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Chris Cooper
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for reducing test resources in testing DRAMs
Patent number
7,168,018
Issue date
Jan 23, 2007
Micron Technology, Inc.
Chris Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Delay locked loop circuit with time delay quantifier and control
Patent number
7,119,592
Issue date
Oct 10, 2006
Micron Technology, Inc.
Chris Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for reducing test resources in testing DRAMS
Patent number
6,986,084
Issue date
Jan 10, 2006
Micron Technology, Inc.
Chris Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Delay locked loop circuit with time delay quantifier and control
Patent number
6,917,228
Issue date
Jul 12, 2005
Micron Technology, Inc.
Chris Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for reducing test resources in testing Rambus...
Patent number
6,854,079
Issue date
Feb 8, 2005
Micron Technology, Inc.
Chris Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT,...
Patent number
6,778,453
Issue date
Aug 17, 2004
Micron Technology, Inc.
Christopher B. Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT...
Patent number
6,552,945
Issue date
Apr 22, 2003
Micron Technology, Inc.
Christopher B. Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for testing rambus DRAMs
Patent number
6,530,045
Issue date
Mar 4, 2003
Micron Technology, Inc.
Christopher B. Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for efficiently testing RAMBUS memory devices
Patent number
6,314,036
Issue date
Nov 6, 2001
Micron Technology, Inc.
Christopher B. Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of storing a temperature threshold in an integrated circuit,...
Patent number
6,233,190
Issue date
May 15, 2001
Micron Technology, Inc.
Christopher B. Cooper
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for efficiently testing rambus memory devices
Patent number
6,144,598
Issue date
Nov 7, 2000
Micron Technology, Inc.
Christopher B. Cooper
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Apparatus and method for reducing test resources in testing drams
Publication number
20070168790
Publication date
Jul 19, 2007
Chris Cooper
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for reducing test resources in testing DRAMs
Publication number
20050262405
Publication date
Nov 24, 2005
Chris Cooper
G01 - MEASURING TESTING
Information
Patent Application
Delay locked loop circuit
Publication number
20050041486
Publication date
Feb 24, 2005
Micron Technology, Inc.
Chris Cooper
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Apparatus and method for reducing test resources in testing DRAMs
Publication number
20040255211
Publication date
Dec 16, 2004
Chris Cooper
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for reducing test resources in testing DRAMS
Publication number
20040233738
Publication date
Nov 25, 2004
Chris Cooper
G01 - MEASURING TESTING
Information
Patent Application
Delay locked loop circuit with time delay quantifier and control
Publication number
20030227308
Publication date
Dec 11, 2003
Micron Technology, Inc.
Chris Cooper
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Methods of storing a temperature in an integrated circuit, method o...
Publication number
20030174559
Publication date
Sep 18, 2003
Christopher B. Cooper
G11 - INFORMATION STORAGE
Information
Patent Application
Method for storing a temperature threshold in an integrated circuit...
Publication number
20010009528
Publication date
Jul 26, 2001
Christopher B. Cooper
G11 - INFORMATION STORAGE