Anthony Stoughton

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Seattle, WA, US

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Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TEST RESULT COMMUNICATION
- Publication number 20070220737
- Publication date Sep 27, 2007
- Anthony Stoughton
- G01 - MEASURING TESTING
Information Patent Application
Disabling poorly testing RFID ICs
- Publication number 20070218571
- Publication date Sep 20, 2007
- Impinj, Inc.
- Anthony Stoughton
- G06 - COMPUTING CALCULATING COUNTING