QC Solutions, Inc.

Organization

North Billerica, MA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method of measuring defects in an ion implanted wafer...
- Patent number 7,403,023
- Issue date Jul 22, 2008
- QC Solutions, Inc.
- Kenneth Steeples
- G01 - MEASURING TESTING
Information Patent Grant
Methods for integrated implant monitoring
- Patent number 7,160,742
- Issue date Jan 9, 2007
- QC Solutions, Inc.
- Kenneth Steeples
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time in-line testing of semiconductor wafers
- Patent number 7,119,569
- Issue date Oct 10, 2006
- QC Solutions, Inc.
- Kenneth Steeples
- G01 - MEASURING TESTING
Information Patent Grant
Real-time in-line testing of semiconductor wafers
- Patent number 6,967,490
- Issue date Nov 22, 2005
- QC Solutions, Inc.
- Emil Kamieniecki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time in-line testing of semiconductor wafers
- Patent number 6,924,657
- Issue date Aug 2, 2005
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Real-time in-line testing of semiconductor wafers
- Patent number 6,911,350
- Issue date Jun 28, 2005
- QC Solutions, Inc.
- Edward Tsidilkovski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time in-line testing of semiconductor wafers
- Patent number 6,909,302
- Issue date Jun 21, 2005
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for rapid photo-thermal surfaces treatment
- Patent number 6,803,588
- Issue date Oct 12, 2004
- QC Solutions, Inc.
- Emil Kamieniecki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for simulating a surface photo-voltage in a su...
- Patent number 6,388,455
- Issue date May 14, 2002
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for rapid photo-thermal surface treatment
- Patent number 6,325,078
- Issue date Dec 4, 2001
- QC Solutions, Inc.,
- Emil Kamieniecki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for real-time in-line testing of semiconductor wafers
- Patent number 6,315,574
- Issue date Nov 13, 2001
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Method for real-time in-line testing of semiconductor wafers
- Patent number 6,069,017
- Issue date May 30, 2000
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Real-time in-line testing of semiconductor wafers
- Patent number 5,661,408
- Issue date Aug 26, 1997
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Methods for monitoring ion implant process in bond and cleave, sili...
- Publication number 20080182347
- Publication date Jul 31, 2008
- QC Solutions, Inc.
- Kenneth Steeples
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for silicon-on-insulator material characteriza...
- Publication number 20080048636
- Publication date Feb 28, 2008
- QC Solutions, Inc.
- Edward Tsidilkovski
- G01 - MEASURING TESTING
Information Patent Application
Probes and methods for semiconductor wafer analysis
- Publication number 20080036464
- Publication date Feb 14, 2008
- QC Solutions, Inc.
- Kenneth Steeples
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for forming an oxide layer on semiconductors
- Publication number 20080020549
- Publication date Jan 24, 2008
- QC Solutions, Inc.
- Edward Tsidilkovski
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor wafer metrology apparatus and methods
- Publication number 20060279311
- Publication date Dec 14, 2006
- QC Solutions, Inc.
- Kenneth Steeples
- G01 - MEASURING TESTING
Information Patent Application
Integrated implant monitor for closed loop control
- Publication number 20050074909
- Publication date Apr 7, 2005
- QC Solutions, Inc.
- Kenneth Steeples
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Real-time in-line testing of semiconductor wafers
- Publication number 20040191936
- Publication date Sep 30, 2004
- QC Solutions, Inc.
- Edward Tsidilkovski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Real-time in-line testing of semiconductor wafers
- Publication number 20040046585
- Publication date Mar 11, 2004
- QC Solutions, Inc.
- Emil Kamieniecki
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
76221211 - QC SOLUTIONS
- Serial number 76221211
- Filing date Mar 7, 2001
- QC Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76221212 - QC SOLUTIONS
- Serial number 76221212
- Filing date Mar 7, 2001
- QC Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75618753 - ROST
- Serial number 75618753
- Registration number 2404919
- Filing date Jan 11, 1999
- QC Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75297281 - QC SOLUTIONS
- Serial number 75297281
- Registration number 2167519
- Filing date May 23, 1997
- QC Solutions, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

QC Solutions, Inc.

Organization

Patents Grantslast 30 patents

Apparatus and method of measuring defects in an ion implanted wafer...

Methods for integrated implant monitoring

Real-time in-line testing of semiconductor wafers

Real-time in-line testing of semiconductor wafers

Real-time in-line testing of semiconductor wafers

Real-time in-line testing of semiconductor wafers

Real-time in-line testing of semiconductor wafers

Apparatus and method for rapid photo-thermal surfaces treatment

Method and apparatus for simulating a surface photo-voltage in a su...

Apparatus and method for rapid photo-thermal surface treatment

Method for real-time in-line testing of semiconductor wafers

Method for real-time in-line testing of semiconductor wafers

Real-time in-line testing of semiconductor wafers

Patents Applicationslast 30 patents

Methods for monitoring ion implant process in bond and cleave, sili...

Method and apparatus for silicon-on-insulator material characteriza...

Probes and methods for semiconductor wafer analysis

Method and apparatus for forming an oxide layer on semiconductors

Semiconductor wafer metrology apparatus and methods

Integrated implant monitor for closed loop control

Real-time in-line testing of semiconductor wafers

Real-time in-line testing of semiconductor wafers

Trademarklast 30 trademarks

76221211 - QC SOLUTIONS

76221212 - QC SOLUTIONS

75618753 - ROST

75297281 - QC SOLUTIONS