Touchdown Technologies Inc.

Organization

Palo Alto, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Post and tip design for a probe contact
- Patent number 7,922,888
- Issue date Apr 12, 2011
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Planarizing probe card
- Patent number 7,791,361
- Issue date Sep 7, 2010
- Touchdown Technologies, Inc.
- Ken Karklin
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing semiconductor devices with features that increase...
- Patent number 7,772,859
- Issue date Aug 10, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Method for repairing a microelectromechanical system
- Patent number 7,761,966
- Issue date Jul 27, 2010
- Touchdown Technologies, Inc.
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming probe card assembly
- Patent number 7,759,952
- Issue date Jul 20, 2010
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device with elastomer interposer
- Patent number 7,759,951
- Issue date Jul 20, 2010
- Touchdown Technologies, Inc.
- Ken Karklin
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of forming same
- Patent number 7,728,612
- Issue date Jun 1, 2010
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Torsion spring probe contactor design
- Patent number 7,724,010
- Issue date May 25, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card substrate with bonded via
- Patent number 7,692,436
- Issue date Apr 6, 2010
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Forked probe for testing semiconductor devices
- Patent number 7,589,547
- Issue date Sep 15, 2009
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid probe for testing semiconductor devices
- Patent number 7,589,542
- Issue date Sep 15, 2009
- Touchdown Technologies Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with balanced lateral force
- Patent number 7,538,567
- Issue date May 26, 2009
- Touchdown Technologies, Inc.
- Shaoning Lu
- G01 - MEASURING TESTING
Information Patent Grant
Stacked contact bump
- Patent number 7,378,734
- Issue date May 27, 2008
- Touchdown Technologies, Inc.
- Richard Yabuki
- G01 - MEASURING TESTING
Information Patent Grant
Excess overdrive detector for probe cards
- Patent number 7,365,551
- Issue date Apr 29, 2008
- Touchdown Technologies, Inc.
- Steven J Walker
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 7,365,553
- Issue date Apr 29, 2008
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Torsion spring probe contactor design
- Patent number 7,362,119
- Issue date Apr 22, 2008
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Optically enhanced probe alignment
- Patent number 7,355,422
- Issue date Apr 8, 2008
- Touchdown Technologies, Inc.
- Steven J Walker
- G01 - MEASURING TESTING
Information Patent Grant
Process for forming microstructures
- Patent number 7,271,022
- Issue date Sep 18, 2007
- Touchdown Technologies, Inc.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Process for forming MEMS
- Patent number 7,264,984
- Issue date Sep 4, 2007
- Touchdown Technologies, Inc.
- Raffi Garabedian
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Post and tip design for a probe contact
- Patent number 7,245,135
- Issue date Jul 17, 2007
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Probe head with machined mounting pads and method of forming same
- Patent number 7,180,316
- Issue date Feb 20, 2007
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Optical cross-connect assembly
- Patent number 6,970,616
- Issue date Nov 29, 2005
- Touchdown Technologies, Inc.
- David Boger
- G02 - OPTICS

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Patents Applicationslast 30 patents

Information Patent Application
FINE PITCH MICROELECTRONIC CONTACT ARRAY AND METHOD OF MAKING SAME
- Publication number 20140232427
- Publication date Aug 21, 2014
- TOUCHDOWN TECHNOLOGIES, INC.
- Laksmi Namburi
- G01 - MEASURING TESTING
Information Patent Application
MULTI MATERIAL SECONDARY METALLIZATION SCHEME IN MEMS FABRICATION
- Publication number 20120070980
- Publication date Mar 22, 2012
- TOUCHDOWN TECHNOLOGIES, INC.
- Montray Leavy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20120032697
- Publication date Feb 9, 2012
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Probecard System and Method
- Publication number 20110248735
- Publication date Oct 13, 2011
- TOUCHDOWN TECHNOLOGIES, INC.
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Application
SUPERFILLING SECONDARY METALLIZATION PROCESS IN MEMS FABRICATION
- Publication number 20110100826
- Publication date May 5, 2011
- TOUCHDOWN TECHNOLOGIES, INC.
- Montray Leavy
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
MULTI MATERIAL SECONDARY METALLIZATION SCHEME IN MEMS FABRICATION
- Publication number 20110100829
- Publication date May 5, 2011
- TOUCHDOWN TECHNOLOGIES, INC.
- Montray Leavy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROBE CARD SUBSTRATE WITH BONDED VIA
- Publication number 20100308854
- Publication date Dec 9, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD...
- Publication number 20100237889
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTRONIC CONTACTOR ASSEMBLY, STRUCTURES THEREOF, AND METHODS...
- Publication number 20100237887
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, AND METHODS OF...
- Publication number 20100237888
- Publication date Sep 23, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Yohannes Desta
- G01 - MEASURING TESTING
Information Patent Application
Probe card substrate with bonded via
- Publication number 20090237099
- Publication date Sep 24, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
PLANARIZING PROBE CARD
- Publication number 20090146675
- Publication date Jun 11, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Ken Karklin
- G01 - MEASURING TESTING
Information Patent Application
Multi-Pivot Probe Card For Testing Semiconductor Devices
- Publication number 20090072851
- Publication date Mar 19, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Application
FORKED PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20090072850
- Publication date Mar 19, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR REPARING A MICROELECTROMECHANICAL SYSTEM
- Publication number 20090021277
- Publication date Jan 22, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Application
SEMICODUCTOR TESTING DEVICE WITH ELASTOMER INTERPOSER
- Publication number 20080297182
- Publication date Dec 4, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Ken Karklin
- G01 - MEASURING TESTING
Information Patent Application
HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252310
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Nim Tea
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252328
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Zhiyong An
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TO OPTIMIZE A SEMICONDUCTOR PROBE CARD
- Publication number 20080228301
- Publication date Sep 18, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Cameron Dennis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probe card assembly and method of forming same
- Publication number 20080211525
- Publication date Sep 4, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Torsion spring probe contactor design
- Publication number 20080106289
- Publication date May 8, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Method of forming probe card assembly
- Publication number 20080007281
- Publication date Jan 10, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Stacked Contact Bump
- Publication number 20070279077
- Publication date Dec 6, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Richard Yabuki
- G01 - MEASURING TESTING
Information Patent Application
Post and tip design for a probe contact
- Publication number 20070240306
- Publication date Oct 18, 2007
- TOUCHDOWN TECHNOLOGIES., INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Excess Overdrive Detector for Probe Cards
- Publication number 20070205782
- Publication date Sep 6, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Steven J. Walker
- G01 - MEASURING TESTING
Information Patent Application
STACKED CONTACT BUMP
- Publication number 20070202683
- Publication date Aug 30, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Richard Yabuki
- G01 - MEASURING TESTING
Information Patent Application
Probe head with machine mounting pads and method of forming same
- Publication number 20070182430
- Publication date Aug 9, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly
- Publication number 20070145988
- Publication date Jun 28, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Lateral interposer contact design and probe card assembly
- Publication number 20070075717
- Publication date Apr 5, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- David Kinghorn
- G01 - MEASURING TESTING
Information Patent Application
Optically enhanced probe alignment
- Publication number 20070063716
- Publication date Mar 22, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Steven J. Walker
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
77418171 - TD300
- Serial number 77418171
- Filing date Mar 10, 2008
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78882885 - TD160
- Serial number 78882885
- Registration number 3390097
- Filing date May 12, 2006
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78882881 - TD110
- Serial number 78882881
- Registration number 3420532
- Filing date May 12, 2006
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78882890 - 1TD200
- Serial number 78882890
- Filing date May 12, 2006
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78882872 - TD
- Serial number 78882872
- Registration number 3469621
- Filing date May 12, 2006
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78882895 - 1TD300
- Serial number 78882895
- Filing date May 12, 2006
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78732965 - ACCU-TORQ
- Serial number 78732965
- Registration number 3224303
- Filing date Oct 13, 2005
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78732985 - TOUCHDOWN TECHNOLOGIES
- Serial number 78732985
- Registration number 3192302
- Filing date Oct 13, 2005
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78732992 - TT
- Serial number 78732992
- Registration number 3148459
- Filing date Oct 13, 2005
- Touchdown Technologies, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Touchdown Technologies Inc.

Organization

Patents Grantslast 30 patents

Post and tip design for a probe contact

Planarizing probe card

Probe for testing semiconductor devices with features that increase...

Method for repairing a microelectromechanical system

Method of forming probe card assembly

Semiconductor testing device with elastomer interposer

Probe card assembly and method of forming same

Torsion spring probe contactor design

Probe card substrate with bonded via

Forked probe for testing semiconductor devices

Hybrid probe for testing semiconductor devices

Probe card with balanced lateral force

Stacked contact bump

Excess overdrive detector for probe cards

Probe card assembly

Torsion spring probe contactor design

Optically enhanced probe alignment

Process for forming microstructures

Process for forming MEMS

Post and tip design for a probe contact

Probe head with machined mounting pads and method of forming same

Optical cross-connect assembly

Patents Applicationslast 30 patents

FINE PITCH MICROELECTRONIC CONTACT ARRAY AND METHOD OF MAKING SAME

MULTI MATERIAL SECONDARY METALLIZATION SCHEME IN MEMS FABRICATION

PROBE FOR TESTING SEMICONDUCTOR DEVICES

Probecard System and Method

SUPERFILLING SECONDARY METALLIZATION PROCESS IN MEMS FABRICATION

MULTI MATERIAL SECONDARY METALLIZATION SCHEME IN MEMS FABRICATION

PROBE CARD SUBSTRATE WITH BONDED VIA

PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD...

MICROELECTRONIC CONTACTOR ASSEMBLY, STRUCTURES THEREOF, AND METHODS...

PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, AND METHODS OF...

Probe card substrate with bonded via

PLANARIZING PROBE CARD

Multi-Pivot Probe Card For Testing Semiconductor Devices

FORKED PROBE FOR TESTING SEMICONDUCTOR DEVICES

DEVICE AND METHOD FOR REPARING A MICROELECTROMECHANICAL SYSTEM

SEMICODUCTOR TESTING DEVICE WITH ELASTOMER INTERPOSER

HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES

PROBE FOR TESTING SEMICONDUCTOR DEVICES

SYSTEM TO OPTIMIZE A SEMICONDUCTOR PROBE CARD

Probe card assembly and method of forming same

Torsion spring probe contactor design

Method of forming probe card assembly

Stacked Contact Bump

Post and tip design for a probe contact

Excess Overdrive Detector for Probe Cards

STACKED CONTACT BUMP

Probe head with machine mounting pads and method of forming same

Probe card assembly

Lateral interposer contact design and probe card assembly

Optically enhanced probe alignment

Trademarklast 30 trademarks

77418171 - TD300

78882885 - TD160

78882881 - TD110

78882890 - 1TD200

78882872 - TD

78882895 - 1TD300

78732965 - ACCU-TORQ

78732985 - TOUCHDOWN TECHNOLOGIES

78732992 - TT