Alexander J. Swinton

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Sub-quarter-micron copper interconnections with improved electromig...
- Patent number 6,258,710
- Issue date Jul 10, 2001
- International Business Machines Corporation
- Hazara S. Rathore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sub-quarter-micron copper interconnections with improved electromig...
- Patent number 6,069,068
- Issue date May 30, 2000
- International Business Machines Corporation
- Hazara S. Rathore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple device test layout
- Patent number 6,037,795
- Issue date Mar 14, 2000
- International Business Machines Corporation
- Ronald G. Filippi
- G01 - MEASURING TESTING