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Bassem Mortada
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Cairo, EG
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Patents Grants
last 30 patents
Information
Patent Grant
Large spot size spectrometer
Patent number
12,163,833
Issue date
Dec 10, 2024
Si-Ware Systems
Mohamed Sadek Radwan
G01 - MEASURING TESTING
Information
Patent Grant
Compact spectral analyzer
Patent number
12,061,116
Issue date
Aug 13, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Compact material analyzer
Patent number
11,841,268
Issue date
Dec 12, 2023
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Selective step coverage for micro-fabricated structures
Patent number
11,499,218
Issue date
Nov 15, 2022
Si-Ware Systems
Mostafa Medhat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Increased spectrometer field of view
Patent number
11,385,100
Issue date
Jul 12, 2022
Si-Ware Systems
Mohamed Ahmed Sadek
G01 - MEASURING TESTING
Information
Patent Grant
Self-referenced spectrometer
Patent number
11,085,825
Issue date
Aug 10, 2021
Si-Ware Systems
Mostafa Medhat
G01 - MEASURING TESTING
Information
Patent Grant
Integrated optical probe card and system for batch testing of optic...
Patent number
10,782,342
Issue date
Sep 22, 2020
Si-Ware Systems
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Selective step coverage for micro-fabricated structures
Patent number
10,562,055
Issue date
Feb 18, 2020
Si-Ware Systems
Mostafa Medhat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micro-optical bench device with highly/selectively-controlled optic...
Patent number
10,120,134
Issue date
Nov 6, 2018
Si-Ware Systems
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Self calibration for mirror positioning in optical MEMS interferome...
Patent number
9,658,053
Issue date
May 23, 2017
Si-Ware Systems
Mostafa Medhat
G02 - OPTICS
Information
Patent Grant
Self calibration for mirror positioning in optical MEMS interferome...
Patent number
9,658,107
Issue date
May 23, 2017
Si-Ware Systems
Momen Anwar
G02 - OPTICS
Information
Patent Grant
Spatial splitting-based optical MEMS interferometers
Patent number
8,922,787
Issue date
Dec 30, 2014
Si-Ware Systems
Bassem Mortada
G01 - MEASURING TESTING
Information
Patent Grant
Opto-mechanical optical path retardation multiplier for optical MEM...
Patent number
8,736,843
Issue date
May 27, 2014
Si-Ware Systems
Mostafa Medhat
G02 - OPTICS
Information
Patent Grant
Compensated MEMS FTIR spectrometer architecture
Patent number
8,531,675
Issue date
Sep 10, 2013
Si-Ware Systems, Inc.
Diaa A. Khalil
G01 - MEASURING TESTING
Information
Patent Grant
Long range travel MEMS actuator
Patent number
8,497,619
Issue date
Jul 30, 2013
Si-Ware Systems
Mostafa Medhat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
DIFFUSE MULTI-REFLECTION OPTICAL DEVICE WITH LIGHT RE-DIRECTION FOR...
Publication number
20240077419
Publication date
Mar 7, 2024
SI-WARE SYSTEMS
Mohamed Sadek Radwan
G01 - MEASURING TESTING
Information
Patent Application
OPTO-ELECTRICAL PROBE CARD PLATFORM FOR WAFER-LEVEL TESTING OF OPTI...
Publication number
20230393173
Publication date
Dec 7, 2023
SI-WARE SYSTEMS
Tarek Mohamed Zeinah
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GENERALIZED ARTIFICIAL INTELLIGENCE MODELER FOR ULTRA-WIDE-SCALE DE...
Publication number
20230304860
Publication date
Sep 28, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ON-LINE COMPENSATION OF INSTRUMENTAL RESPONSE DRIFT IN MINIATURIZED...
Publication number
20230152216
Publication date
May 18, 2023
SI-WARE SYSTEMS
Bassem Mortada
G01 - MEASURING TESTING
Information
Patent Application
HANDHELD OPTICAL SPECTROSCOPY SCANNER
Publication number
20230076993
Publication date
Mar 9, 2023
SI-WARE SYSTEMS
Botros George Iskander Shenouda
G01 - MEASURING TESTING
Information
Patent Application
COMPACT SPECTRAL ANALYZER
Publication number
20230036551
Publication date
Feb 2, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATED SPECTROSCOPIC AND AI-BASED GAS ANALYZER
Publication number
20230014558
Publication date
Jan 19, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
COMPACT SPECTROSCOPIC ANALYZER DEVICE
Publication number
20220404361
Publication date
Dec 22, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
MASS SCREENING BIOLOGICAL DETECTION SOLUTIONS
Publication number
20220397458
Publication date
Dec 15, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
LARGE SPOT SIZE SPECTROMETER
Publication number
20220390277
Publication date
Dec 8, 2022
Si-Ware Systems
Mohamed Sadek Radwan
G01 - MEASURING TESTING
Information
Patent Application
COMPACT MATERIAL ANALYZER
Publication number
20220244101
Publication date
Aug 4, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G02 - OPTICS
Information
Patent Application
INCREASED SPECTROMETER FIELD OF VIEW
Publication number
20210018365
Publication date
Jan 21, 2021
SI-WARE SYSTEMS
Mohamed Ahmed Sadek
G01 - MEASURING TESTING
Information
Patent Application
SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES
Publication number
20200130006
Publication date
Apr 30, 2020
SI-WARE SYSTEMS
Mostafa Medhat
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SELF-REFERENCED SPECTROMETER
Publication number
20190301939
Publication date
Oct 3, 2019
SI-WARE SYSTEMS
Mostafa Medhat
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...
Publication number
20180143245
Publication date
May 24, 2018
SI-WARE SYSTEMS
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTIC...
Publication number
20160246002
Publication date
Aug 25, 2016
SI-WARE SYSTEMS
Bassam Saadany
G02 - OPTICS
Information
Patent Application
SELECTIVE STEP COVERAGE FOR MICRO-FABRICATED STRUCTURES
Publication number
20160246010
Publication date
Aug 25, 2016
SI-WARE SYSTEMS
Mostafa Medhat
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROME...
Publication number
20160231172
Publication date
Aug 11, 2016
SI-WARE SYSTEMS
Mostafa Medhat
G02 - OPTICS
Information
Patent Application
SPATIAL SPLITTING-BASED OPTICAL MEMS INTERFEROMETERS
Publication number
20140192365
Publication date
Jul 10, 2014
SI-WARE SYSTEMS
Bassem Mortada
G02 - OPTICS
Information
Patent Application
Self Calibration for mirror positioning in Optical MEMS Interferome...
Publication number
20140139839
Publication date
May 22, 2014
SI-WARE SYSTEMS
Mostafa Medhat
G02 - OPTICS
Information
Patent Application
Compensated MEMS FTIR Spectrometer Architecture
Publication number
20110058180
Publication date
Mar 10, 2011
SI-WARE SYSTEMS
Diaa A. Khalil
G01 - MEASURING TESTING
Information
Patent Application
OPTO-MECHANICAL OPTICAL PATH RETARDATION MULTIPLIER FOR OPTICAL MEM...
Publication number
20100265512
Publication date
Oct 21, 2010
SI-WARE SYSTEMS
MOSTAFA MEDHAT
G02 - OPTICS
Information
Patent Application
LONG RANGE TRAVEL MEMS ACTUATOR
Publication number
20100264777
Publication date
Oct 21, 2010
SI-WARE SYSTEMS
MOSTAFA MEDHAT
B81 - MICRO-STRUCTURAL TECHNOLOGY