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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of combining multiple sets of overlapping surface-profile in...
Patent number
6,185,315
Issue date
Feb 6, 2001
Wyko Corporation
Mark A. Schmucker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Autocollimator with grating
Patent number
5,995,215
Issue date
Nov 30, 1999
Wyko Corporation
John B. Hayes
G01 - MEASURING TESTING
Information
Patent Grant
Method of combining multiple sets of overlapping surface-profile in...
Patent number
5,987,189
Issue date
Nov 16, 1999
Wyko Corporation
Mark A. Schmucker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for correcting shifts between a reference foca...
Patent number
5,978,086
Issue date
Nov 2, 1999
Wyko Corporation
David J. Aziz
G01 - MEASURING TESTING
Information
Patent Grant
Interchangeable sample stage with integral reference surface for ma...
Patent number
5,844,675
Issue date
Dec 1, 1998
Wyko Corporation
John B. Hayes
G11 - INFORMATION STORAGE
Information
Patent Grant
Friction connector for optical flats in interferometers
Patent number
5,822,136
Issue date
Oct 13, 1998
Wyko Corporation
James V. Semrad
G01 - MEASURING TESTING
Information
Patent Grant
Polymeric insert with crush-formed threads for mating with threaded...
Patent number
5,813,809
Issue date
Sep 29, 1998
Wyko Corporation
William C. Russum
G02 - OPTICS
Information
Patent Grant
Variable-speed scanning for interferometric measurements
Patent number
5,726,754
Issue date
Mar 10, 1998
Wyko Corporation
Michael P. Andrews
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for restoring digitized video pictures generat...
Patent number
5,717,782
Issue date
Feb 10, 1998
Wyko Corporation
Larry Denneau
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Coaxial disc-mount for measuring flatness of computer-drive discs b...
Patent number
5,689,337
Issue date
Nov 18, 1997
Wyko Corporation
Joseph A. Lamb
G01 - MEASURING TESTING
Information
Patent Grant
Horizontal-post/vertical-flexure arrangement for supporting large r...
Patent number
5,680,214
Issue date
Oct 21, 1997
Wyko Corporation
Joseph A. Lamb
G02 - OPTICS
Information
Patent Grant
Orthogonal-scanning microscope objective for vertical-scanning and...
Patent number
5,640,270
Issue date
Jun 17, 1997
Wyko Corporation
David J. Aziz
G02 - OPTICS
Information
Patent Grant
Centroid approach for estimating modulation peak in broad-bandwidth...
Patent number
5,633,715
Issue date
May 27, 1997
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for correcting surface profiles determined by...
Patent number
5,602,643
Issue date
Feb 11, 1997
Wyko Corporation
Harrison H. Barrett
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring thin-film thickness and step height on the sur...
Patent number
5,555,471
Issue date
Sep 10, 1996
Wyko Corporation
Yiping Xu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for absolute optical measurement of entire sur...
Patent number
5,502,566
Issue date
Mar 26, 1996
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Positioning mechanism and method for providing coaxial alignment of...
Patent number
5,483,064
Issue date
Jan 9, 1996
Wyko Corporation
Eric M. Frey
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Combination of white-light scanning and phase-shifting interferomet...
Patent number
5,471,303
Issue date
Nov 28, 1995
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Multimode-laser interferometric apparatus for eliminating backgroun...
Patent number
5,452,088
Issue date
Sep 19, 1995
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Combination of motorized and piezoelectric translation for long-ran...
Patent number
5,446,547
Issue date
Aug 29, 1995
Wyko Corporation
Bryan W. Guenther
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing an optical window with a small wedge angle
Patent number
5,398,112
Issue date
Mar 14, 1995
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Rough surface profiler and method
Patent number
5,355,221
Issue date
Oct 11, 1994
Wyko Corporation
Donald K. Cohen
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric integration technique and apparatus to confine 2.pi...
Patent number
5,321,497
Issue date
Jun 14, 1994
Wyko Corporation
Chiayu Ai
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope including height plus deflection method a...
Patent number
5,260,572
Issue date
Nov 9, 1993
Wyko Corporation
Daniel R. Marshall
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Rough surface profiler and method
Patent number
5,204,734
Issue date
Apr 20, 1993
Wyko Corporation
Donald K. Cohen
G01 - MEASURING TESTING
Information
Patent Grant
PMN translator and linearization system in scanning probe microscope
Patent number
5,200,617
Issue date
Apr 6, 1993
Wyko Corporation
John B. Hayes
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optical position sensor with corner-cube and servo-feedback for sca...
Patent number
5,196,713
Issue date
Mar 23, 1993
Wyko Corporation
Daniel R. Marshall
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Compact temperature-compensated tube-type scanning probe with large...
Patent number
5,173,605
Issue date
Dec 22, 1992
Wyko Corporation
John B. Hayes
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for rapid, accurate measurement of step heights between diss...
Patent number
5,173,746
Issue date
Dec 22, 1992
Wyko Corporation
Chris P. Brophy
G01 - MEASURING TESTING
Information
Patent Grant
Optical position sensor for scanning probe microscopes
Patent number
5,172,002
Issue date
Dec 15, 1992
Wyko Corporation
Daniel R. Marshall
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Trademark
last 30 trademarks
Information
Trademark
75205966 - INSIGHT
Serial number
75205966
Filing date
Nov 25, 1996
WYKO CORPORATION
8 - Hand tools and implements (hand-operated)
Information
Trademark
74549835 - VISION
Serial number
74549835
Registration number
1992388
Filing date
Jul 15, 1994
WYKO CORPORATION
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
73810440 - ULTRAMOUNT
Serial number
73810440
Filing date
Jul 3, 1989
WYKO CORPORATION
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
73576140 - TOPO-3D
Serial number
73576140
Registration number
1406578
Filing date
Jan 3, 1986
WYKO CORPORATION
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
73539674 - WYKO
Serial number
73539674
Registration number
1472870
Filing date
May 28, 1985
WYKO CORPORATION
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments