Blaine D. Johs

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple wavelength ellipsometer system and related method
- Patent number 9,354,118
- Issue date May 31, 2016
- Film Sense, LLC
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
In line ellipsometer system and method of use
- Patent number 9,347,768
- Issue date May 24, 2016
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
System and method of aligning a sample
- Patent number 8,638,437
- Issue date Jan 28, 2014
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometers and polarimeters comprising polarization state compen...
- Patent number 8,467,057
- Issue date Jun 18, 2013
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Mounting for deviation angle self compensating substantially achrom...
- Patent number 8,462,341
- Issue date Jun 11, 2013
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Mapping ellipsometers and polarimeters comprising polarization stat...
- Patent number 8,339,603
- Issue date Dec 25, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Sample mapping in environmental chamber
- Patent number 8,248,606
- Issue date Aug 21, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Empirical correction for spectroscopic ellipsometric measurements o...
- Patent number 8,248,607
- Issue date Aug 21, 2012
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Method of improving ellipsometric and the like data
- Patent number 8,223,334
- Issue date Jul 17, 2012
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system and method of use
- Patent number 8,159,672
- Issue date Apr 17, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System and method of aligning a sample
- Patent number 8,064,055
- Issue date Nov 22, 2011
- J. A. Woollam Co., Inc.
- Martin H. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spatial filter in sample investigation system
- Patent number 8,013,996
- Issue date Sep 6, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Method of constructing a deviation angle self compensating substant...
- Patent number 7,907,280
- Issue date Mar 15, 2011
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System and method of controlling intensity of an electromagnetic beam
- Patent number 7,796,260
- Issue date Sep 14, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,746,472
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,746,471
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining substrate etch depth
- Patent number 7,705,995
- Issue date Apr 27, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,633,625
- Issue date Dec 15, 2009
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system
- Patent number 7,623,237
- Issue date Nov 24, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,616,319
- Issue date Nov 10, 2009
- James D. Welch
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Spatial filter means comprising an aperture with a non-unity aspect...
- Patent number 7,554,662
- Issue date Jun 30, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Beam chromatic shifting and directing means
- Patent number 7,535,566
- Issue date May 19, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,522,279
- Issue date Apr 21, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,508,510
- Issue date Mar 24, 2009
- J.A. Wooliam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,505,134
- Issue date Mar 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Discrete polarization state spectroscopic ellipsometer system and m...
- Patent number 7,492,455
- Issue date Feb 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometric investigation of very thin films
- Patent number 7,483,148
- Issue date Jan 27, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Rotating compensator ellipsometer system with spatial filter equiva...
- Patent number 7,468,794
- Issue date Dec 23, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Deviation angle self compensating substantially achromatic retarder
- Patent number 7,460,230
- Issue date Dec 2, 2008
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G02 - OPTICS
Information Patent Grant
Deviation angle self compensating substantially achromatic retarder
- Patent number 7,450,231
- Issue date Nov 11, 2008
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multiple Wavelength Ellipsometer System and Related Method
- Publication number 20150219497
- Publication date Aug 6, 2015
- Film Sense, LLC
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Application
System and method of aligning a sample
- Publication number 20120092653
- Publication date Apr 19, 2012
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Mounting for deviation angle self compensating substantially achrom...
- Publication number 20110188040
- Publication date Aug 4, 2011
- Ping He
- G01 - MEASURING TESTING
Information Patent Application
System and method of aligning a sample
- Publication number 20090207408
- Publication date Aug 20, 2009
- Martin H. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Method of constructing a deviation angle self compensating substant...
- Publication number 20090091758
- Publication date Apr 9, 2009
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Deviation angle self compensating substantially achromatic retarder
- Publication number 20080100842
- Publication date May 1, 2008
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Deviation angle self compensating substantially achromatic retarder
- Publication number 20070253059
- Publication date Nov 1, 2007
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Tracking temperature change in birefringent materials
- Publication number 20040258128
- Publication date Dec 23, 2004
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Application
Sample analysis methodology utilizing electromagnetic radiation
- Publication number 20040257567
- Publication date Dec 23, 2004
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Application
Spatial filter source beam conditioning in ellipsometer and the lik...
- Publication number 20010046089
- Publication date Nov 29, 2001
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
System and method of improving electromagnetic radiation beam chara...
- Publication number 20010033377
- Publication date Oct 25, 2001
- James D. Welch
- G01 - MEASURING TESTING

Blaine D. Johs

Person

Patents Grantslast 30 patents

Multiple wavelength ellipsometer system and related method

In line ellipsometer system and method of use

System and method of aligning a sample

Ellipsometers and polarimeters comprising polarization state compen...

Mounting for deviation angle self compensating substantially achrom...

Mapping ellipsometers and polarimeters comprising polarization stat...

Sample mapping in environmental chamber

Empirical correction for spectroscopic ellipsometric measurements o...

Method of improving ellipsometric and the like data

Sample investigating system and method of use

System and method of aligning a sample

Spatial filter in sample investigation system

Method of constructing a deviation angle self compensating substant...

System and method of controlling intensity of an electromagnetic beam

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

Method of determining substrate etch depth

Spectroscopic ellipsometer and polarimeter systems

Sample investigating system

Spectroscopic ellipsometer and polarimeter systems

Spatial filter means comprising an aperture with a non-unity aspect...

Beam chromatic shifting and directing means

System for and method of investigating the exact same point on a sa...

System for and method of investigating the exact same point on a sa...

Automated ellipsometer and the like systems

Discrete polarization state spectroscopic ellipsometer system and m...

Ellipsometric investigation of very thin films

Rotating compensator ellipsometer system with spatial filter equiva...

Deviation angle self compensating substantially achromatic retarder

Deviation angle self compensating substantially achromatic retarder

Patents Applicationslast 30 patents

Multiple Wavelength Ellipsometer System and Related Method

System and method of aligning a sample

Mounting for deviation angle self compensating substantially achrom...

System and method of aligning a sample

Method of constructing a deviation angle self compensating substant...

Deviation angle self compensating substantially achromatic retarder

Deviation angle self compensating substantially achromatic retarder

System for and method of investigating the exact same point on a sa...

Combined spatial filter and relay systems in rotating compensator e...

Tracking temperature change in birefringent materials

Sample analysis methodology utilizing electromagnetic radiation

Spatial filter source beam conditioning in ellipsometer and the lik...

System and method of improving electromagnetic radiation beam chara...