SUSS MicroTec Test Systems GmbH

Organization

Sacka, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,859,278
- Issue date Dec 28, 2010
- SUSS MicroTec Test Systems GmbH
- Dietmar Runge
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer having more...
- Patent number 7,768,271
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer
- Patent number 7,769,555
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing magnetically sensitive components
- Patent number 7,741,860
- Issue date Jun 22, 2010
- SUSS MicroTec Test Systems GmbH
- Sebastian Giessmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and arrangement for positioning a probe card
- Patent number 7,733,108
- Issue date Jun 8, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing electronic components within horiz...
- Patent number 7,659,743
- Issue date Feb 9, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,579,849
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station and method for measurements of semiconductor devices...
- Patent number 7,579,854
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jörg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe receptacle for mounting a probe for testing semiconductor com...
- Patent number 7,560,942
- Issue date Jul 14, 2009
- SUSS MicroTec Test Systems GmbH
- Hans-Jurgen Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Adapter for positioning of contact tips
- Patent number 7,463,044
- Issue date Dec 9, 2008
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Grant
Test probe for high-frequency measurement
- Patent number 7,332,923
- Issue date Feb 19, 2008
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing thin elements
- Patent number 7,282,930
- Issue date Oct 16, 2007
- SUSS MicroTec Test Systems GmbH
- Uwe Beier
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reproduction of a calibration position of an aligned...
- Patent number 7,265,536
- Issue date Sep 4, 2007
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station comprising a bellows with EMI shielding capabilities
- Patent number 7,235,990
- Issue date Jun 26, 2007
- SUSS MicroTec Test Systems GmbH
- Stefan Kreissig
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method for carrying out multiport measurements on semic...
- Patent number 7,130,756
- Issue date Oct 31, 2006
- SUSS MicroTec Test System GmbH
- Holger Heuermann
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
- Publication number 20110013011
- Publication date Jan 20, 2011
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
PROBE HOLDER
- Publication number 20100294053
- Publication date Nov 25, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20100289511
- Publication date Nov 18, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS
- Publication number 20100106439
- Publication date Apr 29, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
- Publication number 20100045264
- Publication date Feb 25, 2010
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...
- Publication number 20100045265
- Publication date Feb 25, 2010
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL
- Publication number 20100029022
- Publication date Feb 4, 2010
- SUSS MicroTec Test Systems GmbH
- Frank FEHRMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ASSEMBLING SEVERAL SEMICONDUCTOR DEVICES O...
- Publication number 20100011569
- Publication date Jan 21, 2010
- SUSS MicroTec Test Systems GmbH
- Claus DIETRICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COM...
- Publication number 20090314051
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Victar KHUTKO
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20090315581
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Andrej RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20090179658
- Publication date Jul 16, 2009
- SUSS MicroTec Test Systems GmbH
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090085595
- Publication date Apr 2, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING COMPONENTS
- Publication number 20090058442
- Publication date Mar 5, 2009
- SUSS MicroTec Test Systems GmbH
- Sebastian GIESSMANN
- G01 - MEASURING TESTING
Information Patent Application
MICROMANIPULATOR FOR MOVING A PROBE
- Publication number 20090049944
- Publication date Feb 26, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090021275
- Publication date Jan 22, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
- Publication number 20080315903
- Publication date Dec 25, 2008
- SUSS MicroTec Test Systems GmbH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
Method For Increasing The Accuracy Of The Positioning Of A First Ob...
- Publication number 20080298671
- Publication date Dec 4, 2008
- SUSS MicroTec Testsystems (GmbH)
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROL OF A POSITIONING DEVICE
- Publication number 20080284457
- Publication date Nov 20, 2008
- SUSS MicroTec Test Systems GmbH
- Ulf HACKIUS
- G01 - MEASURING TESTING
Information Patent Application
Process for Measuring the Impedance of Electronic Circuits
- Publication number 20080281537
- Publication date Nov 13, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
CHUCK WITH TRIAXIAL CONSTRUCTION
- Publication number 20080224426
- Publication date Sep 18, 2008
- SUSS MicroTec Test Systems GmbH
- Michael TEICH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING MEASUREMENT ERRORS IN SCATTERING PARAMETER M...
- Publication number 20080195344
- Publication date Aug 14, 2008
- SUSS MicroTec Test Systems GmbH
- Holger HEUERMANN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR RAPIDLY CHANGING OBJECTIVES WITH THE AID OF THREADED FAS...
- Publication number 20080186602
- Publication date Aug 7, 2008
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS AND TEST APPARATUS FOR CAR...
- Publication number 20080180119
- Publication date Jul 31, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan KANEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE CORRECTION OF DEFECTIVE SOLDER BUMP AR...
- Publication number 20080173697
- Publication date Jul 24, 2008
- SUSS MicroTec Test Systems GmbH
- Enrico Herz
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
- Publication number 20080158664
- Publication date Jul 3, 2008
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER
- Publication number 20080125999
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...
- Publication number 20080122451
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122465
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Dietmar RUNGE
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122468
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING

SUSS MicroTec Test Systems GmbH

Organization

Patents Grantslast 30 patents

Probe holder for a probe for testing semiconductor components

Method for calibration of a vectorial network analyzer having more...

Method for calibration of a vectorial network analyzer

Prober for testing magnetically sensitive components

Method and arrangement for positioning a probe card

Method and apparatus for testing electronic components within horiz...

Probe support with shield for the examination of test substrates un...

Probe holder for a probe for testing semiconductor components

Probe station and method for measurements of semiconductor devices...

Probe receptacle for mounting a probe for testing semiconductor com...

Adapter for positioning of contact tips

Test probe for high-frequency measurement

Device for testing thin elements

Procedure for reproduction of a calibration position of an aligned...

Probe station comprising a bellows with EMI shielding capabilities

Calibration method for carrying out multiport measurements on semic...

Patents Applicationslast 30 patents

ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...

PROBE HOLDER

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS

PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL

METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...

METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL

APPARATUS AND METHOD FOR ASSEMBLING SEVERAL SEMICONDUCTOR DEVICES O...

METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COM...

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

PROBER FOR TESTING COMPONENTS

MICROMANIPULATOR FOR MOVING A PROBE

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

Method For Increasing The Accuracy Of The Positioning Of A First Ob...

METHOD AND APPARATUS FOR CONTROL OF A POSITIONING DEVICE

Process for Measuring the Impedance of Electronic Circuits

CHUCK WITH TRIAXIAL CONSTRUCTION

METHOD FOR DETERMINING MEASUREMENT ERRORS IN SCATTERING PARAMETER M...

DEVICE FOR RAPIDLY CHANGING OBJECTIVES WITH THE AID OF THREADED FAS...

METHOD FOR TESTING ELECTRONIC COMPONENTS AND TEST APPARATUS FOR CAR...

METHOD AND APPARATUS FOR THE CORRECTION OF DEFECTIVE SOLDER BUMP AR...

ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER

METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER

METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...