TESEDA CORPORATION

Organization

PORTLAND, OR, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Diagnosing failing scan chains in a semiconductor integrated circuit
- Patent number 10,768,231
- Issue date Sep 8, 2020
- Teseda Corporation
- Theodore Clifton Bernard
- G01 - MEASURING TESTING
Information Patent Grant
Detecting and locating shoot-through timing failures in a semicondu...
- Patent number 10,247,777
- Issue date Apr 2, 2019
- Teseda Corporation
- Theodore Clifton Bernard
- G01 - MEASURING TESTING
Information Patent Grant
Field triage of EOS failures in semiconductor devices
- Patent number 9,939,488
- Issue date Apr 10, 2018
- Teseda Corporation
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Grant
Suspect logical region synthesis from device design and test inform...
- Patent number 9,659,136
- Issue date May 23, 2017
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Correlation of device manufacturing defect data with device electri...
- Patent number 8,918,753
- Issue date Dec 23, 2014
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Electrical characterization for a semiconductor device pin
- Patent number 8,907,697
- Issue date Dec 9, 2014
- Teseda Corporation
- Jack Frost
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,892,972
- Issue date Nov 18, 2014
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Secure test-for-yield chip diagnostics management system and method
- Patent number 8,626,460
- Issue date Jan 7, 2014
- Teseda Corporation
- Bruce Kaufman
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,560,904
- Issue date Oct 15, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Correlation of device manufacturing defect data with device electri...
- Patent number 8,539,389
- Issue date Sep 17, 2013
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Suspect logical region synthesis and simulation using device design...
- Patent number 8,453,088
- Issue date May 28, 2013
- Teseda Corporation
- Armagan Akar
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,412,991
- Issue date Apr 2, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Single board DFT integrated circuit tester
- Patent number 7,036,062
- Issue date Apr 25, 2006
- Teseda Corporation
- Steven R. Morris
- G01 - MEASURING TESTING
Information Patent Grant
Tester architecture for testing semiconductor integrated circuits
- Patent number 6,956,394
- Issue date Oct 18, 2005
- Teseda Corporation
- Ajit M. Limaye
- G01 - MEASURING TESTING
Information Patent Grant
Scan test viewing and analysis tool
- Patent number 6,925,406
- Issue date Aug 2, 2005
- Teseda Corporation
- David S. Kellerman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTING AND LOCATING SHOOT-THROUGH TIMING FAILURES IN A SEMICONDU...
- Publication number 20190178935
- Publication date Jun 13, 2019
- TESEDA CORPORATION
- Theodore Clifton Bernard
- G01 - MEASURING TESTING
Information Patent Application
FIELD TRIAGE OF EOS FAILURES IN SEMICONDUCTOR DEVICES
- Publication number 20150149106
- Publication date May 28, 2015
- TESEDA CORPORATION
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20140115412
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
Correlation of Device Manufacturing Defect Data with Device Electri...
- Publication number 20140115551
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Armagan Akar
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20130219237
- Publication date Aug 22, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain Fault Diagnosis
- Publication number 20130061103
- Publication date Mar 7, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
Electrical Characterization for a Semiconductor Device Pin
- Publication number 20130049790
- Publication date Feb 28, 2013
- TESEDA CORPORATION
- Jack Frost
- G01 - MEASURING TESTING
Information Patent Application
SUSPECT LOGICAL REGION SYNTHESIS FROM DEVICE DESIGN AND TEST INFORM...
- Publication number 20120079439
- Publication date Mar 29, 2012
- TESEDA CORPORATION
- Armagan Akar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUSPECT LOGICAL REGION SYNTHESIS AND SIMULATION USING DEVICE DESIGN...
- Publication number 20120079440
- Publication date Mar 29, 2012
- TESEDA CORPORATION
- Armagan Akar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRELATION OF DEVICE MANUFACTURING DEFECT DATA WITH DEVICE ELECTRI...
- Publication number 20120079442
- Publication date Mar 29, 2012
- TESEDA CORPORATION
- Armagan Akar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tester architecture for testing semiconductor integrated circuits
- Publication number 20040232936
- Publication date Nov 25, 2004
- Teseda Corporation
- Ajit M. Limaye
- G01 - MEASURING TESTING
Information Patent Application
Creation, viewing, and analysis of the results of integrated circui...
- Publication number 20040078165
- Publication date Apr 22, 2004
- Teseda Corporation
- David S. Kellerman
- G01 - MEASURING TESTING
Information Patent Application
Single board DFT integrated circuit tester
- Publication number 20040068699
- Publication date Apr 8, 2004
- Teseda Corporation
- Steven R. Morris
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
76575209 - TESEDA
- Serial number 76575209
- Registration number 3061590
- Filing date Feb 12, 2004
- Teseda Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76540110 - V500
- Serial number 76540110
- Filing date Aug 12, 2003
- Teseda Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76420768 - VALIDATOR 500
- Serial number 76420768
- Registration number 2807892
- Filing date Jun 13, 2002
- Teseda Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78078522 - TESEDA
- Serial number 78078522
- Registration number 3029973
- Filing date Aug 9, 2001
- Deft Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

TESEDA CORPORATION

Organization

Patents Grantslast 30 patents

Diagnosing failing scan chains in a semiconductor integrated circuit

Detecting and locating shoot-through timing failures in a semicondu...

Field triage of EOS failures in semiconductor devices

Suspect logical region synthesis from device design and test inform...

Correlation of device manufacturing defect data with device electri...

Electrical characterization for a semiconductor device pin

Scan chain fault diagnosis

Secure test-for-yield chip diagnostics management system and method

Scan chain fault diagnosis

Correlation of device manufacturing defect data with device electri...

Suspect logical region synthesis and simulation using device design...

Scan chain fault diagnosis

Single board DFT integrated circuit tester

Tester architecture for testing semiconductor integrated circuits

Scan test viewing and analysis tool

Patents Applicationslast 30 patents

DETECTING AND LOCATING SHOOT-THROUGH TIMING FAILURES IN A SEMICONDU...

FIELD TRIAGE OF EOS FAILURES IN SEMICONDUCTOR DEVICES

SCAN CHAIN FAULT DIAGNOSIS

Correlation of Device Manufacturing Defect Data with Device Electri...

SCAN CHAIN FAULT DIAGNOSIS

Scan Chain Fault Diagnosis

Electrical Characterization for a Semiconductor Device Pin

SUSPECT LOGICAL REGION SYNTHESIS FROM DEVICE DESIGN AND TEST INFORM...

SUSPECT LOGICAL REGION SYNTHESIS AND SIMULATION USING DEVICE DESIGN...

CORRELATION OF DEVICE MANUFACTURING DEFECT DATA WITH DEVICE ELECTRI...

Tester architecture for testing semiconductor integrated circuits

Creation, viewing, and analysis of the results of integrated circui...

Single board DFT integrated circuit tester

Trademarklast 30 trademarks

76575209 - TESEDA

76540110 - V500

76420768 - VALIDATOR 500

78078522 - TESEDA