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Alexander Dribinsky
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Naperville, IL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
11,901,459
Issue date
Feb 13, 2024
pSemi Corporation
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit and method for controlling charge injection in radio freque...
Patent number
11,695,407
Issue date
Jul 4, 2023
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Thermal convection based accelerometer and heating control method t...
Patent number
11,293,938
Issue date
Apr 5, 2022
MEMSIC Semiconductor (TIANJIN) Co., Ltd.
Hongzhi Sun
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
RE48965
Issue date
Mar 8, 2022
pSemi Corporation
Michael A. Stuber
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
11,201,245
Issue date
Dec 14, 2021
pSemi Corporation
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit and method for controlling charge injection in radio freque...
Patent number
11,196,414
Issue date
Dec 7, 2021
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Linearity compensation circuit and sensing apparatus using the same
Patent number
10,914,792
Issue date
Feb 9, 2021
ACEINNA TRANSDUCER SYSTEMS CO., LTD.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
10,818,796
Issue date
Oct 27, 2020
pSemi Corporation
Michael A. Stuber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit and method for controlling charge injection in radio freque...
Patent number
10,804,892
Issue date
Oct 13, 2020
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit and method for controlling charge injection in radio freque...
Patent number
9,887,695
Issue date
Feb 6, 2018
Peregrine Semiconductor Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
9,608,619
Issue date
Mar 28, 2017
Peregrine Semiconductor Corporation
Michael A. Stuber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit and method for controlling charge injection in radio freque...
Patent number
9,397,656
Issue date
Jul 19, 2016
Peregrine Semiconductor Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
8,954,902
Issue date
Feb 10, 2015
Peregrine Semiconductor Corporation
Michael A. Stuber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Interface to a serial communications bus
Patent number
8,698,543
Issue date
Apr 15, 2014
Memsic, Inc.
Alexander Dribinsky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit and method for controlling charge injection in radio freque...
Patent number
8,143,935
Issue date
Mar 27, 2012
Peregrine Semiconductor Corporation
Alexander Dribinsky
Information
Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
Patent number
7,890,891
Issue date
Feb 15, 2011
Peregrine Semiconductor Corporation
Michael A. Stuber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature-gradient cancelation technique and device
Patent number
7,862,229
Issue date
Jan 4, 2011
Memsic, Inc.
Alexander Dribinsky
G01 - MEASURING TESTING
Information
Patent Grant
Power-on-reset circuit having zero static power consumption
Patent number
7,671,643
Issue date
Mar 2, 2010
Memsic, Inc.
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and circuitry for thermal accelerometer signal conditioning
Patent number
7,305,881
Issue date
Dec 11, 2007
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Thermal convection accelerometer with closed-loop heater control
Patent number
6,795,752
Issue date
Sep 21, 2004
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Segmented DAC using PMOS and NMOS switches for improved span
Patent number
5,999,115
Issue date
Dec 7, 1999
Motorola, Inc.
Lawrence E. Connell
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit for minimizing turn-on time of temperature compensated crys...
Patent number
5,977,840
Issue date
Nov 2, 1999
CTS Corporation
Lawrence E. Connell
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...
Publication number
20240266441
Publication date
Aug 8, 2024
pSemi Corporation
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Circuit and Method for Controlling Charge Injection in Radio Freque...
Publication number
20240007098
Publication date
Jan 4, 2024
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...
Publication number
20220181497
Publication date
Jun 9, 2022
pSemi Corporation
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CIRCUIT AND METHOD FOR CONTROLLING CHARGE INJECTION IN RADIO FREQUE...
Publication number
20220173731
Publication date
Jun 2, 2022
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CIRCUIT AND METHOD FOR CONTROLLING CHARGE INJECTION IN RADIO FREQUE...
Publication number
20210152170
Publication date
May 20, 2021
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
THERMAL CONVECTION BASED ACCELEROMETER AND HEATING CONTROL METHOD T...
Publication number
20210123942
Publication date
Apr 29, 2021
MEMSIC Semiconductor (TIANJIN) Co., Ltd.
Hongzhi Sun
G01 - MEASURING TESTING
Information
Patent Application
COIL AND A MANUFACTURING METHOD THEREOF
Publication number
20210035735
Publication date
Feb 4, 2021
ACEINNA Transducer Systems Co., Ltd.
Leyue Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...
Publication number
20200335633
Publication date
Oct 22, 2020
pSemi Corporation
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Magnetic Sensor Device, Self-Calibration Methods And Current Sensor
Publication number
20180372810
Publication date
Dec 27, 2018
ACEINNA Transducer Systems Co., Ltd.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Application
Linearity Compensation Circuit And Sensing Apparatus Using The Same
Publication number
20180306871
Publication date
Oct 25, 2018
ACEINNA Transducer Systems Co., Ltd.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Application
Circuit and Method for Controlling Charge Injection in Radio Freque...
Publication number
20180212599
Publication date
Jul 26, 2018
pSemi Corporation
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and Apparatus Improving Gate Oxide Reliability by Controllin...
Publication number
20170236946
Publication date
Aug 17, 2017
PEREGRINE SEMICONDUCTOR CORPORATION
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCALABLE AVERAGE CURRENT SENSOR SYSTEM
Publication number
20170115329
Publication date
Apr 27, 2017
MEMSIC, INC.
George Schuellein
G01 - MEASURING TESTING
Information
Patent Application
Circuit and Method for Controlling Charge Injection in Radio Freque...
Publication number
20160226478
Publication date
Aug 4, 2016
PEREGRINE SEMICONDUCTOR CORPORATION
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Circuit and Method for Controlling Charge Injection in Radio Freque...
Publication number
20150015321
Publication date
Jan 15, 2015
PEREGRINE SEMICONDUCTOR CORPORATION
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TIP-OVER SENSOR
Publication number
20140372074
Publication date
Dec 18, 2014
Alexander Dribinsky
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus Improving Gate Oxide Reliability by Controllin...
Publication number
20140167834
Publication date
Jun 19, 2014
PEREGRINE SEMICONDUCTOR CORPORATION
Michael A. Stuber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus Improving Gate Oxide Reliability by Controllin...
Publication number
20110227637
Publication date
Sep 22, 2011
Michael A. Stuber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Temperature-gradient cancelation technique and device
Publication number
20100045362
Publication date
Feb 25, 2010
MEMSIC. INC.
Alexander Dribinsky
G01 - MEASURING TESTING
Information
Patent Application
Power-on-reset circuit having zero static power consumption
Publication number
20090174444
Publication date
Jul 9, 2009
Memsic, Inc.
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Circuit and method for controlling charge injection in radio freque...
Publication number
20080076371
Publication date
Mar 27, 2008
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and apparatus improving gate oxide reliability by controllin...
Publication number
20070069291
Publication date
Mar 29, 2007
Michael A. Stuber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and circuitry for thermal accelerometer signal conditioning
Publication number
20050274180
Publication date
Dec 15, 2005
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING