Andrew C. McNeil

Person

Chandler, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inertial sensor sampling with combined sense axes
- Patent number 11,726,107
- Issue date Aug 15, 2023
- NXP USA, INC.
- Andrew C McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Z-axis inertial sensor with extended motion stops
- Patent number 11,499,987
- Issue date Nov 15, 2022
- NXP USA, INC.
- Andrew C McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Inertial sensor with suspension spring structure surrounding anchor
- Patent number 11,029,327
- Issue date Jun 8, 2021
- NXP USA, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
Single axis inertial sensor with suppressed parasitic modes
- Patent number 10,809,277
- Issue date Oct 20, 2020
- NXP USA, INC.
- Jun Tang
- G01 - MEASURING TESTING
Information Patent Grant
Inertial sensor with single proof mass and multiple sense axis capa...
- Patent number 10,794,701
- Issue date Oct 6, 2020
- NXP USA, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
Flexure with enhanced torsional stiffness and MEMS device incorpora...
- Patent number 10,712,359
- Issue date Jul 14, 2020
- NXP USA, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor with differential capacitive output
- Patent number 10,107,701
- Issue date Oct 23, 2018
- NXP USA, INC.
- Andrew C. McNeil
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Microelectromechanical system devices having crack resistant membra...
- Patent number 9,926,187
- Issue date Mar 27, 2018
- NXP USA, INC.
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Actively preventing charge induced leakage of semiconductor devices
- Patent number 9,790,085
- Issue date Oct 17, 2017
- NXP USA, INC.
- Dubravka Bilic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electrically conductive barriers for integrated circuits
- Patent number 9,714,879
- Issue date Jul 25, 2017
- NXP USA, INC.
- Chad S. Dawson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS device with common mode rejection structure
- Patent number 9,689,677
- Issue date Jun 27, 2017
- NXP USA, INC.
- Peng Shao
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with over-travel stop structure and method of fabrication
- Patent number 9,638,712
- Issue date May 2, 2017
- NXP USA, INC.
- Jun Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS device having variable gap width and method of manufacture
- Patent number 9,573,799
- Issue date Feb 21, 2017
- NXP USA, INC.
- Andrew C. McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multiple axis rate sensor
- Patent number 9,506,756
- Issue date Nov 29, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating an inertial sensor
- Patent number 9,500,669
- Issue date Nov 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Margaret L. Kniffin
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor with differential capacitive output
- Patent number 9,290,067
- Issue date Mar 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Stiction resistant mems device and method of operation
- Patent number 9,190,937
- Issue date Nov 17, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS device assembly and method of packaging same
- Patent number 9,131,325
- Issue date Sep 8, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Combined environmental parameter sensor
- Patent number 9,103,705
- Issue date Aug 11, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Dubravka Bilic
- G01 - MEASURING TESTING
Information Patent Grant
MEMS sensor with stress isolation and method of fabrication
- Patent number 8,925,384
- Issue date Jan 6, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device having variable gap width and method of manufacture
- Patent number 8,927,311
- Issue date Jan 6, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Microelectromechanical system devices having crack resistant membra...
- Patent number 8,921,952
- Issue date Dec 30, 2014
- Freescale Semiconductor Inc.
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Inertial sensor with off-axis spring system
- Patent number 8,739,627
- Issue date Jun 3, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Gary G. Li
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with central anchor for stress isolation
- Patent number 8,610,222
- Issue date Dec 17, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS sensor with folded torsion springs
- Patent number 8,555,719
- Issue date Oct 15, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
MEMS sensor with dual proof masses
- Patent number 8,539,836
- Issue date Sep 24, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Grant
Resonant accelerometer with low sensitivity to package stress
- Patent number 8,468,887
- Issue date Jun 25, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Laterally integrated MEMS sensor device with multi-stimulus sensing
- Patent number 8,387,464
- Issue date Mar 5, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Accelerometer with over-travel stop structure
- Patent number 8,186,220
- Issue date May 29, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Aaron A. Geisberger
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor with stress relief that compensates for package s...
- Patent number 8,096,182
- Issue date Jan 17, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMS ACCELEROMETER WITH VERTICAL STOPS
- Publication number 20240329076
- Publication date Oct 3, 2024
- NXP USA, Inc.
- Jun Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM FOR READING PRESSURE OF A PRESSURE SENSOR AND METHOD THEREFOR
- Publication number 20240192072
- Publication date Jun 13, 2024
- NXP USA, Inc.
- Andrew C. McNeil
- B60 - VEHICLES IN GENERAL
Information Patent Application
REDUNDANT SENSOR SYSTEM WITH SELF-TEST OF ELECTROMECHANICAL STRUCTURES
- Publication number 20220089435
- Publication date Mar 24, 2022
- NXP USA, Inc.
- Marc Edward Holbein
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR WITH SPLIT ANCHORS AND FLEXURE COMPLIANCE BETWEEN T...
- Publication number 20220050124
- Publication date Feb 17, 2022
- NXP USA, Inc.
- Fengyuan Li
- G01 - MEASURING TESTING
Information Patent Application
Z-AXIS INERTIAL SENSOR WITH EXTENDED MOTION STOPS
- Publication number 20210396781
- Publication date Dec 23, 2021
- NXP USA, Inc.
- Andrew C. McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
REDUNDANT SENSOR SYSTEM WITH SELF-TEST OF ELECTROMECHANICAL STRUCTURES
- Publication number 20210155473
- Publication date May 27, 2021
- NXP USA, Inc.
- Marc Edward Holbein
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR SAMPLING WITH COMBINED SENSE AXES
- Publication number 20210123946
- Publication date Apr 29, 2021
- NXP USA, Inc.
- Andrew C McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR WITH SUSPENSION SPRING STRUCTURE SURROUNDING ANCHOR
- Publication number 20200132713
- Publication date Apr 30, 2020
- NXP USA, Inc.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Application
FLEXURE WITH ENHANCED TORSIONAL STIFFNESS AND MEMS DEVICE INCORPORA...
- Publication number 20190339301
- Publication date Nov 7, 2019
- NXP USA, Inc.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL SENSOR WITH SINGLE PROOF MASS AND MULTIPLE SENSE AXIS CAPA...
- Publication number 20190339078
- Publication date Nov 7, 2019
- NXP USA, Inc.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Application
SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES
- Publication number 20190187169
- Publication date Jun 20, 2019
- NXP USA, Inc.
- Jun Tang
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20170341926
- Publication date Nov 30, 2017
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS SENSOR DEVICE HAVING INTEGRATED MULTIPLE STIMULUS SENSING
- Publication number 20170115322
- Publication date Apr 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- FENGYUAN LI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE BARRIERS FOR INTEGRATED CIRCUITS
- Publication number 20170052082
- Publication date Feb 23, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR DEVICES HAVING A SELF-TEST MODE
- Publication number 20170003315
- Publication date Jan 5, 2017
- FREESCALE SEMICONDUCTOR, INC.
- JEROME ROMAIN ENJALBERT
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE WITH COMMON MODE REJECTION STRUCTURE
- Publication number 20160370182
- Publication date Dec 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- PENG SHAO
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE WITH OVER-TRAVEL STOP STRUCTURE AND METHOD OF FABRICATION
- Publication number 20160216290
- Publication date Jul 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- JUN TANG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRESSURE SENSOR WITH DIFFERENTIAL CAPACITIVE OUTPUT
- Publication number 20160169760
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- ANDREW C. MCNEIL
- G01 - MEASURING TESTING
Information Patent Application
SENSOR WITH COMBINED SENSE ELEMENTS FOR MULTIPLE AXIS SENSING
- Publication number 20150268269
- Publication date Sep 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Kemiao Jia
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR WITH TRIM CAPACITANCE AND METHOD OF TRIMMING OFFSET
- Publication number 20150268268
- Publication date Sep 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL SENSOR
- Publication number 20150198628
- Publication date Jul 16, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Margaret L. Kniffin
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20150059484
- Publication date Mar 5, 2015
- Chad S Dawson
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE AXIS RATE SENSOR
- Publication number 20140260610
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE HAVING VARIABLE GAP WIDTH AND METHOD OF MANUFACTURE
- Publication number 20140260616
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SPRING SYSTEM FOR MEMS DEVICE
- Publication number 20140230549
- Publication date Aug 21, 2014
- Freescale Semiconductor, Inc.
- Andrew C. McNeil
- G01 - MEASURING TESTING
Information Patent Application
STICTION RESISTANT MEMS DEVICE AND METHOD OF OPERATION
- Publication number 20140217929
- Publication date Aug 7, 2014
- Yizhen Lin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20140210018
- Publication date Jul 31, 2014
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING AN INERTIAL SENSOR
- Publication number 20140074418
- Publication date Mar 13, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR WITH DIFFERENTIAL CAPACITIVE OUTPUT
- Publication number 20140060169
- Publication date Mar 6, 2014
- Andrew C. McNeil
- B60 - VEHICLES IN GENERAL
Information Patent Application
MEMS SENSOR WITH STRESS ISOLATION AND METHOD OF FABRICATION
- Publication number 20130319117
- Publication date Dec 5, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Andrew C. McNeil
- G01 - MEASURING TESTING

Andrew C. McNeil

Person

Patents Grantslast 30 patents

Inertial sensor sampling with combined sense axes

Z-axis inertial sensor with extended motion stops

Inertial sensor with suspension spring structure surrounding anchor

Single axis inertial sensor with suppressed parasitic modes

Inertial sensor with single proof mass and multiple sense axis capa...

Flexure with enhanced torsional stiffness and MEMS device incorpora...

Pressure sensor with differential capacitive output

Microelectromechanical system devices having crack resistant membra...

Actively preventing charge induced leakage of semiconductor devices

Electrically conductive barriers for integrated circuits

MEMS device with common mode rejection structure

MEMS device with over-travel stop structure and method of fabrication

MEMS device having variable gap width and method of manufacture

Multiple axis rate sensor

System and method for calibrating an inertial sensor

Pressure sensor with differential capacitive output

Stiction resistant mems device and method of operation

MEMS device assembly and method of packaging same

Combined environmental parameter sensor

MEMS sensor with stress isolation and method of fabrication

MEMS device having variable gap width and method of manufacture

Microelectromechanical system devices having crack resistant membra...

Inertial sensor with off-axis spring system

MEMS device with central anchor for stress isolation

MEMS sensor with folded torsion springs

MEMS sensor with dual proof masses

Resonant accelerometer with low sensitivity to package stress

Laterally integrated MEMS sensor device with multi-stimulus sensing

Accelerometer with over-travel stop structure

Capacitive sensor with stress relief that compensates for package s...

Patents Applicationslast 30 patents

MEMS ACCELEROMETER WITH VERTICAL STOPS

SYSTEM FOR READING PRESSURE OF A PRESSURE SENSOR AND METHOD THEREFOR

REDUNDANT SENSOR SYSTEM WITH SELF-TEST OF ELECTROMECHANICAL STRUCTURES

INERTIAL SENSOR WITH SPLIT ANCHORS AND FLEXURE COMPLIANCE BETWEEN T...

Z-AXIS INERTIAL SENSOR WITH EXTENDED MOTION STOPS

REDUNDANT SENSOR SYSTEM WITH SELF-TEST OF ELECTROMECHANICAL STRUCTURES

INERTIAL SENSOR SAMPLING WITH COMBINED SENSE AXES

INERTIAL SENSOR WITH SUSPENSION SPRING STRUCTURE SURROUNDING ANCHOR

FLEXURE WITH ENHANCED TORSIONAL STIFFNESS AND MEMS DEVICE INCORPORA...

INERTIAL SENSOR WITH SINGLE PROOF MASS AND MULTIPLE SENSE AXIS CAPA...

SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

MEMS SENSOR DEVICE HAVING INTEGRATED MULTIPLE STIMULUS SENSING

ELECTRICALLY CONDUCTIVE BARRIERS FOR INTEGRATED CIRCUITS

MEMS SENSOR DEVICES HAVING A SELF-TEST MODE

MEMS DEVICE WITH COMMON MODE REJECTION STRUCTURE

MEMS DEVICE WITH OVER-TRAVEL STOP STRUCTURE AND METHOD OF FABRICATION

PRESSURE SENSOR WITH DIFFERENTIAL CAPACITIVE OUTPUT

SENSOR WITH COMBINED SENSE ELEMENTS FOR MULTIPLE AXIS SENSING

INERTIAL SENSOR WITH TRIM CAPACITANCE AND METHOD OF TRIMMING OFFSET

SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL SENSOR

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

MULTIPLE AXIS RATE SENSOR

MEMS DEVICE HAVING VARIABLE GAP WIDTH AND METHOD OF MANUFACTURE

SPRING SYSTEM FOR MEMS DEVICE

STICTION RESISTANT MEMS DEVICE AND METHOD OF OPERATION

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

METHOD AND SYSTEM FOR CALIBRATING AN INERTIAL SENSOR

PRESSURE SENSOR WITH DIFFERENTIAL CAPACITIVE OUTPUT

MEMS SENSOR WITH STRESS ISOLATION AND METHOD OF FABRICATION