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Cheng-Yung Teng

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  • Xindian City, TW
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PRODUCT VERIFICATION SYSTEM
    • Publication number 20100168899
    • Publication date Jul 1, 2010
    • Cheng-Yung Teng
    • G08 - SIGNALLING
  • Information Patent Application

    METHOD FOR MEASURING TRANSCONDUCTANCE
    • Publication number 20100164481
    • Publication date Jul 1, 2010
    • Cheng-Yung TENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    HANDLER AND METHOD FOR TESTING THE SAME
    • Publication number 20100154505
    • Publication date Jun 24, 2010
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    CIRCUIT TESTING APPARATUS
    • Publication number 20090326844
    • Publication date Dec 31, 2009
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    CIRCUIT TEST APPARATUS
    • Publication number 20090302861
    • Publication date Dec 10, 2009
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING DEVICES
    • Publication number 20090281744
    • Publication date Nov 12, 2009
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    CIRCUIT TESTING APPARATUS
    • Publication number 20090254296
    • Publication date Oct 8, 2009
    • Princeton Technology Corporation
    • Cheng-Yung TENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUDIO GENERATING MODULE
    • Publication number 20090168605
    • Publication date Jul 2, 2009
    • Princeton Technology Corporation
    • Cheng-Yung TENG
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    REMOTE CONTROLLER
    • Publication number 20090140877
    • Publication date Jun 4, 2009
    • Princeton Technology Corporation
    • Cheng-Yung TENG
    • G08 - SIGNALLING
  • Information Patent Application

    TESTING CIRCUIT BOARD
    • Publication number 20090140746
    • Publication date Jun 4, 2009
    • Princeton Technology Corporation
    • Cheng-Yung TENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST SYSTEM
    • Publication number 20090113260
    • Publication date Apr 30, 2009
    • Cheng-Yung TENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING CIRCUIT BOARD
    • Publication number 20090108859
    • Publication date Apr 30, 2009
    • Cheng-Yung TENG
    • G01 - MEASURING TESTING
  • Information Patent Application

    Circuit testing apparatus
    • Publication number 20090015288
    • Publication date Jan 15, 2009
    • Princeton Technology Corporation
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    Circuit testing apparatus
    • Publication number 20080243409
    • Publication date Oct 2, 2008
    • Princeton Technology Corporation
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    Circuit testing apparatus
    • Publication number 20080191730
    • Publication date Aug 14, 2008
    • Princeton Technology Corporation
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    CIRCUIT TESTING APPARATUS
    • Publication number 20080063212
    • Publication date Mar 13, 2008
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    CIRCUIT TESTING APPARATUS
    • Publication number 20070268037
    • Publication date Nov 22, 2007
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    Interace circuit for using a low voltage logic tester to test a hig...
    • Publication number 20070168787
    • Publication date Jul 19, 2007
    • Princeton Technology Corporation
    • Cheng Yung Teng
    • G01 - MEASURING TESTING
  • Information Patent Application

    Test system and single-chip tester capable of testing a plurality o...
    • Publication number 20070024314
    • Publication date Feb 1, 2007
    • Princeton Technology Corporation
    • Cheng-Yung Teng
    • G01 - MEASURING TESTING