Membership
Tour
Register
Log in
Christopher J. Clark
Follow
Person
Durham, NH, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Management system, method and apparatus for licensed delivery and a...
Patent number
9,152,749
Issue date
Oct 6, 2015
Intellitech Corp.
Michael Ricchetti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method of sending and receiving data and commands using...
Patent number
8,621,125
Issue date
Dec 31, 2013
Intellitech Corporation
Christopher J. Clark
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for optimized parallel testing and access of e...
Patent number
7,574,637
Issue date
Aug 11, 2009
Intellitech Corporation
Michael Ricchetti
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for embedded built-in self-test (BIST) of elec...
Patent number
7,467,342
Issue date
Dec 16, 2008
Intellitech Corporation
Michael Ricchetti
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optimized test and configuration throughput o...
Patent number
7,406,638
Issue date
Jul 29, 2008
Intellitech Corporation
Christopher J. Clark
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for optimized parallel testing and access of e...
Patent number
6,988,232
Issue date
Jan 17, 2006
Intellitech Corporation
Michael Ricchetti
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for embedded built-in self-test (BIST) of elec...
Patent number
6,957,371
Issue date
Oct 18, 2005
Intellitech Corporation
Michael Ricchetti
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for providing optimized access to circuits for...
Patent number
6,594,802
Issue date
Jul 15, 2003
Intellitech Corporation
Michael Ricchetti
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for optimized parallel testing and access of e...
Publication number
20060107160
Publication date
May 18, 2006
INTELLITECH CORPORATION
Michael Ricchetti
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for embedded Built-In Self-Test (BIST) of elec...
Publication number
20050210352
Publication date
Sep 22, 2005
Michael Ricchetti
G01 - MEASURING TESTING
Information
Patent Application
System and method for optimized test and configuration throughput o...
Publication number
20050060622
Publication date
Mar 17, 2005
Christopher J. Clark
G01 - MEASURING TESTING
Information
Patent Application
Management system, method and apparatus for licensed delivery and a...
Publication number
20030140255
Publication date
Jul 24, 2003
INTELLITECH CORPORATION
Michael Ricchetti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for embedded built-in self-test (BIST) of elec...
Publication number
20030106004
Publication date
Jun 5, 2003
INTELLITECH CORPORATION
Michael Ricchetti
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for optimized parallel testing and access of e...
Publication number
20030009715
Publication date
Jan 9, 2003
INTELLITECH CORPORATION
Michael Ricchetti
G01 - MEASURING TESTING