Akira Takashima

Person

Himeji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device manufacturing method, semiconductor memory dev...
- Patent number 12,261,041
- Issue date Mar 25, 2025
- Kioxia Corporation
- Tsunehiro Ino
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Memory device with ferroelectric layer
- Patent number 12,160,994
- Issue date Dec 3, 2024
- Kioxia Corporation
- Tsunehiro Ino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with change storage layer
- Patent number 11,769,838
- Issue date Sep 26, 2023
- Kioxia Corporation
- Masaki Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for improving performance of a block insulator...
- Patent number 11,735,673
- Issue date Aug 22, 2023
- Kioxia Corporation
- Masaki Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 11,355,511
- Issue date Jun 7, 2022
- Kioxia Corporation
- Tsunehiro Ino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,342,468
- Issue date May 24, 2022
- Kioxia Corporation
- Masaki Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having a charge accumulating layer incl...
- Patent number 11,282,850
- Issue date Mar 22, 2022
- Kioxia Corporation
- Akira Takashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotation sensor having ring-shaped rib
- Patent number 10,907,988
- Issue date Feb 2, 2021
- Mitsubishi Electric Cornoration
- Tomoki Kuwamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device and method for manufacturing the same w...
- Patent number 10,833,098
- Issue date Nov 10, 2020
- TOSHIBA MEMORY CORPORATION
- Akira Takashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotation sensor
- Patent number 10,591,314
- Issue date Mar 17, 2020
- Mitsubishi Electric Corporation
- Tomoki Kuwamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,403,642
- Issue date Sep 3, 2019
- TOSHIBA MEMORY CORPORATION
- Kazuhiro Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device having electron scattering...
- Patent number 9,935,122
- Issue date Apr 3, 2018
- TOSHIBA MEMORY CORPORATION
- Tsunehiro Ino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile resistance change element
- Patent number 9,865,809
- Issue date Jan 9, 2018
- TOSHIBA MEMORY CORPORATION
- Hidenori Miyagawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Rotation sensor
- Patent number 9,631,947
- Issue date Apr 25, 2017
- Mitsubishi Electric Corporation
- Akira Takashima
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic memory, spin element, and spin MOS transistor
- Patent number 9,536,583
- Issue date Jan 3, 2017
- Kabushiki Kaisha Toshiba
- Tomoaki Inokuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile variable resistance element
- Patent number 9,391,272
- Issue date Jul 12, 2016
- Kabushiki Kaisha Toshiba
- Hidenori Miyagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile memory device
- Patent number 9,379,320
- Issue date Jun 28, 2016
- Kabushiki Kaisha Toshiba
- Masao Shingu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory
- Patent number 9,349,876
- Issue date May 24, 2016
- Kabushiki Kaisha Toshiba
- Izumi Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic memory, spin element, and spin MOS transistor
- Patent number 9,230,625
- Issue date Jan 5, 2016
- Kabushiki Kaisha Toshiba
- Tomoaki Inokuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device including variable resistan...
- Patent number 9,147,469
- Issue date Sep 29, 2015
- Kabushiki Kaisha Toshiba
- Akira Takashima
- G11 - INFORMATION STORAGE
Information Patent Grant
Lanthanoid aluminate film fabrication method
- Patent number 8,992,744
- Issue date Mar 31, 2015
- Kabushiki Kaisha Toshiba
- Tsunehiro Ino
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Nonvolatile semiconductor memory device including variable resistan...
- Patent number 8,971,106
- Issue date Mar 3, 2015
- Kabushiki Kaisha Toshiba
- Akira Takashima
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device including variable resistan...
- Patent number 8,854,874
- Issue date Oct 7, 2014
- Kabushiki Kaisha Toshiba
- Akira Takashima
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile variable resistance element
- Patent number 8,835,896
- Issue date Sep 16, 2014
- Kabushiki Kaisha Toshiba
- Hidenori Miyagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory
- Patent number 8,779,503
- Issue date Jul 15, 2014
- Kabushiki Kaisha Toshiba
- Daisuke Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 8,779,498
- Issue date Jul 15, 2014
- Kabushiki Kaisha Toshiba
- Akira Takashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable resistance semiconductor memory device
- Patent number 8,772,751
- Issue date Jul 8, 2014
- Kabushiki Kaisha Toshiba
- Akira Takashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, and method for manufacturing semiconductor de...
- Patent number 8,754,467
- Issue date Jun 17, 2014
- Kabushiki Kaisha Toshiba
- Masao Shingu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 8,664,632
- Issue date Mar 4, 2014
- Kabushiki Kaisha Toshiba
- Daisuke Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,569,823
- Issue date Oct 29, 2013
- Kabushiki Kaisha Toshiba
- Tsunehiro Ino
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20250185244
- Publication date Jun 5, 2025
- KIOXIA Corporation
- Akira TAKASHIMA
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240428856
- Publication date Dec 26, 2024
- KIOXIA Corporation
- Akira TAKASHIMA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20240284677
- Publication date Aug 22, 2024
- KIOXIA Corporation
- Chihiro UMEDA
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240258401
- Publication date Aug 1, 2024
- KIOXIA Corporation
- Yusuke NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING
- Publication number 20230413554
- Publication date Dec 21, 2023
- KIOXIA Corporation
- Yusuke NAKAJIMA
Information Patent Application
METHOD FOR MANUFACTURING OXIDE FILM, METHOD FOR MANUFACTURING SEMIC...
- Publication number 20230301089
- Publication date Sep 21, 2023
- KIOXIA Corporation
- Tsunehiro INO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR MEMORY DEV...
- Publication number 20230187203
- Publication date Jun 15, 2023
- KIOXIA Corporation
- Tsunehiro Ino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE, AND METHOD FOR M...
- Publication number 20230086074
- Publication date Mar 23, 2023
- KIOXIA Corporation
- Yusuke NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20230085754
- Publication date Mar 23, 2023
- KIOXIA Corporation
- Tsunehiro INO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20220406809
- Publication date Dec 22, 2022
- KIOXIA Corporation
- Akira TAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220254935
- Publication date Aug 11, 2022
- Kioxia Corporation
- Masaki NOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20220093634
- Publication date Mar 24, 2022
- KIOXIA Corporation
- Akira TAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20210296326
- Publication date Sep 23, 2021
- Kioxia Corporation
- Tsunehiro INO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20210257500
- Publication date Aug 19, 2021
- KIOXIA Corporation
- Masaki NOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20200303382
- Publication date Sep 24, 2020
- Toshiba Memory Corporation
- Akira TAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200279957
- Publication date Sep 3, 2020
- Toshiba Memory Corporation
- Masaki NOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20190319043
- Publication date Oct 17, 2019
- Toshiba Memory Corporation
- Akira TAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20190139981
- Publication date May 9, 2019
- Toshiba Memory Corporation
- Kazuhiro Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATION SENSOR
- Publication number 20180112999
- Publication date Apr 26, 2018
- Mitsubishi Electric Corporation
- Tomoki KUWAMURA
- G01 - MEASURING TESTING
Information Patent Application
ROTATION SENSOR
- Publication number 20170299406
- Publication date Oct 19, 2017
- Mitsubishi Electric Corporation
- Tomoki KUWAMURA
- G01 - MEASURING TESTING
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...
- Publication number 20170263640
- Publication date Sep 14, 2017
- Kabushiki Kaisha Toshiba
- Akira TAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20170077115
- Publication date Mar 16, 2017
- KABUSHIKI KAISHA TOSHIBA
- Tsunehiro INO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATION SENSOR
- Publication number 20160178399
- Publication date Jun 23, 2016
- Mitsubishi Electric Corporation
- Akira TAKASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC MEMORY, SPIN ELEMENT, AND SPIN MOS TRANSISTOR
- Publication number 20160078913
- Publication date Mar 17, 2016
- KABUSHIKI KAISHA TOSHIBA
- Tomoaki INOKUCHI
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE INCLUDING VARIABLE RESISTAN...
- Publication number 20150131363
- Publication date May 14, 2015
- KABUSHIKI KAISHA TOSHIBA
- Akira TAKASHIMA
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE INCLUDING VARIABLE RESISTAN...
- Publication number 20140376303
- Publication date Dec 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Akira TAKASHIMA
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE VARIABLE RESISTANCE ELEMENT
- Publication number 20140346434
- Publication date Nov 27, 2014
- Kabushiki Kaisha Toshiba
- Hidenori MIYAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC MEMORY, SPIN ELEMENT, AND SPIN MOS TRANSISTOR
- Publication number 20140301136
- Publication date Oct 9, 2014
- KABUSHIKI KAISHA TOSHIBA
- Tomoaki INOKUCHI
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY
- Publication number 20140167133
- Publication date Jun 19, 2014
- Kabushiki Kaisha Toshiba
- Izumi HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140061764
- Publication date Mar 6, 2014
- Kabushiki Kaisha Toshiba
- Akira TAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS

Akira Takashima

Person

Patents Grantslast 30 patents

Semiconductor device manufacturing method, semiconductor memory dev...

Memory device with ferroelectric layer

Semiconductor device with change storage layer

Semiconductor device for improving performance of a block insulator...

Semiconductor memory device

Semiconductor device

Semiconductor memory device having a charge accumulating layer incl...

Rotation sensor having ring-shaped rib

Semiconductor memory device and method for manufacturing the same w...

Rotation sensor

Semiconductor device

Nonvolatile semiconductor memory device having electron scattering...

Nonvolatile resistance change element

Rotation sensor

Magnetic memory, spin element, and spin MOS transistor

Nonvolatile variable resistance element

Nonvolatile memory device

Nonvolatile semiconductor memory

Magnetic memory, spin element, and spin MOS transistor

Nonvolatile semiconductor memory device including variable resistan...

Lanthanoid aluminate film fabrication method

Nonvolatile semiconductor memory device including variable resistan...

Nonvolatile semiconductor memory device including variable resistan...

Nonvolatile variable resistance element

Nonvolatile semiconductor memory

Nonvolatile semiconductor memory device

Variable resistance semiconductor memory device

Semiconductor device, and method for manufacturing semiconductor de...

Memory device

Semiconductor device and manufacturing method thereof

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING

METHOD FOR MANUFACTURING OXIDE FILM, METHOD FOR MANUFACTURING SEMIC...

SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR MEMORY DEV...

SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE, AND METHOD FOR M...

MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR DEVICE

ROTATION SENSOR

ROTATION SENSOR

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

ROTATION SENSOR

MAGNETIC MEMORY, SPIN ELEMENT, AND SPIN MOS TRANSISTOR

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE INCLUDING VARIABLE RESISTAN...

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE INCLUDING VARIABLE RESISTAN...

NONVOLATILE VARIABLE RESISTANCE ELEMENT

MAGNETIC MEMORY, SPIN ELEMENT, AND SPIN MOS TRANSISTOR

NONVOLATILE SEMICONDUCTOR MEMORY

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE