Chan-seung Choi

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor process evaluation methods including variable ion imp...
- Patent number 7,972,874
- Issue date Jul 5, 2011
- Samsung Electronics Co., Ltd.
- Won-bae Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor process evaluation methods including variable ion imp...
- Patent number 7,781,234
- Issue date Aug 24, 2010
- Samsung Electronics Co., Ltd.
- Won-bae Jang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WIRELESS POWER APPARATUS FOR SUBSTRATES TREATING APPARATUS AND MANU...
- Publication number 20240146103
- Publication date May 2, 2024
- SEMES CO., LTD.
- Chan Young Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ALIGNING WAFER USING LASER SCANNER, SEMICO...
- Publication number 20240112938
- Publication date Apr 4, 2024
- SEMES CO., LTD.
- Hee Jae BYUN
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
APPARATUS AND METHOD OF DETECTING WAFER EDGE USING LASER SCANNER, A...
- Publication number 20240063039
- Publication date Feb 22, 2024
- SEMES CO., LTD.
- Hee Jae BYUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SUPPLY APPARATUS AND SEMICONDUCTOR MANUFACTURING EQUIPMENT, T...
- Publication number 20240014059
- Publication date Jan 11, 2024
- SEMES CO., LTD.
- Chan Young CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESS EVALUATION METHODS INCLUDING VARIABLE ION IMP...
- Publication number 20100279442
- Publication date Nov 4, 2010
- SAMSUNG ELECTRONICS CO., LTD.
- Won-bae Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion implantation system having variable screen aperture and ion imp...
- Publication number 20070173043
- Publication date Jul 26, 2007
- Seung-hee Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Process Evaluation Methods Including Variable Ion Imp...
- Publication number 20070155028
- Publication date Jul 5, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Won-bae Jang
- H01 - BASIC ELECTRIC ELEMENTS

Chan-seung Choi

Person

Patents Grantslast 30 patents

Semiconductor process evaluation methods including variable ion imp...

Semiconductor process evaluation methods including variable ion imp...

Patents Applicationslast 30 patents

WIRELESS POWER APPARATUS FOR SUBSTRATES TREATING APPARATUS AND MANU...

METHOD AND APPARATUS FOR ALIGNING WAFER USING LASER SCANNER, SEMICO...

APPARATUS AND METHOD OF DETECTING WAFER EDGE USING LASER SCANNER, A...

POWER SUPPLY APPARATUS AND SEMICONDUCTOR MANUFACTURING EQUIPMENT, T...

SEMICONDUCTOR PROCESS EVALUATION METHODS INCLUDING VARIABLE ION IMP...

Ion implantation system having variable screen aperture and ion imp...

Semiconductor Process Evaluation Methods Including Variable Ion Imp...