Adlai H. Smith

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Arrangement of expanding optical flows for efficient laser extraction
- Patent number 11,165,216
- Issue date Nov 2, 2021
- INNOVEN ENERGY LLC
- Robert O. Hunter
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Precision geographic location system and method utilizing an image...
- Patent number 10,222,178
- Issue date Mar 5, 2019
- Litel Instruments
- Robert O. Hunter
- F41 - WEAPONS
Information Patent Grant
System and method for advanced navigation
- Patent number 9,903,719
- Issue date Feb 27, 2018
- Litel Instruments
- Robert O. Hunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for high accuracy and reliability registration of...
- Patent number 9,483,816
- Issue date Nov 1, 2016
- Litel Instruments
- Adlai H. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Precision geographic location system and method utilizing an image...
- Patent number 9,074,848
- Issue date Jul 7, 2015
- Litel Instruments
- Robert O. Hunter
- F41 - WEAPONS
Information Patent Grant
Method and apparatus for measurement of exit pupil transmittance
- Patent number 8,786,827
- Issue date Jul 22, 2014
- Litel Instruments
- Adlai H. Smith
- G02 - OPTICS
Information Patent Grant
Method and apparatus for self-referenced wafer stage positional err...
- Patent number 7,871,002
- Issue date Jan 18, 2011
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced wafer stage positional err...
- Patent number 7,871,004
- Issue date Jan 18, 2011
- Litel Instruments
- Adlai Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for determination of focus and telecentricity,...
- Patent number 7,846,624
- Issue date Dec 7, 2010
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determination of source polarization matrix
- Patent number 7,697,138
- Issue date Apr 13, 2010
- Litel Instruments
- Adlai H. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of exit pupil transmittance
- Patent number 7,688,426
- Issue date Mar 30, 2010
- Litel Instruments
- Adlai H. Smith
- G02 - OPTICS
Information Patent Grant
Apparatus and process for determination of dynamic lens field curva...
- Patent number 7,671,979
- Issue date Mar 2, 2010
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for embedded encoding of overlay data ordering...
- Patent number 7,598,006
- Issue date Oct 6, 2009
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measurement of crossfield chromatic respon...
- Patent number 7,544,449
- Issue date Jun 9, 2009
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
In-situ interferometer arrangement
- Patent number 7,515,250
- Issue date Apr 7, 2009
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle for use in rapid determination of average intrafield scanni...
- Patent number 7,442,951
- Issue date Oct 28, 2008
- Litel Instruments
- Adlai Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference wafer calibration reticle
- Patent number 7,381,503
- Issue date Jun 3, 2008
- Litel Instruments
- Adlai H. Smith
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for registration with integral alignment optics
- Patent number 7,337,552
- Issue date Mar 4, 2008
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and process for the determination of static lens field cu...
- Patent number 7,295,291
- Issue date Nov 13, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
In-situ interferometer arrangement
- Patent number 7,286,208
- Issue date Oct 23, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
In-situ interferometer arrangement
- Patent number 7,283,202
- Issue date Oct 16, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced wafer stage positional err...
- Patent number 7,271,905
- Issue date Sep 18, 2007
- Litel Instruments
- Adlai Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced dynamic step and scan intr...
- Patent number 7,268,360
- Issue date Sep 11, 2007
- Litel Instruments
- Adlai H. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for determination of optimized exposure conditions for tran...
- Patent number 7,261,985
- Issue date Aug 28, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced dynamic step and scan intr...
- Patent number 7,262,398
- Issue date Aug 28, 2007
- Litel Instruments
- Adlai Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference wafer and process for manufacturing same
- Patent number 7,261,983
- Issue date Aug 28, 2007
- Litel Instruments
- Adlai H. Smith
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Reference wafer and process for manufacturing same
- Patent number 7,160,657
- Issue date Jan 9, 2007
- Litel Instruments
- Adlai Smith
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for self-referenced dynamic step and scan intr...
- Patent number 7,136,144
- Issue date Nov 14, 2006
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and process for determination of dynamic scan field curva...
- Patent number 7,126,668
- Issue date Oct 24, 2006
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced projection lens distortion...
- Patent number 7,099,011
- Issue date Aug 29, 2006
- Litel Instruments
- Bruce McArthur
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Arrangement of Expanding Optical Flows for Efficient Laser Extraction
- Publication number 20200028313
- Publication date Jan 23, 2020
- INNOVEN ENERGY LLC
- Robert O. Hunter
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Thermal Wave Drive for ICF Targets
- Publication number 20200027571
- Publication date Jan 23, 2020
- INNOVEN ENERGY LLC
- Eric W. Cornell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
High Radiation Efficiency Non Fissile Shell for ICF
- Publication number 20190139651
- Publication date May 9, 2019
- INNOVEN ENERGY LLC
- Eric W. Cornell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Reflectivity Variation of ICF Target Surfaces
- Publication number 20190057780
- Publication date Feb 21, 2019
- INNOVEN ENERGY LLC
- Robert O. Hunter
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEM AND METHOD FOR ADVANCED NAVIGATION
- Publication number 20170023365
- Publication date Jan 26, 2017
- LITEL INSTRUMENTS
- Robert O. Hunter
- G01 - MEASURING TESTING
Information Patent Application
METHOD & SYSTEM FOR HIGH ACCURACY & RELIABILITY REGISTRATION OF MUL...
- Publication number 20150324989
- Publication date Nov 12, 2015
- LITEL INSTRUMENTS
- Adlai H. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASUREMENT OF EXIT PUPIL TRANSMITTANCE
- Publication number 20110007298
- Publication date Jan 13, 2011
- LITEL INSTRUMENTS
- Adlai H. Smith
- G02 - OPTICS
Information Patent Application
In-Situ Interferometer Arrangement
- Publication number 20080007705
- Publication date Jan 10, 2008
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method And Apparatus For Self-Referenced Wafer Stage Positional Err...
- Publication number 20070279607
- Publication date Dec 6, 2007
- Adlai Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Reference Wafer and Process for Manufacturing Same
- Publication number 20070216902
- Publication date Sep 20, 2007
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Systems And Methods For Determination of Focus And Telecentricity,...
- Publication number 20070206168
- Publication date Sep 6, 2007
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Self-Referenced Dynamic Step and Scan Intr...
- Publication number 20070177132
- Publication date Aug 2, 2007
- Adlai Smith
- B82 - NANO-TECHNOLOGY
Information Patent Application
Reference wafer and process for manufacturing same
- Publication number 20070072091
- Publication date Mar 29, 2007
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and process for determination of dynamic scan field curva...
- Publication number 20070024834
- Publication date Feb 1, 2007
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for compensation or amelioration of lens field...
- Publication number 20060209410
- Publication date Sep 21, 2006
- Adlai H. Smith
- G02 - OPTICS
Information Patent Application
Method and apparatus for self-referenced wafer stage positional err...
- Publication number 20060209276
- Publication date Sep 21, 2006
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for determination of source polarization matrix
- Publication number 20060192961
- Publication date Aug 31, 2006
- Adlai H. Smith
- G01 - MEASURING TESTING
Information Patent Application
Machine specific and machine group correction of masks based on mac...
- Publication number 20060190915
- Publication date Aug 24, 2006
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for measurement of exit pupil telecentricity a...
- Publication number 20060164618
- Publication date Jul 27, 2006
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for self-referenced dynamic step and scan intr...
- Publication number 20060109438
- Publication date May 25, 2006
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for registration with integral alignment optics
- Publication number 20060042106
- Publication date Mar 2, 2006
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for self-referenced dynamic step and scan intr...
- Publication number 20060007431
- Publication date Jan 12, 2006
- Adlai H. Smith
- B82 - NANO-TECHNOLOGY
Information Patent Application
Process for manufacture of semiconductor chips utilizing a posterio...
- Publication number 20050285056
- Publication date Dec 29, 2005
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
In-situ interferometer arrangement
- Publication number 20050264783
- Publication date Dec 1, 2005
- LITEL INSTRUMENTS
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process for amelioration of scanning synchronization error
- Publication number 20050254027
- Publication date Nov 17, 2005
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and process for the determination of static lens field cu...
- Publication number 20050254040
- Publication date Nov 17, 2005
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and process for determination of dynamic scan field curva...
- Publication number 20050243294
- Publication date Nov 3, 2005
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and process for determination of dynamic lens field curva...
- Publication number 20050243309
- Publication date Nov 3, 2005
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
In-situ interferometer arrangement
- Publication number 20050237541
- Publication date Oct 27, 2005
- LITEL INSTRUMENTS
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for measurement of exit pupil transmittance
- Publication number 20050237512
- Publication date Oct 27, 2005
- Adlai H. Smith
- G02 - OPTICS

Adlai H. Smith

Person

Patents Grantslast 30 patents

Arrangement of expanding optical flows for efficient laser extraction

Precision geographic location system and method utilizing an image...

System and method for advanced navigation

Method and system for high accuracy and reliability registration of...

Precision geographic location system and method utilizing an image...

Method and apparatus for measurement of exit pupil transmittance

Method and apparatus for self-referenced wafer stage positional err...

Method and apparatus for self-referenced wafer stage positional err...

Systems and methods for determination of focus and telecentricity,...

Method and apparatus for determination of source polarization matrix

Method and apparatus for measurement of exit pupil transmittance

Apparatus and process for determination of dynamic lens field curva...

Method and apparatus for embedded encoding of overlay data ordering...

Method and apparatus for measurement of crossfield chromatic respon...

In-situ interferometer arrangement

Reticle for use in rapid determination of average intrafield scanni...

Reference wafer calibration reticle

Method and apparatus for registration with integral alignment optics

Apparatus and process for the determination of static lens field cu...

In-situ interferometer arrangement

In-situ interferometer arrangement

Method and apparatus for self-referenced wafer stage positional err...

Method and apparatus for self-referenced dynamic step and scan intr...

Process for determination of optimized exposure conditions for tran...

Method and apparatus for self-referenced dynamic step and scan intr...

Reference wafer and process for manufacturing same

Reference wafer and process for manufacturing same

Method and apparatus for self-referenced dynamic step and scan intr...

Apparatus and process for determination of dynamic scan field curva...

Method and apparatus for self-referenced projection lens distortion...

Patents Applicationslast 30 patents

Arrangement of Expanding Optical Flows for Efficient Laser Extraction

Thermal Wave Drive for ICF Targets

High Radiation Efficiency Non Fissile Shell for ICF

Reflectivity Variation of ICF Target Surfaces

SYSTEM AND METHOD FOR ADVANCED NAVIGATION

METHOD & SYSTEM FOR HIGH ACCURACY & RELIABILITY REGISTRATION OF MUL...

METHOD AND APPARATUS FOR MEASUREMENT OF EXIT PUPIL TRANSMITTANCE

In-Situ Interferometer Arrangement

Method And Apparatus For Self-Referenced Wafer Stage Positional Err...

Reference Wafer and Process for Manufacturing Same

Systems And Methods For Determination of Focus And Telecentricity,...

Method and Apparatus for Self-Referenced Dynamic Step and Scan Intr...

Reference wafer and process for manufacturing same

Apparatus and process for determination of dynamic scan field curva...

Method and apparatus for compensation or amelioration of lens field...

Method and apparatus for self-referenced wafer stage positional err...

Method and apparatus for determination of source polarization matrix

Machine specific and machine group correction of masks based on mac...

Method and apparatus for measurement of exit pupil telecentricity a...

Method and apparatus for self-referenced dynamic step and scan intr...

Method and apparatus for registration with integral alignment optics

Method and apparatus for self-referenced dynamic step and scan intr...

Process for manufacture of semiconductor chips utilizing a posterio...

In-situ interferometer arrangement

Process for amelioration of scanning synchronization error

Apparatus and process for the determination of static lens field cu...

Apparatus and process for determination of dynamic scan field curva...

Apparatus and process for determination of dynamic lens field curva...

In-situ interferometer arrangement

Method and apparatus for measurement of exit pupil transmittance