Anatoly N. Verenchikov

Person

St. Petersburg, RU

People

Patents Grantslast 30 patents

Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 11,742,192
- Issue date Aug 29, 2023
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometer
- Patent number 11,158,495
- Issue date Oct 26, 2021
- Leco Corporation
- Viatcheslav Artaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GC-TOF MS with improved detection limit
- Patent number 10,794,879
- Issue date Oct 6, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Right angle time-of-flight detector with an extended life time
- Patent number 10,770,280
- Issue date Sep 8, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 10,741,377
- Issue date Aug 11, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror and ion-optical lens for imaging
- Patent number 10,636,646
- Issue date Apr 28, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,629,425
- Issue date Apr 21, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,593,533
- Issue date Mar 17, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 10,593,534
- Issue date Mar 17, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 10,541,123
- Issue date Jan 21, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 10,431,442
- Issue date Oct 1, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GC-TOF MS with improved detection limit
- Patent number 10,416,131
- Issue date Sep 17, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soft ionization based on conditioned glow discharge for quantitativ...
- Patent number 10,373,814
- Issue date Aug 6, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- G01 - MEASURING TESTING
Information Patent Grant
Ion trap mass spectrometer
- Patent number 10,354,855
- Issue date Jul 16, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 10,211,039
- Issue date Feb 19, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soft ionization based on conditioned glow discharge for quantitativ...
- Patent number 10,192,723
- Issue date Jan 29, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight analyzer
- Patent number 10,163,616
- Issue date Dec 25, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 10,153,148
- Issue date Dec 11, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 10,153,149
- Issue date Dec 11, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 10,049,867
- Issue date Aug 14, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of targeted mass spectrometric analysis
- Patent number 10,006,892
- Issue date Jun 26, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic mass spectrometer with encoded frequent pulses
- Patent number 9,984,862
- Issue date May 29, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometer with axial pulsed...
- Patent number 9,984,863
- Issue date May 29, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cylindrical multi-reflecting time-of-flight mass spectrometer
- Patent number 9,941,107
- Issue date Apr 10, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 9,881,780
- Issue date Jan 30, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer
- Patent number 9,865,445
- Issue date Jan 9, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 9,786,482
- Issue date Oct 10, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for tandem mass spectrometry
- Patent number 9,779,923
- Issue date Oct 3, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 9,768,007
- Issue date Sep 19, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 9,768,008
- Issue date Sep 19, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURAL ANALYSIS OF IONISED MOLECULES
- Publication number 20210270773
- Publication date Sep 2, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. MAKAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTING MASS SPECTROMETER WITH HIGH THROUGHPUT
- Publication number 20200185211
- Publication date Jun 11, 2020
- LECO CORPORATION
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Time-of-Flight Mass Spectrometer
- Publication number 20200090919
- Publication date Mar 19, 2020
- Leco Corporation
- Viatcheslav Artaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Trap Mass Spectrometer With Improved Ion Injection
- Publication number 20200013601
- Publication date Jan 9, 2020
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GC-TOF MS with Improved Detection Limit
- Publication number 20190360981
- Publication date Nov 28, 2019
- LECO CORPORATION
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20190295835
- Publication date Sep 26, 2019
- LECO CORPORATION
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer with High Throughput
- Publication number 20190180999
- Publication date Jun 13, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Soft Ionization Based on Conditioned Glow Discharge for Quantitativ...
- Publication number 20190157056
- Publication date May 23, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20190157062
- Publication date May 23, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20180366313
- Publication date Dec 20, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING
- Publication number 20180358219
- Publication date Dec 13, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20180330936
- Publication date Nov 15, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer with High Throughput
- Publication number 20180174816
- Publication date Jun 21, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20170372883
- Publication date Dec 28, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20170365456
- Publication date Dec 21, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20170365457
- Publication date Dec 21, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Trap Mass Spectrometer With Improved Ion Injection
- Publication number 20170338088
- Publication date Nov 23, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A Multi-Reflecting Time-of-Flight Analyzer
- Publication number 20170338094
- Publication date Nov 23, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Soft Ionization Based on Conditioned Glow Discharge for Quantitativ...
- Publication number 20170278688
- Publication date Sep 28, 2017
- Leco Corporation
- Anatoly N. VERENCHIKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GC-TOF MS with Improved Detection Limit
- Publication number 20170168031
- Publication date Jun 15, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- G01 - MEASURING TESTING
Information Patent Application
Multi-Reflecting Time-of-Flight Mass Spectrometer with Axial Pulsed...
- Publication number 20170032952
- Publication date Feb 2, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- G01 - MEASURING TESTING
Information Patent Application
Right Angle Time-of-Flight Detector With An Extended Life Time
- Publication number 20170025265
- Publication date Jan 26, 2017
- Leco Corporation
- Anatoly N. VERENCHIKOV
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TARGETED MASS SPECTROMETRIC ANALYSIS
- Publication number 20170016863
- Publication date Jan 19, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Mass Spectrometer With Encoded Frequent Pulses
- Publication number 20160343561
- Publication date Nov 24, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Open Trap Mass Spectrometer
- Publication number 20160240363
- Publication date Aug 18, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer With High Throughput
- Publication number 20160155624
- Publication date Jun 2, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Tandem Mass Spectrometry
- Publication number 20160035552
- Publication date Feb 4, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer
- Publication number 20160035558
- Publication date Feb 4, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20160013040
- Publication date Jan 14, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Mass Spectrometer
- Publication number 20160005582
- Publication date Jan 7, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS

Anatoly N. Verenchikov

Person

Patents Grantslast 30 patents

Electrostatic trap mass spectrometer with improved ion injection

Multi-reflecting time-of-flight mass spectrometer

GC-TOF MS with improved detection limit

Right angle time-of-flight detector with an extended life time

Multi-reflecting mass spectrometer with high throughput

Ion mirror and ion-optical lens for imaging

Imaging mass spectrometer

Imaging mass spectrometer

Multi-reflecting mass spectrometer with high throughput

Ion trap mass spectrometer

Electrostatic trap mass spectrometer with improved ion injection

GC-TOF MS with improved detection limit

Soft ionization based on conditioned glow discharge for quantitativ...

Ion trap mass spectrometer

Multi-reflecting mass spectrometer with high throughput

Soft ionization based on conditioned glow discharge for quantitativ...

Multi-reflecting time-of-flight analyzer

Ion trap mass spectrometer

Ion trap mass spectrometer

Ion trap mass spectrometer

Method of targeted mass spectrometric analysis

Electrostatic mass spectrometer with encoded frequent pulses

Multi-reflecting time-of-flight mass spectrometer with axial pulsed...

Cylindrical multi-reflecting time-of-flight mass spectrometer

Multi-reflecting mass spectrometer with high throughput

Multi-reflecting mass spectrometer

Ion trap mass spectrometer

Method and system for tandem mass spectrometry

Ion trap mass spectrometer

Ion trap mass spectrometer

Patents Applicationslast 30 patents

STRUCTURAL ANALYSIS OF IONISED MOLECULES

MULTI-REFLECTING MASS SPECTROMETER WITH HIGH THROUGHPUT

Multi-Reflecting Time-of-Flight Mass Spectrometer

Electrostatic Trap Mass Spectrometer With Improved Ion Injection

GC-TOF MS with Improved Detection Limit

Ion Trap Mass Spectrometer

Multi-Reflecting Mass Spectrometer with High Throughput

Soft Ionization Based on Conditioned Glow Discharge for Quantitativ...

Ion Trap Mass Spectrometer

IMAGING MASS SPECTROMETER

IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING

IMAGING MASS SPECTROMETER

Multi-Reflecting Mass Spectrometer with High Throughput

Ion Trap Mass Spectrometer

Ion Trap Mass Spectrometer

Ion Trap Mass Spectrometer

Electrostatic Trap Mass Spectrometer With Improved Ion Injection

A Multi-Reflecting Time-of-Flight Analyzer

Soft Ionization Based on Conditioned Glow Discharge for Quantitativ...

GC-TOF MS with Improved Detection Limit

Multi-Reflecting Time-of-Flight Mass Spectrometer with Axial Pulsed...

Right Angle Time-of-Flight Detector With An Extended Life Time

METHOD OF TARGETED MASS SPECTROMETRIC ANALYSIS

Electrostatic Mass Spectrometer With Encoded Frequent Pulses

Open Trap Mass Spectrometer

Multi-Reflecting Mass Spectrometer With High Throughput

Method and System for Tandem Mass Spectrometry

Multi-Reflecting Mass Spectrometer

Ion Trap Mass Spectrometer

Ion Trap Mass Spectrometer