocera, Inc.
- Alberto Pique
- C30 - CRYSTAL GROWTH
Information Patent Grant
Superconducting films on alkaline earth fluoride substrates with mu...
- Patent number 5,472,510
- Issue date Dec 5, 1995
- Neocera, Inc.
- Kolagani S. Harshavardhan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed laser passive filter deposition system
- Patent number 5,458,686
- Issue date Oct 17, 1995
- Neocera, Inc.
- Alberto Pique
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Superconducting films on alkaline earth fluoride substrate with mul...
- Patent number 5,420,102
- Issue date May 30, 1995
- Neocera, Inc.
- Kolagani S. Harshavardhan
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR CONTACTLESS HIGH-RESOLUTION DETERMINATION...
- Publication number 20220042787
- Publication date Feb 10, 2022
- NEOCERA, LLC
- MIKHAIL D. STRIKOVSKI
- G01 - MEASURING TESTING
Information Patent Application
DC SQUID BASED RF MAGNETOMETER OPERATING AT A BANDWIDTH OF 200 MHZ...
- Publication number 20140249033
- Publication date Sep 4, 2014
- NEOCERA, LLC
- Antonio Orozco
- G01 - MEASURING TESTING
Information Patent Application
PULSED LASER DEPOSITION OF HIGH QUALITY PHOTOLUMINESCENT GaN FILMS
- Publication number 20110027928
- Publication date Feb 3, 2011
- NEOCERA, LLC
- JEONGGOO KIM
- C30 - CRYSTAL GROWTH
Information Patent Application
SUBSTRATE HEATER FOR MATERIAL DEPOSITION
- Publication number 20090078202
- Publication date Mar 26, 2009
- NEOCERA, LLC
- Mikhail Strikovski
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Scanned focus deposition system
- Publication number 20040079281
- Publication date Apr 29, 2004
- NEOCERA, INC.
- Hans M. Christen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

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Trademarklast 30 trademarks

Information Trademark
75673942 - EPSCAN
- Serial number 75673942
- Filing date Mar 30, 1999
- NEOCERA, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75665444 - MAGMA
- Serial number 75665444
- Registration number 2329234
- Filing date Mar 22, 1999
- NEOCERA, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75066689 - ON TARGET
- Serial number 75066689
- Filing date Mar 4, 1996
- NEOCERA, INC.
- 16 - Paper, cardboard and goods made from these materials, not included in other classes
Information Trademark
75066688 - NEOCERA, INC.
- Serial number 75066688
- Registration number 2088810
- Filing date Mar 4, 1996
- NEOCERA, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74303780 - NEOCERA, INC.
- Serial number 74303780
- Filing date Aug 13, 1992
- NEOCERA, INC.
- 1 - Chemicals used in industry, science and photography, as well as in agriculture, horticulture and forestry

NSF Awardslast 12 months

processing...

Count: 11

NSF Awards

Information NSF Award
SBIR Phase II: Fault Isolation of Open Circuits in Semiconductor Pr...
- Award Id 0924610
- Effective date Sep 15, 2009
Information NSF Award
SBIR Phase I: Fault Isolation of Open Circuits in Semiconductor Pro...
- Award Id 0810388
- Effective date Jul 1, 2008
Information NSF Award
STTR Phase I: Scanning Magnetic Microscope using a Ferromagnetic Fl...
- Award Id 0638011
- Effective date Jan 1, 2007
Information NSF Award
SBIR Phase I: Improvements in Reliability of Semiconductor Products...
- Award Id 0539355
- Effective date Jan 1, 2006
Information NSF Award
SBIR Phase I: Scanning Magnetic Microscope Using a Tapered Magnetor...
- Award Id 0512767
- Effective date Jul 1, 2005
Information NSF Award
SBIR Phase I: Nanoscale Heterostructures via a Combinatorial Approach
- Award Id 0060706
- Effective date Feb 1, 2001
Information NSF Award
SBIR Phase II: Improvement of Spatial Resolution in Scanning Microw...
- Award Id 0078486
- Effective date Jun 1, 2000
Information NSF Award
SBIR Phase I: Improvement of Spatial Resolution in Scanning Microwa...
- Award Id 9861455
- Effective date Jan 1, 1999
Information NSF Award
SBIR PHASE II: High Temperature Superconducting Materials Developme...
- Award Id 9710717
- Effective date Mar 1, 1998
Information NSF Award
SBIR Phase I: High Temperature Superconducting Materials Developmen...
- Award Id 9560360
- Effective date Apr 1, 1996
Information NSF Award
SBIR PHASE I: Nonlinear Optical Films on GaAs for Integrated Optics
- Award Id 9560358
- Effective date Mar 1, 1996

NEOCERA, INC

Organization

Patents Grantslast 30 patents

Method and apparatus for contactless high-resolution determination...

Method and system for in-situ determination of a chemical compositi...

Method and system for localization of open defects in electronic de...

DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz...

Apparatus and method utilizing high power density electron beam for...

Hybrid squid microscope with magnetic flux-guide for high resolutio...

Non-contact heater and method for non-contact heating of a substrat...

Cylindrical electron beam generating/triggering device and method f...

Method and system for non-contact measurement of microwave capacita...

Fault isolation of circuit defects using comparative magnetic field...

Apertured probes for localized measurements of a material's complex...

Method and system for non-contact measurement of microwave capacita...

System and method for quantitative measurements of a material's com...

Apertured probes for localized measurements of a material&#x00027;s...

Planetary multi-substrate holder system for material deposition

Apparatus for localized measurements of complex permittivity of a m...

Scanned focus deposition system

Combinatorial synthesis system

Translational target assembly for thin film deposition system

Superconducting garnet thin film system

Non-linear optical thin film layer system

Scanning laser beam delivery system

Superconducting thin film system using a garnet substrate

Superconducting films on alkaline earth fluoride substrates with mu...

Pulsed laser passive filter deposition system

Superconducting films on alkaline earth fluoride substrate with mul...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR CONTACTLESS HIGH-RESOLUTION DETERMINATION...

DC SQUID BASED RF MAGNETOMETER OPERATING AT A BANDWIDTH OF 200 MHZ...

PULSED LASER DEPOSITION OF HIGH QUALITY PHOTOLUMINESCENT GaN FILMS

SUBSTRATE HEATER FOR MATERIAL DEPOSITION

Scanned focus deposition system

Trademarklast 30 trademarks

75673942 - EPSCAN

75665444 - MAGMA

75066689 - ON TARGET

75066688 - NEOCERA, INC.

74303780 - NEOCERA, INC.

NSF Awardslast 12 months

NSF Awards

SBIR Phase II: Fault Isolation of Open Circuits in Semiconductor Pr...

SBIR Phase I: Fault Isolation of Open Circuits in Semiconductor Pro...

STTR Phase I: Scanning Magnetic Microscope using a Ferromagnetic Fl...

SBIR Phase I: Improvements in Reliability of Semiconductor Products...

SBIR Phase I: Scanning Magnetic Microscope Using a Tapered Magnetor...

SBIR Phase I: Nanoscale Heterostructures via a Combinatorial Approach

SBIR Phase II: Improvement of Spatial Resolution in Scanning Microw...

SBIR Phase I: Improvement of Spatial Resolution in Scanning Microwa...

SBIR PHASE II: High Temperature Superconducting Materials Developme...

SBIR Phase I: High Temperature Superconducting Materials Developmen...

SBIR PHASE I: Nonlinear Optical Films on GaAs for Integrated Optics

Apertured probes for localized measurements of a material's...