L. Horning,, J. Soden, R. Fritzemeier & C. Hawkins, Measurements of Quiescent Power Supply Current For CMOS ICs In Production Testing, IEEE, 1987 Int'l Test Conference, pp. 300-309. |
C. Crapuchettes, Testing CMOS Idd on Large Devices, IEEE, 1987 Int'l Test Conference, pp. 310-315. |
M. Keating & D. Meyer, A New Approach To Dynamic Idd Testing, IEEE, 1987 Int'l Test Conference, pp. 316-321. |
S. McEuen, Why IDDDQ, IEEE, 1990 Int'l Test Conference, p. 252. |
K. Baker & B. Verhelst, Iddq Testing Because "Zero Defects Isn't Enough", IEEE, 1990 Int'l Test Conference, pp. 253-524. |
J. Soden, R. Fritzemeier & C. Hawkins, Zero Defects or Zero Stuck-At Faults-CMOS IC Process Improvement With Iddq, IEEE, 1990 Int'Test Conference, pp. 255-256. |
W. Maly, Current Testing, IEEE, 1990 Int'Test Conference, p. 257. |
S. Bollinger & S. Midkiff, On Test Generation For Iddq Testing Of Bridging Faults In CMOS Circuits, IEEE, 1991 Int'l Test Conference, pp. 598-607. |
E. Vandris & G. Sobelman, A Mixed Functional/Iddq Testing Methodology For CMOS Transistor Faults, IEEE, 1991 Int'l Test Conference, pp. 608-614. |
C. Chen & J. Abraham, High Quality Tests For Switch-Level Circuits Using Current And Logic Test Generation Algorithms, IEEE, 1991 Int'l Test Conference, pp. 615-622. |
R. Aitken, Fault Location With Current Monitoring, IEEE, 1991 Int'l Test Conference, pp. 623-632. |
R. Kapur, J. Park & M. Mercer, All Tests For A Fault Are Not Equally Valuable For Defect Detection, IEEE, 1992 Int'l Test Conference, pp. 762-769. |
R. Gulati, W. Mao & D. Goel, Detection of "undetectable" faults using IDDQ testing, IEEE, 1992 Int'l Test Conference, pp. 770-775. |
R. Aitken, A Comparison of Defect Models for Fault Location with Iddq Measurements, IEEE, 1992 Int'l Test Conference, pp. 778-787. |
Y. Miura & K. Kinoshita, Circuit Design for Built-In Current Testing, IEEE, 1992, Int'l Test Conference, pp. 873-881. |
R. Rodriguez-Montanes, E. M. J. G. Bruls & J. Figueras, Bridging Defects Resistance Measurements in a CMOS Process, IEEE, 1992 Int'l Test Conference, pp. 892-899. |
K. M. Wallquist, A. W. Righter, and C. F. Hawkins, A General Purpose IDDQ Measurement Circuit, IEEE, 1993 Int'l Test Conference, pp. 642-651. |