Charles E. Stroud

Person

Auburn, AL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analog test and compensation with built-in pattern genera...
- Patent number 7,428,683
- Issue date Sep 23, 2008
- Auburn University
- Fa Dai
- G01 - MEASURING TESTING
Information Patent Grant
Methods for delay-fault testing in field-programmable gate arrays
- Patent number 7,412,343
- Issue date Aug 12, 2008
- University of North Carolina at Charlotte
- Charles Eugene Stroud
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault tolerant operation of field programmable gate arrays
- Patent number 6,973,608
- Issue date Dec 6, 2005
- Agere Systems Inc.
- Miron Abramovici
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying faulty programmable interconnect resources of field pro...
- Patent number 6,966,020
- Issue date Nov 15, 2005
- Agere Systems Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Fault tolerant operation of reconfigurable devices utilizing an adj...
- Patent number 6,874,108
- Issue date Mar 29, 2005
- Agere Systems Inc.
- Miron Abramovici
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-line testing of field programmable gate array resources
- Patent number 6,631,487
- Issue date Oct 7, 2003
- Lattice Semiconductor Corp.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
On-line testing of the programmable interconnect network in field p...
- Patent number 6,574,761
- Issue date Jun 3, 2003
- Lattice Semiconductor Corp.
- Miron Abramovici
- G11 - INFORMATION STORAGE
Information Patent Grant
On-line testing of the programmable logic blocks in field programma...
- Patent number 6,550,030
- Issue date Apr 15, 2003
- Lattice Semiconductor Corp.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
On-line fault tolerant operation via incremental reconfiguration of...
- Patent number 6,530,049
- Issue date Mar 4, 2003
- Lattice Semiconductor Corporation
- Miron Abramovici
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault tolerant operation of field programmable gate arrays
- Patent number 6,256,758
- Issue date Jul 3, 2001
- Agere Systems Guardian Corp.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing field programmable gate arrays
- Patent number 6,202,182
- Issue date Mar 13, 2001
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing and diagnosing field programmable gate arrays
- Patent number 6,108,806
- Issue date Aug 22, 2000
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Maintenance registers with Boundary Scan interface
- Patent number 6,052,808
- Issue date Apr 18, 2000
- University of Kentucky Research Foundation
- Shianling Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing field programmable gate arrays
- Patent number 6,003,150
- Issue date Dec 14, 1999
- Lucent Technologies Inc.
- Charles E. Stroud
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing field programmable gate arrays
- Patent number 5,991,907
- Issue date Nov 23, 1999
- Lucent Technologies Inc.
- Charles E. Stroud
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic analog test & compensation with built-in pattern generato...
- Publication number 20060020865
- Publication date Jan 26, 2006
- Fa Dai
- G01 - MEASURING TESTING
Information Patent Application
Methods for delay-fault testing in field-programmable gate arrays
- Publication number 20050154552
- Publication date Jul 14, 2005
- Charles Eugene Stroud
- G06 - COMPUTING CALCULATING COUNTING

Charles E. Stroud

Person

Patents Grantslast 30 patents

Automatic analog test and compensation with built-in pattern genera...

Methods for delay-fault testing in field-programmable gate arrays

Fault tolerant operation of field programmable gate arrays

Identifying faulty programmable interconnect resources of field pro...

Fault tolerant operation of reconfigurable devices utilizing an adj...

On-line testing of field programmable gate array resources

On-line testing of the programmable interconnect network in field p...

On-line testing of the programmable logic blocks in field programma...

On-line fault tolerant operation via incremental reconfiguration of...

Fault tolerant operation of field programmable gate arrays

Method and apparatus for testing field programmable gate arrays

Method of testing and diagnosing field programmable gate arrays

Maintenance registers with Boundary Scan interface

Method for testing field programmable gate arrays

Method for testing field programmable gate arrays

Patents Applicationslast 30 patents

Automatic analog test & compensation with built-in pattern generato...

Methods for delay-fault testing in field-programmable gate arrays