SI-WARE SYSTEMS INC.

Organization

Cairo, EG

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Integrated device for fluid analysis
- Patent number 12,228,510
- Issue date Feb 18, 2025
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Large spot size spectrometer
- Patent number 12,163,833
- Issue date Dec 10, 2024
- Si-Ware Systems
- Mohamed Sadek Radwan
- G01 - MEASURING TESTING
Information Patent Grant
Compact spectral analyzer
- Patent number 12,061,116
- Issue date Aug 13, 2024
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Optical fluid analyzer
- Patent number 12,031,904
- Issue date Jul 9, 2024
- Si-Ware Systems
- Momen Anwar
- G01 - MEASURING TESTING
Information Patent Grant
Integrated evanescent wave spectral sensing device
- Patent number 11,953,377
- Issue date Apr 9, 2024
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Compact material analyzer
- Patent number 11,841,268
- Issue date Dec 12, 2023
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Selective step coverage for micro-fabricated structures
- Patent number 11,499,218
- Issue date Nov 15, 2022
- Si-Ware Systems
- Mostafa Medhat
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Increased spectrometer field of view
- Patent number 11,385,100
- Issue date Jul 12, 2022
- Si-Ware Systems
- Mohamed Ahmed Sadek
- G01 - MEASURING TESTING
Information Patent Grant
Compact multi-pass gas cell for multi-gas spectral sensors
- Patent number 11,150,130
- Issue date Oct 19, 2021
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Self-referenced spectrometer
- Patent number 11,085,825
- Issue date Aug 10, 2021
- Si-Ware Systems
- Mostafa Medhat
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optical probe card and system for batch testing of optic...
- Patent number 10,782,342
- Issue date Sep 22, 2020
- Si-Ware Systems
- Bassam Saadany
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Selective step coverage for micro-fabricated structures
- Patent number 10,562,055
- Issue date Feb 18, 2020
- Si-Ware Systems
- Mostafa Medhat
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micro-optical bench device with highly/selectively-controlled optic...
- Patent number 10,120,134
- Issue date Nov 6, 2018
- Si-Ware Systems
- Bassam Saadany
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated spectral unit
- Patent number 10,060,791
- Issue date Aug 28, 2018
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
High performance parallel spectrometer device
- Patent number 9,970,819
- Issue date May 15, 2018
- Si-Ware Systems
- Diaa Khalil
- G01 - MEASURING TESTING
Information Patent Grant
Structured silicon-based thermal emitter
- Patent number 9,793,478
- Issue date Oct 17, 2017
- Si-Ware Systems
- Yasser M. Sabry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self calibration for mirror positioning in optical MEMS interferome...
- Patent number 9,658,053
- Issue date May 23, 2017
- Si-Ware Systems
- Mostafa Medhat
- G02 - OPTICS
Information Patent Grant
Self calibration for mirror positioning in optical MEMS interferome...
- Patent number 9,658,107
- Issue date May 23, 2017
- Si-Ware Systems
- Momen Anwar
- G02 - OPTICS
Information Patent Grant
MEMS based ring laser gyroscope with reduced lock-in
- Patent number 9,574,880
- Issue date Feb 21, 2017
- King Abdulaziz City for Science and Technology
- Diaa A. M. Khalil
- G01 - MEASURING TESTING
Information Patent Grant
Integrated apertured micromirror and applications thereof
- Patent number 9,557,556
- Issue date Jan 31, 2017
- Si-Ware Systems
- Yasser M. Sabry
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Ring mirror optical rotation sensor
- Patent number 9,476,713
- Issue date Oct 25, 2016
- King Abdulaziz City for Science and Technology
- Mohamed Yehia Shalaby
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform micro spectrometer based on spatially-shifted int...
- Patent number 9,429,474
- Issue date Aug 30, 2016
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Single insertion trimming of highly accurate reference oscillators
- Patent number 9,281,823
- Issue date Mar 8, 2016
- Si-Ware Systems
- Ahmed Elkholy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Aspherical optical surfaces and optical scanners
- Patent number 9,158,109
- Issue date Oct 13, 2015
- Si-Ware Systems
- Yasser M. Sabry
- G02 - OPTICS
Information Patent Grant
Integrated monolithic optical bench containing 3-D curved optical e...
- Patent number 9,046,690
- Issue date Jun 2, 2015
- Si-Ware Systems
- Yasser M. Sabry
- G02 - OPTICS
Information Patent Grant
Interface for MEMS inertial sensors
- Patent number 9,013,233
- Issue date Apr 21, 2015
- Si-Ware Systems
- Ahmed Elmallah
- G01 - MEASURING TESTING
Information Patent Grant
Spatial splitting-based optical MEMS interferometers
- Patent number 8,922,787
- Issue date Dec 30, 2014
- Si-Ware Systems
- Bassem Mortada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to control the LC tank temperature null charac...
- Patent number 8,884,718
- Issue date Nov 11, 2014
- Si-Ware Systems
- Nabil M. Sinoussi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic compensation of capacitive micro-machined sensors parasi...
- Patent number 8,872,683
- Issue date Oct 28, 2014
- Si-Ware Systems
- Ayman Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Technique to determine mirror position in optical interferometers
- Patent number 8,873,125
- Issue date Oct 28, 2014
- Si-Ware Systems
- Bassam A. Saadany
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIFFUSE MULTI-REFLECTION OPTICAL DEVICE WITH LIGHT RE-DIRECTION FOR...
- Publication number 20240077419
- Publication date Mar 7, 2024
- SI-WARE SYSTEMS
- Mohamed Sadek Radwan
- G01 - MEASURING TESTING
Information Patent Application
OPTO-ELECTRICAL PROBE CARD PLATFORM FOR WAFER-LEVEL TESTING OF OPTI...
- Publication number 20230393173
- Publication date Dec 7, 2023
- SI-WARE SYSTEMS
- Tarek Mohamed Zeinah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERALIZED ARTIFICIAL INTELLIGENCE MODELER FOR ULTRA-WIDE-SCALE DE...
- Publication number 20230304860
- Publication date Sep 28, 2023
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-LINE COMPENSATION OF INSTRUMENTAL RESPONSE DRIFT IN MINIATURIZED...
- Publication number 20230152216
- Publication date May 18, 2023
- SI-WARE SYSTEMS
- Bassem Mortada
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD OPTICAL SPECTROSCOPY SCANNER
- Publication number 20230076993
- Publication date Mar 9, 2023
- SI-WARE SYSTEMS
- Botros George Iskander Shenouda
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SPECTRAL ANALYZER
- Publication number 20230036551
- Publication date Feb 2, 2023
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
SELF-CALIBRATED SPECTROSCOPIC AND AI-BASED GAS ANALYZER
- Publication number 20230014558
- Publication date Jan 19, 2023
- SI-WARE SYSTEMS
- Yasser M. Sabry
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMPACT SPECTROSCOPIC ANALYZER DEVICE
- Publication number 20220404361
- Publication date Dec 22, 2022
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FLUID ANALYZER
- Publication number 20220397518
- Publication date Dec 15, 2022
- SI-WARE SYSTEMS
- Momen Anwar
- G01 - MEASURING TESTING
Information Patent Application
MASS SCREENING BIOLOGICAL DETECTION SOLUTIONS
- Publication number 20220397458
- Publication date Dec 15, 2022
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED EVANESCENT WAVE SPECTRAL SENSING DEVICE
- Publication number 20220260419
- Publication date Aug 18, 2022
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
COMPACT MATERIAL ANALYZER
- Publication number 20220244101
- Publication date Aug 4, 2022
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G02 - OPTICS
Information Patent Application
INCREASED SPECTROMETER FIELD OF VIEW
- Publication number 20210018365
- Publication date Jan 21, 2021
- SI-WARE SYSTEMS
- Mohamed Ahmed Sadek
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED DEVICE FOR FLUID ANALYSIS
- Publication number 20200378892
- Publication date Dec 3, 2020
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
COMPACT MULTI-PASS GAS CELL FOR MULTI-GAS SPECTRAL SENSORS
- Publication number 20200284654
- Publication date Sep 10, 2020
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES
- Publication number 20200130006
- Publication date Apr 30, 2020
- SI-WARE SYSTEMS
- Mostafa Medhat
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SELF-REFERENCED SPECTROMETER
- Publication number 20190301939
- Publication date Oct 3, 2019
- SI-WARE SYSTEMS
- Mostafa Medhat
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...
- Publication number 20180143245
- Publication date May 24, 2018
- SI-WARE SYSTEMS
- Bassam Saadany
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INTEGRATED SPECTRAL UNIT
- Publication number 20170363469
- Publication date Dec 21, 2017
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED SILICON-BASED THERMAL EMITTER
- Publication number 20170012199
- Publication date Jan 12, 2017
- SI-WARE SYSTEMS
- Yasser M. Sabry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PERFORMANCE PARALLEL SPECTROMETER DEVICE
- Publication number 20160282184
- Publication date Sep 29, 2016
- SI-WARE SYSTEMS
- Diaa Khalil
- G01 - MEASURING TESTING
Information Patent Application
MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTIC...
- Publication number 20160246002
- Publication date Aug 25, 2016
- SI-WARE SYSTEMS
- Bassam Saadany
- G02 - OPTICS
Information Patent Application
SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES
- Publication number 20160246010
- Publication date Aug 25, 2016
- SI-WARE SYSTEMS
- Mostafa Medhat
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Single insertion trimming of highly accurate reference oscillators
- Publication number 20160241248
- Publication date Aug 18, 2016
- Si-Ware Systems
- Ahmed Elkholy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROME...
- Publication number 20160231172
- Publication date Aug 11, 2016
- SI-WARE SYSTEMS
- Mostafa Medhat
- G02 - OPTICS
Information Patent Application
Ring Mirror Optical Rotation Sensor
- Publication number 20150070706
- Publication date Mar 12, 2015
- KING ABDULAZIZ CITY FOR SCIENCE AND TECHNOLOGY
- Mohamed Yehia Shalaby
- G01 - MEASURING TESTING
Information Patent Application
MEMS BASED SWEPT LASER SOURCE
- Publication number 20150010026
- Publication date Jan 8, 2015
- SI-WARE SYSTEMS
- Bassam A. Saadany
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Apertured Micromirror and Applications Thereof
- Publication number 20140268174
- Publication date Sep 18, 2014
- SI-WARE SYSTEMS
- Yasser M. Sabry
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ELECTRONIC COMPENSATION OF CAPACITIVE MICRO-MACHINED SENSORS PARASI...
- Publication number 20140240156
- Publication date Aug 28, 2014
- Si-Ware Systems
- Ayman Ismail
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Single insertion trimming of highly accurate reference oscillators
- Publication number 20140232475
- Publication date Aug 21, 2014
- Si-Ware Systems
- Ahmed Elkholy
- H03 - BASIC ELECTRONIC CIRCUITRY

SI-WARE SYSTEMS INC.

Organization

Patents Grantslast 30 patents

Integrated device for fluid analysis

Large spot size spectrometer

Compact spectral analyzer

Optical fluid analyzer

Integrated evanescent wave spectral sensing device

Compact material analyzer

Selective step coverage for micro-fabricated structures

Increased spectrometer field of view

Compact multi-pass gas cell for multi-gas spectral sensors

Self-referenced spectrometer

Integrated optical probe card and system for batch testing of optic...

Selective step coverage for micro-fabricated structures

Micro-optical bench device with highly/selectively-controlled optic...

Integrated spectral unit

High performance parallel spectrometer device

Structured silicon-based thermal emitter

Self calibration for mirror positioning in optical MEMS interferome...

Self calibration for mirror positioning in optical MEMS interferome...

MEMS based ring laser gyroscope with reduced lock-in

Integrated apertured micromirror and applications thereof

Ring mirror optical rotation sensor

Fourier transform micro spectrometer based on spatially-shifted int...

Single insertion trimming of highly accurate reference oscillators

Aspherical optical surfaces and optical scanners

Integrated monolithic optical bench containing 3-D curved optical e...

Interface for MEMS inertial sensors

Spatial splitting-based optical MEMS interferometers

Method and apparatus to control the LC tank temperature null charac...

Electronic compensation of capacitive micro-machined sensors parasi...

Technique to determine mirror position in optical interferometers

Patents Applicationslast 30 patents

DIFFUSE MULTI-REFLECTION OPTICAL DEVICE WITH LIGHT RE-DIRECTION FOR...

OPTO-ELECTRICAL PROBE CARD PLATFORM FOR WAFER-LEVEL TESTING OF OPTI...

GENERALIZED ARTIFICIAL INTELLIGENCE MODELER FOR ULTRA-WIDE-SCALE DE...

ON-LINE COMPENSATION OF INSTRUMENTAL RESPONSE DRIFT IN MINIATURIZED...

HANDHELD OPTICAL SPECTROSCOPY SCANNER

COMPACT SPECTRAL ANALYZER

SELF-CALIBRATED SPECTROSCOPIC AND AI-BASED GAS ANALYZER

COMPACT SPECTROSCOPIC ANALYZER DEVICE

OPTICAL FLUID ANALYZER

MASS SCREENING BIOLOGICAL DETECTION SOLUTIONS

INTEGRATED EVANESCENT WAVE SPECTRAL SENSING DEVICE

COMPACT MATERIAL ANALYZER

INCREASED SPECTROMETER FIELD OF VIEW

INTEGRATED DEVICE FOR FLUID ANALYSIS

COMPACT MULTI-PASS GAS CELL FOR MULTI-GAS SPECTRAL SENSORS

SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES

SELF-REFERENCED SPECTROMETER

INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...

INTEGRATED SPECTRAL UNIT

STRUCTURED SILICON-BASED THERMAL EMITTER

HIGH PERFORMANCE PARALLEL SPECTROMETER DEVICE

MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTIC...

SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES

Single insertion trimming of highly accurate reference oscillators

SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROME...

Ring Mirror Optical Rotation Sensor

MEMS BASED SWEPT LASER SOURCE

Integrated Apertured Micromirror and Applications Thereof

ELECTRONIC COMPENSATION OF CAPACITIVE MICRO-MACHINED SENSORS PARASI...

Single insertion trimming of highly accurate reference oscillators

Trademarklast 30 trademarks