Choel-hwyi Bae

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including work function control film patterns...
- Patent number 9,064,732
- Issue date Jun 23, 2015
- Samsung Electronics Co., Ltd.
- Cheong-Sik Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,941,183
- Issue date Jan 27, 2015
- Samsung Electronics Co., Ltd.
- Cheong-Sik Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of correcting a design pattern for an integrated circuit and...
- Patent number 7,840,917
- Issue date Nov 23, 2010
- Samsung Electronics Co., Ltd.
- Choel-Hwyi Bae
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for analyzing layouts of semiconductor integrat...
- Patent number 7,802,210
- Issue date Sep 21, 2010
- Samsung Electronics Co., Ltd.
- Choel-Hwyi Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring pattern for detecting a defect in a semiconductor device...
- Patent number 7,733,099
- Issue date Jun 8, 2010
- Samsung Electronics Co., Ltd.
- Choel-Hwyi Bae
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern and method of monitoring defects using the same
- Patent number 7,705,621
- Issue date Apr 27, 2010
- Samsung Electronics Co., Ltd.
- Hyock-Jun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for enhancing yield of semiconductor integrated c...
- Patent number 7,703,055
- Issue date Apr 20, 2010
- Samsung Electronics Co., Ltd.
- Choel-hwyi Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for identifying an allowable process margin for integrated...
- Patent number 7,642,106
- Issue date Jan 5, 2010
- Samsung Electronics Co., Ltd.
- Choel-Hwyi Bae
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140061809
- Publication date Mar 6, 2014
- Cheong-Sik Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20140061813
- Publication date Mar 6, 2014
- Samsung Electronics Co., Ltd.
- Cheong-Sik Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of correcting a design pattern for an integrated circuit and...
- Publication number 20080250361
- Publication date Oct 9, 2008
- Samsung Electronics Co., Ltd.
- Choel-Hwyi Bae
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Test Structures for Identifying an Allowable Process Margin for Int...
- Publication number 20080224134
- Publication date Sep 18, 2008
- SAMSUNG ELECTRONICS CO., LTD.
- Choel-Hwyi Bae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST PATTERN AND METHOD OF MONITORING DEFECTS USING THE SAME
- Publication number 20080084223
- Publication date Apr 10, 2008
- Hyock-Jun Lee
- G01 - MEASURING TESTING
Information Patent Application
Monitoring pattern for detecting a defect in a semiconductor device...
- Publication number 20070296447
- Publication date Dec 27, 2007
- Choel-Hwyi Bae
- G01 - MEASURING TESTING
Information Patent Application
Method and system for enhancing yield of semiconductor integrated c...
- Publication number 20070180412
- Publication date Aug 2, 2007
- Choel-hwyi Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for analyzing layouts of semiconductor integrat...
- Publication number 20070174800
- Publication date Jul 26, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Choel-Hwyi Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR IMPROVING YIELD...
- Publication number 20070118824
- Publication date May 24, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Choel-hwyi Bae
- G06 - COMPUTING CALCULATING COUNTING

Choel-hwyi Bae

Person

Patents Grantslast 30 patents

Semiconductor device including work function control film patterns...

Semiconductor device

Method of correcting a design pattern for an integrated circuit and...

Methods and systems for analyzing layouts of semiconductor integrat...

Monitoring pattern for detecting a defect in a semiconductor device...

Test pattern and method of monitoring defects using the same

Method and system for enhancing yield of semiconductor integrated c...

Methods for identifying an allowable process margin for integrated...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

Method of correcting a design pattern for an integrated circuit and...

Test Structures for Identifying an Allowable Process Margin for Int...

TEST PATTERN AND METHOD OF MONITORING DEFECTS USING THE SAME

Monitoring pattern for detecting a defect in a semiconductor device...

Method and system for enhancing yield of semiconductor integrated c...

Methods and systems for analyzing layouts of semiconductor integrat...

METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR IMPROVING YIELD...