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Bill DeHaven
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Los Altos, CA, US
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last 30 patents
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Patent Grant
High speed I.sub.DDQ monitor circuit
Patent number
5,694,063
Issue date
Dec 2, 1997
LTX Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
High speed I.sub.DDQ monitor circuit
Patent number
5,552,744
Issue date
Sep 3, 1996
LTX Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
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Patent Grant
Test system apparatus with Schottky diodes with programmable voltages
Patent number
5,200,696
Issue date
Apr 6, 1993
LTX Corporation
David Menis
G01 - MEASURING TESTING
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Patent Grant
High density test head
Patent number
4,605,894
Issue date
Aug 12, 1986
GenRad Semiconductor Test, Inc.
Gerald Cox
G01 - MEASURING TESTING