Carl A. Zanoni

Person

Middlefield, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometer system for monitoring an object
- Patent number 7,826,064
- Issue date Nov 2, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system for monitoring an object
- Patent number 7,639,367
- Issue date Dec 29, 2009
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system for monitoring an object
- Patent number 7,636,166
- Issue date Dec 22, 2009
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for high accuracy metrology and positioning o...
- Patent number 6,876,452
- Issue date Apr 5, 2005
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating an interferometer using a sele...
- Patent number 6,816,267
- Issue date Nov 9, 2004
- Zygo Corporation
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring aspherical optical surfaces and...
- Patent number 6,771,375
- Issue date Aug 3, 2004
- Zygo Corporation
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Helium- Neon laser light source generating two harmonically related...
- Patent number 6,724,486
- Issue date Apr 20, 2004
- Zygo Corporation
- William A. Shull
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method(s) for reducing the effects of coherent artifa...
- Patent number 6,643,024
- Issue date Nov 4, 2003
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system having reduced cyclic errors
- Patent number 6,181,420
- Issue date Jan 30, 2001
- Zygo Corporation
- Vivek G. Badami
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric apparatus for measuring motions of a stage relative...
- Patent number 5,724,136
- Issue date Mar 3, 1998
- Zygo Corporation
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Dual high stability interferometer
- Patent number 4,883,357
- Issue date Nov 28, 1989
- Zygo Corporation
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Linear and angular displacement measuring interferometer
- Patent number 4,881,816
- Issue date Nov 21, 1989
- Zygo, Corporation
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for interference fringe center sensing
- Patent number 4,169,980
- Issue date Oct 2, 1979
- Zygo Corporation
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring interference patterns and interf...
- Patent number 4,159,522
- Issue date Jun 26, 1979
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device
- Patent number 4,074,937
- Issue date Feb 21, 1978
- Zygo Corporation
- Carl A. Zanoni
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to transform a single laser beam into two parallel beams...
- Patent number 3,984,153
- Issue date Oct 5, 1976
- Zygo Corporation
- Carl A. Zanoni
- G02 - OPTICS
Information Patent Grant
Scanning differential photoelectric autocollimator
- Patent number 3,977,789
- Issue date Aug 31, 1976
- Zygo Corporation
- George C. Hunter
- G01 - MEASURING TESTING
Information Patent Grant
Scanning photoelectric autocollimator
- Patent number 3,975,102
- Issue date Aug 17, 1976
- Zygo Corporation
- Alvin H. Rosenfeld
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for producing a scanning laser beam of constant linear ve...
- Patent number 3,961,838
- Issue date Jun 8, 1976
- Zygo Corporation
- Carl A. Zanoni
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT
- Publication number 20100091296
- Publication date Apr 15, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT
- Publication number 20080165347
- Publication date Jul 10, 2008
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometer system for monitoring an object
- Publication number 20070171425
- Publication date Jul 26, 2007
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for high accuracy metrology and positioning o...
- Publication number 20030112445
- Publication date Jun 19, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for calibrating an interferometer using a sele...
- Publication number 20030090798
- Publication date May 15, 2003
- Christopher James Evans
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method(s) for reducing the effects of coherent artifa...
- Publication number 20030043380
- Publication date Mar 6, 2003
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring aspherical optical surfaces and...
- Publication number 20030002048
- Publication date Jan 2, 2003
- Carl A. Zanoni
- G01 - MEASURING TESTING

Carl A. Zanoni

Person

Patents Grantslast 30 patents

Interferometer system for monitoring an object

Interferometer system for monitoring an object

Interferometer system for monitoring an object

Apparatus and methods for high accuracy metrology and positioning o...

Apparatus and method for calibrating an interferometer using a sele...

Apparatus and method for measuring aspherical optical surfaces and...

Helium- Neon laser light source generating two harmonically related...

Apparatus and method(s) for reducing the effects of coherent artifa...

Interferometry system having reduced cyclic errors

Interferometric apparatus for measuring motions of a stage relative...

Dual high stability interferometer

Linear and angular displacement measuring interferometer

Method and apparatus for interference fringe center sensing

Apparatus and method for measuring interference patterns and interf...

Optical measuring device

Apparatus to transform a single laser beam into two parallel beams...

Scanning differential photoelectric autocollimator

Scanning photoelectric autocollimator

Apparatus for producing a scanning laser beam of constant linear ve...

Patents Applicationslast 30 patents

INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT

INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT

Interferometer system for monitoring an object

Apparatus and methods for high accuracy metrology and positioning o...

Apparatus and method for calibrating an interferometer using a sele...

Apparatus and method(s) for reducing the effects of coherent artifa...

Apparatus and method for measuring aspherical optical surfaces and...