Arun Balakrishnan

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Piscataway, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Peripheral partitioning and tree decomposition for partial scan
- Patent number 6,732,310
- Issue date May 4, 2004
- NEC Corporation
- Srimat Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Multi-level power macromodeling
- Patent number 6,625,781
- Issue date Sep 23, 2003
- NEC Electronics, Inc.
- Wolfgang Roethig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Peripheral partitioning and tree decomposition for partial scan
- Patent number 6,505,316
- Issue date Jan 7, 2003
- NEC USA, Inc.
- Srimat Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
System and method for representing a system level RTL design using...
- Patent number 6,135,647
- Issue date Oct 24, 2000
- LSI Logic Corporation
- Arun Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Peripheral partitioning and tree decomposition for partial scan
- Patent number 6,134,687
- Issue date Oct 17, 2000
- NEC USA, Inc.
- Srimat Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Test generation of sequential circuits using software transformations
- Patent number 5,574,734
- Issue date Nov 12, 1996
- NEC USA, Inc.
- Arun Balakrishnan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-level power macromodeling
- Publication number 20020138809
- Publication date Sep 26, 2002
- Wolfgang Roethig
- G06 - COMPUTING CALCULATING COUNTING