Asahiro Kuni

Person

Setagaya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,957,579
- Issue date Jun 7, 2011
- Hitachi, Ltd.
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,894,658
- Issue date Feb 22, 2011
- Hitachi, Ltd.
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,457,453
- Issue date Nov 25, 2008
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and apparatus using electron beam
- Patent number 7,439,504
- Issue date Oct 21, 2008
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and its apparatus for inspecting a pattern
- Patent number 7,269,280
- Issue date Sep 11, 2007
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,266,235
- Issue date Sep 4, 2007
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspecting a pattern
- Patent number 7,260,256
- Issue date Aug 21, 2007
- Renesas Technology Corporation
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and apparatus
- Patent number 7,133,550
- Issue date Nov 7, 2006
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 7,122,796
- Issue date Oct 17, 2006
- Hitachi Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting a specimen
- Patent number 7,049,587
- Issue date May 23, 2006
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit pattern inspection method and apparatus
- Patent number 6,975,754
- Issue date Dec 13, 2005
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and apparatus using electron beam
- Patent number 6,940,069
- Issue date Sep 6, 2005
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit pattern inspection method and apparatus
- Patent number 6,898,305
- Issue date May 24, 2005
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,828,554
- Issue date Dec 7, 2004
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,717,142
- Issue date Apr 6, 2004
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection method and apparatus using electron beam
- Patent number 6,614,022
- Issue date Sep 2, 2003
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Visual inspection method and apparatus therefor
- Patent number 6,587,581
- Issue date Jul 1, 2003
- Hitachi, Ltd.
- Yukio Matsuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample processing apparatus and method for removing charge on sampl...
- Patent number 6,507,029
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Norimasa Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting or measuring a sample based on...
- Patent number 6,465,781
- Issue date Oct 15, 2002
- Hitachi, Ltd.
- Norimasa Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting a pattern on a substrate
- Patent number 6,376,854
- Issue date Apr 23, 2002
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,373,054
- Issue date Apr 16, 2002
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting a pattern
- Patent number 6,347,150
- Issue date Feb 12, 2002
- Hitachi, Ltd.
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting pattern and apparatus thereof with a different...
- Patent number 6,236,057
- Issue date May 22, 2001
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 6,172,365
- Issue date Jan 9, 2001
- Hitachi Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting pattern and apparatus thereof
- Patent number 6,087,673
- Issue date Jul 11, 2000
- Hitachi, Ltd.
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection method and apparatus and semiconductor man...
- Patent number 5,986,263
- Issue date Nov 16, 1999
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method for soldered joints using x-ray imaging and appar...
- Patent number 5,463,667
- Issue date Oct 31, 1995
- Hitachi, Ltd.
- Toshiaki Ichinose
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defect in circuit pattern of a m...
- Patent number 4,814,615
- Issue date Mar 21, 1989
- Hitachi, Ltd.
- Satoru Fushimi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Substrate surface deflecting device
- Patent number 4,788,577
- Issue date Nov 29, 1988
- Hitachi, Ltd.
- Nobuyuki Akiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for alignment
- Patent number 4,777,641
- Issue date Oct 11, 1988
- Hitachi, Ltd.
- Akira Inagaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Pattern Inspection Method And Apparatus
- Publication number 20100246933
- Publication date Sep 30, 2010
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Inspection Method And Apparatus
- Publication number 20080063257
- Publication date Mar 13, 2008
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Inspection Method And Apparatus
- Publication number 20080056559
- Publication date Mar 6, 2008
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ITS APPARATUS FOR INSPECTING A PATTERN
- Publication number 20080002876
- Publication date Jan 3, 2008
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND APPARATUS
- Publication number 20070269101
- Publication date Nov 22, 2007
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and system therefor
- Publication number 20070131877
- Publication date Jun 14, 2007
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and apparatus using electron beam
- Publication number 20050263703
- Publication date Dec 1, 2005
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20050082476
- Publication date Apr 21, 2005
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Business process diagnostic method and business process diagnostic...
- Publication number 20050080647
- Publication date Apr 14, 2005
- Koji Okada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20040164244
- Publication date Aug 26, 2004
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern inspection method and apparatus using electron beam
- Publication number 20040028272
- Publication date Feb 12, 2004
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern inspection method and system therefor
- Publication number 20030062487
- Publication date Apr 3, 2003
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspecting a specimen
- Publication number 20030063792
- Publication date Apr 3, 2003
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Method and its apparatus for inspecting a pattern
- Publication number 20030007677
- Publication date Jan 9, 2003
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit pattern inspection method and apparatus
- Publication number 20020114506
- Publication date Aug 22, 2002
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20020100872
- Publication date Aug 1, 2002
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for inspecting a pattern
- Publication number 20020094120
- Publication date Jul 18, 2002
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and apparatus
- Publication number 20020057831
- Publication date May 16, 2002
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection method and apparatus
- Publication number 20020054703
- Publication date May 9, 2002
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Circuit pattern inspection method and apparatus
- Publication number 20020051565
- Publication date May 2, 2002
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection method and apparatus using electron beam
- Publication number 20020030166
- Publication date Mar 14, 2002
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of inspecting pattern and apparatus thereof
- Publication number 20010030300
- Publication date Oct 18, 2001
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection method and apparatus and semiconductor man...
- Publication number 20010002697
- Publication date Jun 7, 2001
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS

Asahiro Kuni

Person

Patents Grantslast 30 patents

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Pattern inspection method and apparatus using electron beam

Method and its apparatus for inspecting a pattern

Pattern inspection method and apparatus

Method and system for inspecting a pattern

Pattern inspection method and apparatus

Electron beam inspection method and apparatus and semiconductor man...

Apparatus for inspecting a specimen

Circuit pattern inspection method and apparatus

Pattern inspection method and apparatus using electron beam

Circuit pattern inspection method and apparatus

Electron beam inspection method and apparatus and semiconductor man...

Electron beam inspection method and apparatus and semiconductor man...

Pattern inspection method and apparatus using electron beam

Visual inspection method and apparatus therefor

Sample processing apparatus and method for removing charge on sampl...

Method and apparatus for inspecting or measuring a sample based on...

Method of inspecting a pattern on a substrate

Electron beam inspection method and apparatus and semiconductor man...

Method and system for inspecting a pattern

Method of inspecting pattern and apparatus thereof with a different...

Electron beam inspection method and apparatus and semiconductor man...

Method of inspecting pattern and apparatus thereof

Electron beam inspection method and apparatus and semiconductor man...

Inspection method for soldered joints using x-ray imaging and appar...

Method and apparatus for detecting defect in circuit pattern of a m...

Substrate surface deflecting device

Method and apparatus for alignment

Patents Applicationslast 30 patents

Pattern Inspection Method And Apparatus

Pattern Inspection Method And Apparatus

Pattern Inspection Method And Apparatus

METHOD AND ITS APPARATUS FOR INSPECTING A PATTERN

PATTERN INSPECTION METHOD AND APPARATUS

Pattern inspection method and system therefor

Pattern inspection method and apparatus using electron beam

Electron beam inspection method and apparatus and semiconductor man...

Business process diagnostic method and business process diagnostic...

Electron beam inspection method and apparatus and semiconductor man...

Pattern inspection method and apparatus using electron beam

Pattern inspection method and system therefor

Apparatus for inspecting a specimen

Method and its apparatus for inspecting a pattern

Circuit pattern inspection method and apparatus

Electron beam inspection method and apparatus and semiconductor man...

Method and system for inspecting a pattern

Pattern inspection method and apparatus

Pattern inspection method and apparatus

Circuit pattern inspection method and apparatus

Pattern inspection method and apparatus using electron beam

Method of inspecting pattern and apparatus thereof

Electron beam inspection method and apparatus and semiconductor man...