Anthony J. Suto

Person

Leominster, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Identifying potentially-defective picture elements in an active-mat...
- Patent number 10,615,230
- Issue date Apr 7, 2020
- Teradyne, Inc.
- Jason A. Messier
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Test fixture
- Patent number 9,977,052
- Issue date May 22, 2018
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive opens testing of low profile components
- Patent number 9,778,314
- Issue date Oct 3, 2017
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing electrical connections on a printe...
- Patent number 9,638,742
- Issue date May 2, 2017
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Electronic assembly test system
- Patent number 9,459,312
- Issue date Oct 4, 2016
- Teradyne, Inc.
- John Joseph Arena
- G01 - MEASURING TESTING
Information Patent Grant
Fast open circuit detection for open power and ground pins
- Patent number 8,760,183
- Issue date Jun 24, 2014
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Low capacitance probe for testing circuit assembly
- Patent number 8,760,185
- Issue date Jun 24, 2014
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Identifying fuel cell defects
- Patent number 8,618,810
- Issue date Dec 31, 2013
- Teradyne, Inc.
- Anthony J. Suto
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Test access component for automatic testing of circuit assemblies
- Patent number 8,604,820
- Issue date Dec 10, 2013
- Teradyne, Inc.
- Anthony J. Suto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Capacitive opens testing in low signal environments
- Patent number 8,310,256
- Issue date Nov 13, 2012
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-board tester with backdrive-based burst timing
- Patent number 6,175,230
- Issue date Jan 16, 2001
- GenRad, Inc.
- Michael W. Hamblin
- G01 - MEASURING TESTING
Information Patent Grant
Direct-measurement provision of safe backdrive levels
- Patent number 6,114,848
- Issue date Sep 5, 2000
- Genrad, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Ground-loop interruption circuit
- Patent number 5,103,109
- Issue date Apr 7, 1992
- GenRad, Inc.
- Moses Khazam
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
IDENTIFYING POTENTIALLY-DEFECTIVE PICTURE ELEMENTS IN AN ACTIVE-MAT...
- Publication number 20190140032
- Publication date May 9, 2019
- Teradyne, Inc.
- Jason A. Messier
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
TEST FIXTURE
- Publication number 20180095109
- Publication date Apr 5, 2018
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION TESTING TOOL
- Publication number 20170292873
- Publication date Oct 12, 2017
- Teradyne, Inc.
- Robert M. Schleicher
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE OPENS TESTING OF LOW PROFILE COMPONENTS
- Publication number 20160054385
- Publication date Feb 25, 2016
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC ASSEMBLY TEST SYSTEM
- Publication number 20140306728
- Publication date Oct 16, 2014
- Teradyne, Inc.
- John Joseph Arena
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING FUEL CELL DEFECTS
- Publication number 20120225366
- Publication date Sep 6, 2012
- Teradyne, Inc.
- Anthony J. Suto
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
FAST OPEN CIRCUIT DETECTION FOR OPEN POWER AND GROUND PINS
- Publication number 20110210759
- Publication date Sep 1, 2011
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING ELECTRICAL CONNECTIONS ON A PRINTE...
- Publication number 20110204910
- Publication date Aug 25, 2011
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY
- Publication number 20110148450
- Publication date Jun 23, 2011
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS
- Publication number 20110148446
- Publication date Jun 23, 2011
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
TEST ACCESS COMPONENT FOR AUTOMATIC TESTING OF CIRCUIT ASSEMBLIES
- Publication number 20100207651
- Publication date Aug 19, 2010
- Teradyne, Inc.
- Anthony J. Suto
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Anthony J. Suto

Person

Patents Grantslast 30 patents

Identifying potentially-defective picture elements in an active-mat...

Test fixture

Capacitive opens testing of low profile components

Method and apparatus for testing electrical connections on a printe...

Electronic assembly test system

Fast open circuit detection for open power and ground pins

Low capacitance probe for testing circuit assembly

Identifying fuel cell defects

Test access component for automatic testing of circuit assemblies

Capacitive opens testing in low signal environments

Circuit-board tester with backdrive-based burst timing

Direct-measurement provision of safe backdrive levels

Ground-loop interruption circuit

Patents Applicationslast 30 patents

IDENTIFYING POTENTIALLY-DEFECTIVE PICTURE ELEMENTS IN AN ACTIVE-MAT...

TEST FIXTURE

VIBRATION TESTING TOOL

CAPACITIVE OPENS TESTING OF LOW PROFILE COMPONENTS

ELECTRONIC ASSEMBLY TEST SYSTEM

IDENTIFYING FUEL CELL DEFECTS

FAST OPEN CIRCUIT DETECTION FOR OPEN POWER AND GROUND PINS

METHOD AND APPARATUS FOR TESTING ELECTRICAL CONNECTIONS ON A PRINTE...

LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY

CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS

TEST ACCESS COMPONENT FOR AUTOMATIC TESTING OF CIRCUIT ASSEMBLIES