Christopher M. Foster

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Charge storage device for detecting alpha particles
- Patent number 8,748,800
- Issue date Jun 10, 2014
- Spansion LLC
- Timothy Z. Hossain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detecting particles with a semiconductor device
- Patent number 8,436,289
- Issue date May 7, 2013
- Spansion LLC
- Timothy Z. Hossain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triple layer anti-reflective hard mask
- Patent number 7,888,269
- Issue date Feb 15, 2011
- Spansion LLC
- Kouros Ghandehari
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Non-critical complementary masking method for poly-1 definition in...
- Patent number 7,307,002
- Issue date Dec 11, 2007
- Spansion LLC
- Unsoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with core and periphery regions
- Patent number 6,995,437
- Issue date Feb 7, 2006
- Advanced Micro Devices, Inc.
- Hiroyuki Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
METHOD OF FORMING CORE AND PERIPHERY GATES INCLUDING TWO CRITICAL M...
- Patent number 6,780,708
- Issue date Aug 24, 2004
- Advanced Micro Devices, Inc.
- Hiroyuki Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methylated oxide-type dielectric as a replacement for SiO2 hardmask...
- Patent number 6,440,853
- Issue date Aug 27, 2002
- National Semiconductor Corporation
- Sudhakar Allada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methylated oxide-type dielectric as a replacement for SiO2 hardmask...
- Patent number 6,218,317
- Issue date Apr 17, 2001
- National Semiconductor Corp.
- Sudhakar Allada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Reduction of Charging Induced Damage in Photolithography Wet Process
- Publication number 20150155162
- Publication date Jun 4, 2015
- SPANSION LLC
- Daniel E. SUTTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETECTING PARTICLES WITH A SEMICONDUCTOR DEVICE
- Publication number 20130193537
- Publication date Aug 1, 2013
- SPANSION LLC
- Timothy Z. HOSSAIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Triple layer anti-reflective hard mask
- Publication number 20070093070
- Publication date Apr 26, 2007
- Kouros Ghandehari
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Non-critical complementary masking method for poly-1 definition in...
- Publication number 20060223278
- Publication date Oct 5, 2006
- Unsoon Kim
- H01 - BASIC ELECTRIC ELEMENTS

Christopher M. Foster

Person

Patents Grantslast 30 patents

Charge storage device for detecting alpha particles

System and method for detecting particles with a semiconductor device

Triple layer anti-reflective hard mask

Non-critical complementary masking method for poly-1 definition in...

Semiconductor device with core and periphery regions

METHOD OF FORMING CORE AND PERIPHERY GATES INCLUDING TWO CRITICAL M...

Methylated oxide-type dielectric as a replacement for SiO2 hardmask...

Methylated oxide-type dielectric as a replacement for SiO2 hardmask...

Patents Applicationslast 30 patents

Reduction of Charging Induced Damage in Photolithography Wet Process

SYSTEM AND METHOD FOR DETECTING PARTICLES WITH A SEMICONDUCTOR DEVICE

Triple layer anti-reflective hard mask

Non-critical complementary masking method for poly-1 definition in...