WYKO Corporation

Organization

Tucson, AZ, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method of combining multiple sets of overlapping surface-profile in...
- Patent number 6,185,315
- Issue date Feb 6, 2001
- Wyko Corporation
- Mark A. Schmucker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Autocollimator with grating
- Patent number 5,995,215
- Issue date Nov 30, 1999
- Wyko Corporation
- John B. Hayes
- G01 - MEASURING TESTING
Information Patent Grant
Method of combining multiple sets of overlapping surface-profile in...
- Patent number 5,987,189
- Issue date Nov 16, 1999
- Wyko Corporation
- Mark A. Schmucker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for correcting shifts between a reference foca...
- Patent number 5,978,086
- Issue date Nov 2, 1999
- Wyko Corporation
- David J. Aziz
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable sample stage with integral reference surface for ma...
- Patent number 5,844,675
- Issue date Dec 1, 1998
- Wyko Corporation
- John B. Hayes
- G11 - INFORMATION STORAGE
Information Patent Grant
Friction connector for optical flats in interferometers
- Patent number 5,822,136
- Issue date Oct 13, 1998
- Wyko Corporation
- James V. Semrad
- G01 - MEASURING TESTING
Information Patent Grant
Polymeric insert with crush-formed threads for mating with threaded...
- Patent number 5,813,809
- Issue date Sep 29, 1998
- Wyko Corporation
- William C. Russum
- G02 - OPTICS
Information Patent Grant
Variable-speed scanning for interferometric measurements
- Patent number 5,726,754
- Issue date Mar 10, 1998
- Wyko Corporation
- Michael P. Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for restoring digitized video pictures generat...
- Patent number 5,717,782
- Issue date Feb 10, 1998
- Wyko Corporation
- Larry Denneau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coaxial disc-mount for measuring flatness of computer-drive discs b...
- Patent number 5,689,337
- Issue date Nov 18, 1997
- Wyko Corporation
- Joseph A. Lamb
- G01 - MEASURING TESTING
Information Patent Grant
Horizontal-post/vertical-flexure arrangement for supporting large r...
- Patent number 5,680,214
- Issue date Oct 21, 1997
- Wyko Corporation
- Joseph A. Lamb
- G02 - OPTICS
Information Patent Grant
Orthogonal-scanning microscope objective for vertical-scanning and...
- Patent number 5,640,270
- Issue date Jun 17, 1997
- Wyko Corporation
- David J. Aziz
- G02 - OPTICS
Information Patent Grant
Centroid approach for estimating modulation peak in broad-bandwidth...
- Patent number 5,633,715
- Issue date May 27, 1997
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for correcting surface profiles determined by...
- Patent number 5,602,643
- Issue date Feb 11, 1997
- Wyko Corporation
- Harrison H. Barrett
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thin-film thickness and step height on the sur...
- Patent number 5,555,471
- Issue date Sep 10, 1996
- Wyko Corporation
- Yiping Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for absolute optical measurement of entire sur...
- Patent number 5,502,566
- Issue date Mar 26, 1996
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING
Information Patent Grant
Positioning mechanism and method for providing coaxial alignment of...
- Patent number 5,483,064
- Issue date Jan 9, 1996
- Wyko Corporation
- Eric M. Frey
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Combination of white-light scanning and phase-shifting interferomet...
- Patent number 5,471,303
- Issue date Nov 28, 1995
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING
Information Patent Grant
Multimode-laser interferometric apparatus for eliminating backgroun...
- Patent number 5,452,088
- Issue date Sep 19, 1995
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING
Information Patent Grant
Combination of motorized and piezoelectric translation for long-ran...
- Patent number 5,446,547
- Issue date Aug 29, 1995
- Wyko Corporation
- Bryan W. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing an optical window with a small wedge angle
- Patent number 5,398,112
- Issue date Mar 14, 1995
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING
Information Patent Grant
Rough surface profiler and method
- Patent number 5,355,221
- Issue date Oct 11, 1994
- Wyko Corporation
- Donald K. Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric integration technique and apparatus to confine 2.pi...
- Patent number 5,321,497
- Issue date Jun 14, 1994
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope including height plus deflection method a...
- Patent number 5,260,572
- Issue date Nov 9, 1993
- Wyko Corporation
- Daniel R. Marshall
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Rough surface profiler and method
- Patent number 5,204,734
- Issue date Apr 20, 1993
- Wyko Corporation
- Donald K. Cohen
- G01 - MEASURING TESTING
Information Patent Grant
PMN translator and linearization system in scanning probe microscope
- Patent number 5,200,617
- Issue date Apr 6, 1993
- Wyko Corporation
- John B. Hayes
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical position sensor with corner-cube and servo-feedback for sca...
- Patent number 5,196,713
- Issue date Mar 23, 1993
- Wyko Corporation
- Daniel R. Marshall
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compact temperature-compensated tube-type scanning probe with large...
- Patent number 5,173,605
- Issue date Dec 22, 1992
- Wyko Corporation
- John B. Hayes
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for rapid, accurate measurement of step heights between diss...
- Patent number 5,173,746
- Issue date Dec 22, 1992
- Wyko Corporation
- Chris P. Brophy
- G01 - MEASURING TESTING
Information Patent Grant
Optical position sensor for scanning probe microscopes
- Patent number 5,172,002
- Issue date Dec 15, 1992
- Wyko Corporation
- Daniel R. Marshall
- B82 - NANO-TECHNOLOGY

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Trademarklast 30 trademarks

Information Trademark
75205966 - INSIGHT
- Serial number 75205966
- Filing date Nov 25, 1996
- WYKO CORPORATION
- 8 - Hand tools and implements (hand-operated)
Information Trademark
74549835 - VISION
- Serial number 74549835
- Registration number 1992388
- Filing date Jul 15, 1994
- WYKO CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73810440 - ULTRAMOUNT
- Serial number 73810440
- Filing date Jul 3, 1989
- WYKO CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73576140 - TOPO-3D
- Serial number 73576140
- Registration number 1406578
- Filing date Jan 3, 1986
- WYKO CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73539674 - WYKO
- Serial number 73539674
- Registration number 1472870
- Filing date May 28, 1985
- WYKO CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

NSF Awardslast 12 months

processing...

Count: 2

NSF Awards

Information NSF Award
High Resolution Interferometric Profiler for Submicron Linewidth Me...
- Award Id 9100075
- Effective date Sep 1, 1991
Information NSF Award
High Resolution Interferometric Optical Profiler for Submicron Line...
- Award Id 8960766
- Effective date Jan 1, 1990

WYKO Corporation

Organization

Patents Grantslast 30 patents

Method of combining multiple sets of overlapping surface-profile in...

Autocollimator with grating

Method of combining multiple sets of overlapping surface-profile in...

Method and apparatus for correcting shifts between a reference foca...

Interchangeable sample stage with integral reference surface for ma...

Friction connector for optical flats in interferometers

Polymeric insert with crush-formed threads for mating with threaded...

Variable-speed scanning for interferometric measurements

Method and apparatus for restoring digitized video pictures generat...

Coaxial disc-mount for measuring flatness of computer-drive discs b...

Horizontal-post/vertical-flexure arrangement for supporting large r...

Orthogonal-scanning microscope objective for vertical-scanning and...

Centroid approach for estimating modulation peak in broad-bandwidth...

Method and apparatus for correcting surface profiles determined by...

Method for measuring thin-film thickness and step height on the sur...

Method and apparatus for absolute optical measurement of entire sur...

Positioning mechanism and method for providing coaxial alignment of...

Combination of white-light scanning and phase-shifting interferomet...

Multimode-laser interferometric apparatus for eliminating backgroun...

Combination of motorized and piezoelectric translation for long-ran...

Method for testing an optical window with a small wedge angle

Rough surface profiler and method

Interferometric integration technique and apparatus to confine 2.pi...

Scanning probe microscope including height plus deflection method a...

Rough surface profiler and method

PMN translator and linearization system in scanning probe microscope

Optical position sensor with corner-cube and servo-feedback for sca...

Compact temperature-compensated tube-type scanning probe with large...

Method for rapid, accurate measurement of step heights between diss...

Optical position sensor for scanning probe microscopes

Trademarklast 30 trademarks

75205966 - INSIGHT

74549835 - VISION

73810440 - ULTRAMOUNT

73576140 - TOPO-3D

73539674 - WYKO

NSF Awardslast 12 months

NSF Awards

High Resolution Interferometric Profiler for Submicron Linewidth Me...

High Resolution Interferometric Optical Profiler for Submicron Line...