Anthony Michael Palagonia

Person

Underhill, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for preventing thermal failure in a semiconduc...
- Patent number 6,425,092
- Issue date Jul 23, 2002
- International Business Machines Corporation
- Richard J. Evans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Micro probe and method of fabricating same
- Patent number 6,400,166
- Issue date Jun 4, 2002
- International Business Machines Corporation
- Gordon M. Babson
- G01 - MEASURING TESTING
Information Patent Grant
Micro fusible link for semiconductor devices and method of manufacture
- Patent number 6,333,546
- Issue date Dec 25, 2001
- International Business Machines Corporation
- Patricia Marmillion
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro fusible link for semiconductor devices and method of manufacture
- Patent number 6,294,453
- Issue date Sep 25, 2001
- International Business Machines Corp.
- Patricia E. Marmillion
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cooling method for silicon on insulator devices
- Patent number 6,242,778
- Issue date Jun 5, 2001
- International Business Machines Corporation
- Patricia McGuinness Marmillion
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabrication of silicon on insulator substrates
- Patent number 6,239,469
- Issue date May 29, 2001
- International Business Machines Corporation
- Ronald Jay Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro probe ring assembly and method of fabrication
- Patent number 6,232,143
- Issue date May 15, 2001
- International Business Machines Corporation
- John Thomas Maddix
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabrication of silicon on insulator substrates
- Patent number 6,194,253
- Issue date Feb 27, 2001
- International Business Machines Corporation
- Ronald Jay Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an interposer for making temporary contact with...
- Patent number 6,188,231
- Issue date Feb 13, 2001
- International Business Machines Corporation
- Anthony Michael Palagonia
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for removing slurry particles
- Patent number 6,171,436
- Issue date Jan 9, 2001
- International Business Machines Corporation
- Cuc K. Huynh
- B24 - GRINDING POLISHING
Information Patent Grant
Laser fusible link
- Patent number 6,160,302
- Issue date Dec 12, 2000
- International Business Machines Corporation
- Anthony M. Palagonia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro probe assembly and method of fabrication
- Patent number 6,059,982
- Issue date May 9, 2000
- International Business Machines Corporation
- Anthony Michael Palagonia
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for cooling an electronic device
- Patent number 6,050,326
- Issue date Apr 18, 2000
- International Business Machines Corporation
- Richard J. Evans
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Multichip module
- Patent number 6,037,661
- Issue date Mar 14, 2000
- International Business Machines
- Anthony M. Palagonia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing integrated circuit chips
- Patent number 6,037,786
- Issue date Mar 14, 2000
- International Business Machines Corporation
- Anthony Michael Palagonia
- G01 - MEASURING TESTING
Information Patent Grant
Micro probe ring assembly and method of fabrication
- Patent number 6,014,032
- Issue date Jan 11, 2000
- International Business Machines Corporation
- John Thomas Maddix
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical polisher
- Patent number 5,944,588
- Issue date Aug 31, 1999
- International Business Machines Corporation
- Patricia M. Marmillion
- B24 - GRINDING POLISHING
Information Patent Grant
Method of planarizing a workpiece
- Patent number 5,934,977
- Issue date Aug 10, 1999
- International Business Machines Corporation
- Patricia E. Marmillion
- B24 - GRINDING POLISHING
Information Patent Grant
Methods for precise definition of integrated circuit chip edges
- Patent number 5,925,924
- Issue date Jul 20, 1999
- International Business Machines Corporation
- John Edward Cronin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer with elevated contact substructures
- Patent number 5,907,785
- Issue date May 25, 1999
- International Business Machines Corporation
- Anthony Michael Palagonia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of removing slurry particles
- Patent number 5,896,870
- Issue date Apr 27, 1999
- International Business Machines Corporation
- Cuc K. Huynh
- B24 - GRINDING POLISHING
Information Patent Grant
High density signal multiplexing interposer
- Patent number 5,895,978
- Issue date Apr 20, 1999
- International Business Machines Corporation
- Anthony Michael Palagonia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer with elevated contact structures
- Patent number 5,874,782
- Issue date Feb 23, 1999
- International Business Machines Corporation
- Anthony Michael Palagonia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stacked three dimensional device manufacture
- Patent number 5,872,025
- Issue date Feb 16, 1999
- International Business Machines Corporation
- John E. Cronin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planarizing apparatus with deflectable polishing pad
- Patent number 5,785,584
- Issue date Jul 28, 1998
- International Business Machines Corporation
- Patricia E. Marmillion
- B24 - GRINDING POLISHING
Information Patent Grant
Lead on chip lead frame design without jumpover wiring
- Patent number 5,751,057
- Issue date May 12, 1998
- International Business Machines Corporation
- Anthony Michael Palagonia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for precise definition of integrated circuit chip edges
- Patent number 5,691,248
- Issue date Nov 25, 1997
- International Business Machines Corporation
- John Edward Cronin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication, testing and repair of multichip semiconductor structur...
- Patent number 5,679,609
- Issue date Oct 21, 1997
- International Business Machines Corporation
- Bruno Roberto Aimi
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication, testing and repair of multichip semiconductor structur...
- Patent number 5,661,330
- Issue date Aug 26, 1997
- International Business Machines Corporation
- Bruno Roberto Aimi
- G01 - MEASURING TESTING
Information Patent Grant
Sidewall spacer using an overhang
- Patent number 5,651,857
- Issue date Jul 29, 1997
- International Business Machines Corporation
- John Edward Cronin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICRO PROBE AND METHOD OF FABRICATING SAME
- Publication number 20020005728
- Publication date Jan 17, 2002
- GORDON M. BABSON
- G01 - MEASURING TESTING

Anthony Michael Palagonia

Person

Patents Grantslast 30 patents

Method and apparatus for preventing thermal failure in a semiconduc...

Micro probe and method of fabricating same

Micro fusible link for semiconductor devices and method of manufacture

Micro fusible link for semiconductor devices and method of manufacture

Cooling method for silicon on insulator devices

Method for fabrication of silicon on insulator substrates

Micro probe ring assembly and method of fabrication

Method for fabrication of silicon on insulator substrates

Method for forming an interposer for making temporary contact with...

Apparatus for removing slurry particles

Laser fusible link

Micro probe assembly and method of fabrication

Method and apparatus for cooling an electronic device

Multichip module

Testing integrated circuit chips

Micro probe ring assembly and method of fabrication

Chemical mechanical polisher

Method of planarizing a workpiece

Methods for precise definition of integrated circuit chip edges

Wafer with elevated contact substructures

Method of removing slurry particles

High density signal multiplexing interposer

Wafer with elevated contact structures

Method for stacked three dimensional device manufacture

Planarizing apparatus with deflectable polishing pad

Lead on chip lead frame design without jumpover wiring

Methods for precise definition of integrated circuit chip edges

Fabrication, testing and repair of multichip semiconductor structur...

Fabrication, testing and repair of multichip semiconductor structur...

Sidewall spacer using an overhang

Patents Applicationslast 30 patents

MICRO PROBE AND METHOD OF FABRICATING SAME