TransTech Systems, Inc.

Organization

Schenectady, NY, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Methods, circuits and systems for obtaining impedance or dielectric...
- Patent number 11,977,040
- Issue date May 7, 2024
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate capacitor system for determining impedance character...
- Patent number 11,965,873
- Issue date Apr 23, 2024
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic impedance spectroscopy apparatus and related planar...
- Patent number 11,680,920
- Issue date Jun 20, 2023
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Grant
Sensor system to apply electromagnetic fields for electromagnetic i...
- Patent number 11,680,912
- Issue date Jun 20, 2023
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Grant
Methods, circuits and systems for obtaining impedance or dielectric...
- Patent number 11,604,155
- Issue date Mar 14, 2023
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate capacitor system for determining impedance character...
- Patent number 11,592,432
- Issue date Feb 28, 2023
- TransTech Systems, Inc.
- Manfred Geier
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electromagnetic impedance spectroscopy apparatus and related planar...
- Patent number 11,268,922
- Issue date Mar 8, 2022
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate capacitor system for determining impedance character...
- Patent number 11,022,594
- Issue date Jun 1, 2021
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and monitoring of physical properties of material under...
- Patent number 10,739,287
- Issue date Aug 11, 2020
- TransTech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Grant
Determining location of electromagnetic impedance spectrographic an...
- Patent number 10,527,570
- Issue date Jan 7, 2020
- TransTech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Grant
System and circuit for obtaining impedance or dielectric measuremen...
- Patent number 10,330,616
- Issue date Jun 25, 2019
- TransTech Systems, Inc.
- Frank H. Lipowitz
- G01 - MEASURING TESTING
Information Patent Grant
Selective characterization of material under test (MUT) with electr...
- Patent number 10,324,052
- Issue date Jun 18, 2019
- TransTech Systems, Inc.
- Sarah E. Pluta
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Characterization of material under test (MUT) with electromagnetic...
- Patent number 10,161,893
- Issue date Dec 25, 2018
- TransTech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Grant
Planar sensor array for non-destructive evaluation of material usin...
- Patent number 9,863,900
- Issue date Jan 9, 2018
- TransTech Systems, Inc.
- Sarah E. Pluta
- G01 - MEASURING TESTING
Information Patent Grant
Selective characterization of material under test (MUT) with electr...
- Patent number 9,804,112
- Issue date Oct 31, 2017
- Transtech Systems, Inc.
- Sarah E. Pluta
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electronic emulation of material impedance for standardization and...
- Patent number 9,805,146
- Issue date Oct 31, 2017
- TransTech Systems, Inc.
- Frank H. Lipowitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-process material characterization
- Patent number 9,465,061
- Issue date Oct 11, 2016
- Transtech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Grant
Material analysis including density and moisture content determinat...
- Patent number 7,219,024
- Issue date May 15, 2007
- Transtech Systems, Inc.
- Ronald W. Gamache
- G01 - MEASURING TESTING
Information Patent Grant
Pavement ramp edge making
- Patent number 6,988,850
- Issue date Jan 24, 2006
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Pavement ramp edge making
- Patent number 6,923,594
- Issue date Aug 2, 2005
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Material alignment for compaction
- Patent number 6,884,000
- Issue date Apr 26, 2005
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Paving material analyzer system and method
- Patent number 6,803,771
- Issue date Oct 12, 2004
- Transtech Systems, Inc.
- Robert A. Sovik
- G01 - MEASURING TESTING
Information Patent Grant
Paving material analyzer system and method
- Patent number 6,414,497
- Issue date Jul 2, 2002
- Transtech Systems, Inc.
- Robert A. Sovik
- G01 - MEASURING TESTING
Information Patent Grant
Pavement edger and joint maker
- Patent number 6,283,672
- Issue date Sep 4, 2001
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Pavement joint and joint making process
- Patent number 6,270,284
- Issue date Aug 7, 2001
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Paving machine and pavement edger therefor
- Patent number 6,238,136
- Issue date May 29, 2001
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Pavement ramp and ramp making process
- Patent number 6,238,134
- Issue date May 29, 2001
- Transtech Systems, Inc.
- Robert A. Sovik
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Paving material density indicator and method using capacitance
- Patent number 5,900,736
- Issue date May 4, 1999
- Transtech Systems, Inc.
- Robert A. Sovik
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...
- Publication number 20240272105
- Publication date Aug 15, 2024
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC IMPEDANCE SPECTROSCOPY APPARATUS AND RELATED PLANAR...
- Publication number 20230273137
- Publication date Aug 31, 2023
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Application
METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...
- Publication number 20230194452
- Publication date Jun 22, 2023
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...
- Publication number 20230194498
- Publication date Jun 22, 2023
- TransTech Systems, Inc.
- Manfred Geier
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...
- Publication number 20220260513
- Publication date Aug 18, 2022
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC IMPEDANCE SPECTROSCOPY APPARATUS AND RELATED PLANAR...
- Publication number 20220163469
- Publication date May 26, 2022
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SYSTEM TO APPLY ELECTROMAGNETIC FIELDS FOR ELECTROMAGNETIC I...
- Publication number 20210356409
- Publication date Nov 18, 2021
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Application
METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...
- Publication number 20210325326
- Publication date Oct 21, 2021
- TransTech Systems, Inc.
- Adam D. Blot
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...
- Publication number 20210255161
- Publication date Aug 19, 2021
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...
- Publication number 20210055280
- Publication date Feb 25, 2021
- TransTech Systems, Inc.
- Manfred Geier
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND CIRCUIT FOR OBTAINING IMPEDANCE OR DIELECTRIC MEASUREMEN...
- Publication number 20180172612
- Publication date Jun 21, 2018
- TransTech Systems, Inc.
- Frank H. Lipowitz
- G01 - MEASURING TESTING
Information Patent Application
System with Adjustable Linear Electrode Array for Detection and Ide...
- Publication number 20180128934
- Publication date May 10, 2018
- TransTech Systems, Inc.
- Sarah E. Pluta
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT AND MONITORING OF PHYSICAL PROPERTIES OF MATERIAL UNDER...
- Publication number 20180011039
- Publication date Jan 11, 2018
- TransTech Systems, Inc.
- Donald D. Colosimo
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
Selective Characterization of Material Under Test (MUT) with Electr...
- Publication number 20180011040
- Publication date Jan 11, 2018
- TransTech Systems, Inc.
- Sarah E. Pluta
- G01 - MEASURING TESTING
Information Patent Application
Determining Location of Electromagnetic Impedance Spectrographic An...
- Publication number 20170199140
- Publication date Jul 13, 2017
- TransTech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE DETECTION AND IDENTIFICATION OF BURIED...
- Publication number 20160161624
- Publication date Jun 9, 2016
- TransTech Systems, Inc.
- Sarah E. Pluta
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF MATERIAL UNDER TEST (MUT) WITH ELECTROMAGNETIC...
- Publication number 20160054247
- Publication date Feb 25, 2016
- TransTech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Application
PLANAR SENSOR ARRAY FOR NON-DESTRUCTIVE EVALUATION OF MATERIAL USIN...
- Publication number 20150212026
- Publication date Jul 30, 2015
- TransTech Systems, Inc.
- Sarah E. Pluta
- G01 - MEASURING TESTING
Information Patent Application
Selective Characterization of Material Under Test (MUT) with Electr...
- Publication number 20150137831
- Publication date May 21, 2015
- TransTech Systems, Inc.
- Sarah E. Pluta
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC EMULATION OF MATERIAL IMPEDANCE FOR STANDARIZATION AND C...
- Publication number 20140278300
- Publication date Sep 18, 2014
- TransTech Systems, Inc.
- Frank H. Lipowitz
- G01 - MEASURING TESTING
Information Patent Application
System and Circuit for Self-Adjusting Impedance Measurement
- Publication number 20140266268
- Publication date Sep 18, 2014
- TransTech Systems, Inc.
- Frank H. Lipowitz
- G01 - MEASURING TESTING
Information Patent Application
IN-PROCESS MATERIAL CHARACTERIZATION
- Publication number 20130307564
- Publication date Nov 21, 2013
- TransTech Systems, Inc.
- Donald D. Colosimo
- G01 - MEASURING TESTING
Information Patent Application
Paving material analyzer system, sensor and method
- Publication number 20040032269
- Publication date Feb 19, 2004
- TransTech Systems, Inc.
- Robert A. Sovik
- G01 - MEASURING TESTING
Information Patent Application
Paving material analyzer system and method
- Publication number 20020175691
- Publication date Nov 28, 2002
- TransTech Systems, Inc.
- Robert A. Sovik
- G01 - MEASURING TESTING

NSF Awardslast 12 months

processing...

Count: 1

NSF Awards

Information NSF Award
SBIR PHASE I: Electrical Impedance Spectroscopic Sensor to Detect O...
- Award Id 0740360
- Effective date Jan 1, 2008

TransTech Systems, Inc.

Organization

Patents Grantslast 30 patents

Methods, circuits and systems for obtaining impedance or dielectric...

Parallel plate capacitor system for determining impedance character...

Electromagnetic impedance spectroscopy apparatus and related planar...

Sensor system to apply electromagnetic fields for electromagnetic i...

Methods, circuits and systems for obtaining impedance or dielectric...

Parallel plate capacitor system for determining impedance character...

Electromagnetic impedance spectroscopy apparatus and related planar...

Parallel plate capacitor system for determining impedance character...

Measurement and monitoring of physical properties of material under...

Determining location of electromagnetic impedance spectrographic an...

System and circuit for obtaining impedance or dielectric measuremen...

Selective characterization of material under test (MUT) with electr...

Characterization of material under test (MUT) with electromagnetic...

Planar sensor array for non-destructive evaluation of material usin...

Selective characterization of material under test (MUT) with electr...

Electronic emulation of material impedance for standardization and...

In-process material characterization

Material analysis including density and moisture content determinat...

Pavement ramp edge making

Pavement ramp edge making

Material alignment for compaction

Paving material analyzer system and method

Paving material analyzer system and method

Pavement edger and joint maker

Pavement joint and joint making process

Paving machine and pavement edger therefor

Pavement ramp and ramp making process

Paving material density indicator and method using capacitance

Patents Applicationslast 30 patents

METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...

ELECTROMAGNETIC IMPEDANCE SPECTROSCOPY APPARATUS AND RELATED PLANAR...

METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...

PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...

METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...

ELECTROMAGNETIC IMPEDANCE SPECTROSCOPY APPARATUS AND RELATED PLANAR...

SENSOR SYSTEM TO APPLY ELECTROMAGNETIC FIELDS FOR ELECTROMAGNETIC I...

METHODS, CIRCUITS AND SYSTEMS FOR OBTAINING IMPEDANCE OR DIELECTRIC...

PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...

PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...

SYSTEM AND CIRCUIT FOR OBTAINING IMPEDANCE OR DIELECTRIC MEASUREMEN...

System with Adjustable Linear Electrode Array for Detection and Ide...

MEASUREMENT AND MONITORING OF PHYSICAL PROPERTIES OF MATERIAL UNDER...

Selective Characterization of Material Under Test (MUT) with Electr...

Determining Location of Electromagnetic Impedance Spectrographic An...

METHOD AND APPARATUS FOR THE DETECTION AND IDENTIFICATION OF BURIED...

CHARACTERIZATION OF MATERIAL UNDER TEST (MUT) WITH ELECTROMAGNETIC...

PLANAR SENSOR ARRAY FOR NON-DESTRUCTIVE EVALUATION OF MATERIAL USIN...

Selective Characterization of Material Under Test (MUT) with Electr...

ELECTRONIC EMULATION OF MATERIAL IMPEDANCE FOR STANDARIZATION AND C...

System and Circuit for Self-Adjusting Impedance Measurement

IN-PROCESS MATERIAL CHARACTERIZATION

Paving material analyzer system, sensor and method

Paving material analyzer system and method

NSF Awardslast 12 months

NSF Awards

SBIR PHASE I: Electrical Impedance Spectroscopic Sensor to Detect O...